Y. Hokari

415 total citations
34 papers, 317 citations indexed

About

Y. Hokari is a scholar working on Electrical and Electronic Engineering, Instrumentation and Biomedical Engineering. According to data from OpenAlex, Y. Hokari has authored 34 papers receiving a total of 317 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Electrical and Electronic Engineering, 7 papers in Instrumentation and 7 papers in Biomedical Engineering. Recurrent topics in Y. Hokari's work include CCD and CMOS Imaging Sensors (18 papers), Semiconductor materials and devices (11 papers) and Advancements in Semiconductor Devices and Circuit Design (8 papers). Y. Hokari is often cited by papers focused on CCD and CMOS Imaging Sensors (18 papers), Semiconductor materials and devices (11 papers) and Advancements in Semiconductor Devices and Circuit Design (8 papers). Y. Hokari collaborates with scholars based in Japan and United Kingdom. Y. Hokari's co-authors include N. Kawamura, T. Baba, Takao Homma, Hiroshi Okumura, Yoshishige Suzuki, Nobukazu Teranishi, Ichiro Murakami, T. Nakano, M. Furumiya and M. Sakamoto and has published in prestigious journals such as Journal of Applied Physics, Spine and IEEE Journal of Solid-State Circuits.

In The Last Decade

Y. Hokari

31 papers receiving 292 citations

Peers

Y. Hokari
Martin Frank Germany
J. Dupraz France
Mervi Hirvonen Finland
Lars Liljestrand Sweden
Nadew Adisu Belda Netherlands
Souheil Bensmida United Kingdom
J. Kölzer Germany
Wentao Wu China
Wescley Tiago Batista de Sousa Germany
Z. Yun United States
Martin Frank Germany
Y. Hokari
Citations per year, relative to Y. Hokari Y. Hokari (= 1×) peers Martin Frank

Countries citing papers authored by Y. Hokari

Since Specialization
Citations

This map shows the geographic impact of Y. Hokari's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Hokari with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Hokari more than expected).

Fields of papers citing papers by Y. Hokari

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. Hokari. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Hokari. The network helps show where Y. Hokari may publish in the future.

Co-authorship network of co-authors of Y. Hokari

This figure shows the co-authorship network connecting the top 25 collaborators of Y. Hokari. A scholar is included among the top collaborators of Y. Hokari based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y. Hokari. Y. Hokari is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Yamada, Takahiro, M. Morimoto, Akihito Tanabe, et al.. (2002). A 1/2 inch 1.3 M-pixel progressive-scan IT-CCD for still and motion picture applications. 178–179,. 7 indexed citations
2.
Furumiya, M., M. Morimoto, Y. Kawakami, et al.. (2002). A 30 frame/s 2/3 inch 1.3M pixel progressive scan IT-CCD image sensor. 188–189,. 1 indexed citations
3.
Satoh, Takashi, M. Furumiya, Ichiro Murakami, et al.. (2002). Optical limitations to cell size reduction in IT-CCD image sensors. 19. 159–162.
4.
Morimoto, M., M. Furumiya, K. Arai, et al.. (2002). A 2/3-inch 2 M-pixel IT-CCD image sensor with individual p-wells for separate V-CCD and H-CCD formation. 222–223. 5 indexed citations
5.
Furumiya, M., M. Morimoto, Y. Kawakami, et al.. (2001). A 30 frames/s 2/3-in 1.3 M-pixel progressive scan IT-CCD image sensor. IEEE Transactions on Electron Devices. 48(9). 1922–1928. 3 indexed citations
6.
Murakami, Ichiro, T. Nakano, M. Furumiya, et al.. (2000). Technologies to improve photo-sensitivity and reduce VOD shutter voltage for CCD image sensors. IEEE Transactions on Electron Devices. 47(8). 1566–1572. 9 indexed citations
7.
Murakami, Ichiro, T. Nakano, M. Furumiya, et al.. (1999). <title>New technologies of photosensitivity improvement and VOD shutter voltage reduction for CCD image sensors</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3649. 14–21. 1 indexed citations
8.
Satoh, Takashi, M. Furumiya, Ichiro Murakami, et al.. (1997). Optical limitations to cell size reduction in IT-CCD image sensors. IEEE Transactions on Electron Devices. 44(10). 1599–1603. 4 indexed citations
9.
Morimoto, M., Y. Kawakami, T. Nakano, et al.. (1995). A 1-inch 2-M pixel HDTV CCD image sensor with tungsten photo-shield and H-CCD shunt wiring. IEEE Transactions on Electron Devices. 42(1). 50–57. 3 indexed citations
10.
Kawakami, Y., T. Nakano, S. Kawai, et al.. (1995). A 1/4-inch 380 k pixel IT-CCD image sensor employing gate-assisted punchthrough read-out mode. IEEE Transactions on Electron Devices. 42(10). 1783–1788. 10 indexed citations
11.
Homma, Takao, et al.. (1991). The Steffee Variable Screw Placement System Using Different Methods of Bone Grafting. Spine. 16(11). 1329–1334. 40 indexed citations
12.
Suzuki, Yoshishige, et al.. (1991). A novel tungsten light-shield structure for high-density CCD image sensors. IEEE Transactions on Electron Devices. 38(5). 965–968. 14 indexed citations
13.
Hokari, Y.. (1990). Dielectric breakdown wearout limitation of thermally-grown thin-gate oxides. Solid-State Electronics. 33(1). 75–78. 14 indexed citations
14.
Kikkawa, Takamaro, et al.. (1988). A New Polyimide Siloxane Film for Interlayer Dielectrics in Sub-micron Multilevel Interconnection. 279–285.
15.
16.
Mikami, Masao, et al.. (1983). Formation of Si Epi./MgO･Al2O3 Epi./SiO2/Si and Its Epitaxial Film Quality. 2 indexed citations
17.
Hokari, Y., T. Baba, & N. Kawamura. (1982). Reliability of thin SiO<inf>2</inf>films showing intrinsic dielectric integrity. 46–49. 9 indexed citations
18.
Hokari, Y.. (1979). Secondary Defect Generation Suppression and Diffusivity Restraint in Heavily Phosphorus Implanted Silicon by HCI Oxidation. Japanese Journal of Applied Physics. 18(5). 873–880. 5 indexed citations
19.
Hokari, Y., et al.. (1977). Video Defects in Charge-Coupled Image Sensors. Japanese Journal of Applied Physics. 16(4). 585–590. 2 indexed citations
20.
Hokari, Y., et al.. (1977). Secondary Defect Generation Suppression in Heavily Boron Implanted Silicon Wafers by HCl Oxidation. Japanese Journal of Applied Physics. 16(11). 1899–1905. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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