William R. Harrell

518 total citations
22 papers, 417 citations indexed

About

William R. Harrell is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Computational Mechanics. According to data from OpenAlex, William R. Harrell has authored 22 papers receiving a total of 417 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 6 papers in Biomedical Engineering and 5 papers in Computational Mechanics. Recurrent topics in William R. Harrell's work include Semiconductor materials and devices (9 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Ion-surface interactions and analysis (4 papers). William R. Harrell is often cited by papers focused on Semiconductor materials and devices (9 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Ion-surface interactions and analysis (4 papers). William R. Harrell collaborates with scholars based in United States, Ireland and Israel. William R. Harrell's co-authors include J. Frey, Watt W. Webb, James H. Strickler, En-Shinn Wu, Jingyan Zhang, C. Gopalakrishnan, K.F. Poole, Igor Luzinov, George Chumanov and Goutam Koley and has published in prestigious journals such as ACS Applied Materials & Interfaces, Thin Solid Films and Journal of materials research/Pratt's guide to venture capital sources.

In The Last Decade

William R. Harrell

21 papers receiving 392 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
William R. Harrell United States 8 225 169 150 94 46 22 417
Paola Fanzio Italy 13 136 0.6× 113 0.7× 340 2.3× 54 0.6× 30 0.7× 23 484
Hyerim Moon South Korea 3 178 0.8× 463 2.7× 178 1.2× 69 0.7× 96 2.1× 4 544
Chong Kim Ong Singapore 11 163 0.7× 148 0.9× 90 0.6× 111 1.2× 152 3.3× 20 372
Jianbo Sun Denmark 11 167 0.7× 131 0.8× 135 0.9× 44 0.5× 20 0.4× 24 331
Edson P. Bellido Canada 11 125 0.6× 254 1.5× 218 1.5× 68 0.7× 130 2.8× 19 450
Maha M. Khayyat Saudi Arabia 9 146 0.6× 134 0.8× 171 1.1× 65 0.7× 21 0.5× 23 313
Tauno Kahro Estonia 13 219 1.0× 238 1.4× 121 0.8× 57 0.6× 41 0.9× 33 423
Changzhi Gu China 13 226 1.0× 137 0.8× 446 3.0× 128 1.4× 145 3.2× 33 598
Xinlian Chen China 12 260 1.2× 274 1.6× 73 0.5× 112 1.2× 57 1.2× 31 508
Hamidreza Zobeiri United States 15 138 0.6× 513 3.0× 109 0.7× 41 0.4× 28 0.6× 30 634

Countries citing papers authored by William R. Harrell

Since Specialization
Citations

This map shows the geographic impact of William R. Harrell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by William R. Harrell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites William R. Harrell more than expected).

Fields of papers citing papers by William R. Harrell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by William R. Harrell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by William R. Harrell. The network helps show where William R. Harrell may publish in the future.

Co-authorship network of co-authors of William R. Harrell

This figure shows the co-authorship network connecting the top 25 collaborators of William R. Harrell. A scholar is included among the top collaborators of William R. Harrell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with William R. Harrell. William R. Harrell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gladkikh, A., et al.. (2025). Effect of the Dielectric Treatment on Anomalous Charge Current in Polymer Tantalum Capacitors. ECS Journal of Solid State Science and Technology. 14(6). 63009–63009.
2.
Harrell, William R., et al.. (2022). Photolithographic Fabrication of P3HT Based Organic Thin-Film Transistors with High Mobility. ECS Journal of Solid State Science and Technology. 11(2). 25008–25008. 3 indexed citations
3.
Luzinov, Igor, et al.. (2022). Poly(3-hexylthiophene)-Based Organic Thin-Film Transistors with Virgin Graphene Oxide as an Interfacial Layer. Polymers. 14(23). 5061–5061. 2 indexed citations
4.
Luzinov, Igor, et al.. (2022). The Effect of a Copolymer Interfacial Layer on the Performance of Organic Thin-Film Transistors. ECS Transactions. 109(6). 105–113. 1 indexed citations
5.
Harrell, William R., et al.. (2020). Environmental Stability of Polymer Tantalum Capacitors. ECS Journal of Solid State Science and Technology. 9(8). 83005–83005. 3 indexed citations
6.
Johnson, Peter R., et al.. (2019). In-vacuum performance of a 3D-printed ion deflector. Vacuum. 172. 109061–109061. 7 indexed citations
7.
Field, Daniel A., et al.. (2018). Effects of slow highly charged ion irradiation on metal oxide semiconductor capacitors. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 36(5). 1 indexed citations
8.
Harrell, William R., et al.. (2018). Tracking ion irradiation effects using buried interface devices. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 422. 47–49. 1 indexed citations
9.
Borodinov, Nikolay, Ruslan Burtovyy, Mark Anayee, et al.. (2017). Highly Conductive and Transparent Reduced Graphene Oxide Nanoscale Films via Thermal Conversion of Polymer-Encapsulated Graphene Oxide Sheets. ACS Applied Materials & Interfaces. 10(4). 3975–3985. 57 indexed citations
10.
Field, Daniel A., et al.. (2015). Tracking subsurface ion radiation damage with metal–oxide–semiconductor device encapsulation. Journal of materials research/Pratt's guide to venture capital sources. 30(9). 1413–1421. 7 indexed citations
11.
Shyam, Radhey, et al.. (2015). First multicharged ion irradiation results from the CUEBIT facility at Clemson University. AIP conference proceedings. 1640. 129–135. 10 indexed citations
12.
Shyam, Radhey, et al.. (2015). Encapsulating Ion-Solid Interactions in Metal-Oxide-Semiconductor (MOS) Devices. IEEE Transactions on Nuclear Science. 62(6). 3346–3352. 6 indexed citations
13.
Harrell, William R., et al.. (2006). Implications of Non-Linear Poole-Frenkel Plots on High-k Dielectric Leakage. ECS Transactions. 1(5). 705–716. 5 indexed citations
14.
Zhang, Jingyan & William R. Harrell. (2003). Analysis of the I–V characteristics of Al/4H-SiC Schottky diodes. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 21(2). 872–878. 21 indexed citations
15.
Harrell, William R., Jingyan Zhang, & K.F. Poole. (2002). Aluminum schottky contacts to n-type 4H-SiC. Journal of Electronic Materials. 31(10). 1090–1095. 15 indexed citations
16.
Harrell, William R. & C. Gopalakrishnan. (2002). Implications of advanced modeling on the observation of Poole–Frenkel effect saturation. Thin Solid Films. 405(1-2). 205–217. 25 indexed citations
17.
Harrell, William R. & J. Frey. (1999). Observation of Poole–Frenkel effect saturation in SiO2 and other insulating films. Thin Solid Films. 352(1-2). 195–204. 112 indexed citations
18.
Harrell, William R.. (1994). Poole-Frenkel Conduction in Silicon Dioxide Films, and Implications for Hot-Carrier Degradation in N-Mos Devices. 2 indexed citations
19.
Wu, En-Shinn, James H. Strickler, William R. Harrell, & Watt W. Webb. (1992). Two-photon lithography for microelectronic application. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1674. 776–776. 107 indexed citations
20.
Harrell, William R., et al.. (1983). Agricultural power and machinery. Andalas University Repository (Andalas University). 23 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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