Xiaonan Li
- Materials Chemistry top 10%
- Electrical and Electronic Engineering top 5%
- Artificial Intelligence top 5%
- Electronic, Optical and Magnetic Materials top 10%
- Atomic and Molecular Physics, and Optics
- Co-authors
- Xipeng QiuHang YanXuanjing HuangSukit LimpijumnongSu‐Huai WeiShengbai ZhangDavid W. NilesTimothy J. Coutts
- Topics
- Chalcogenide Semiconductor Thin Films (16 papers)Topic Modeling (13 papers)ZnO doping and properties (11 papers)
- Partner nations
- ChinaUnited StatesUnited Kingdom
In The Last Decade
Xiaonan Li
94 papers receiving 1.5k citations
Hit Papers
Peers
Comparison fields: 5 of 119
- Materials Chemistry 717
- Electrical and Electronic Engineering 657
- Artificial Intelligence 388
- Electronic, Optical and Magnetic Materials 182
- Atomic and Molecular Physics, and Optics 132
Countries citing papers authored by Xiaonan Li
This map shows the geographic impact of Xiaonan Li's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Xiaonan Li with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Xiaonan Li more than expected).
Fields of papers citing papers by Xiaonan Li
This network shows the impact of papers produced by Xiaonan Li. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Xiaonan Li. The network helps show where Xiaonan Li may publish in the future.
Co-authorship network of co-authors of Xiaonan Li
This figure shows the co-authorship network connecting the top 25 collaborators of Xiaonan Li. A scholar is included among the top collaborators of Xiaonan Li based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Xiaonan Li. Xiaonan Li is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 20 | |
| 6 | 1 | |
| 7 | 15 | |
| 8 | 5 | |
| 9 | 11 | |
| 10 | 36 | |
| 11 | 6 | |
| 12 | 4 | |
| 13 | 52 | |
| 14 | 7 | |
| 15 | 2 | |
| 16 | 3 | |
| 17 | 1 | |
| 18 | FLAT: Chinese NER Using Flat-Lattice Transformerbreakdown → | 241 |
| 19 | Handover algorithm for WLAN/cellular networks with analytic hierarchy process | 7 |
| 20 | 4 |
About Xiaonan Li
Xiaonan Li is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Artificial Intelligence, having authored 96 papers that have together received 1.6k indexed citations. Recurring topics across this work include Chalcogenide Semiconductor Thin Films (16 papers), Topic Modeling (13 papers) and ZnO doping and properties (11 papers). The work is most often cited by research in Materials Chemistry (717 citations), Artificial Intelligence (388 citations) and Electrical and Electronic Engineering (657 citations). Xiaonan Li has collaborated with scholars based in China, United States and United Kingdom. Frequent co-authors include Xipeng Qiu, Hang Yan, Xuanjing Huang, Sukit Limpijumnong, Su‐Huai Wei, Shengbai Zhang, David W. Niles, Timothy J. Coutts, S. E. Asher and B. M. Keyes. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Power Sources.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.