W.H. Laflère
- Electrical and Electronic Engineering top 5%
- Atomic and Molecular Physics, and Optics top 2%
- Materials Chemistry top 10%
- Biomedical Engineering
- Electronic, Optical and Magnetic Materials
- Co-authors
- F. CardonR.L. Van MeirhaegheDirk PoelmanW. P. GomesMichel DepasL. FiermansPeter HanselaerVeerle De Bosscher
- Topics
- Semiconductor materials and interfaces (37 papers)Semiconductor materials and devices (21 papers)Integrated Circuits and Semiconductor Failure Analysis (20 papers)
- Cited by
- Atomic and Molecular Physics, and OpticsElectrical and Electronic EngineeringMaterials Chemistry
- Partner nations
- BelgiumSwitzerland
In The Last Decade
W.H. Laflère
46 papers receiving 1.6k citations
Hit Papers
Peers
Comparison fields: 5 of 67
- Electrical and Electronic Engineering 1.4k
- Atomic and Molecular Physics, and Optics 1.2k
- Materials Chemistry 537
- Biomedical Engineering 138
- Electronic, Optical and Magnetic Materials 87
Countries citing papers authored by W.H. Laflère
This map shows the geographic impact of W.H. Laflère's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W.H. Laflère with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W.H. Laflère more than expected).
Fields of papers citing papers by W.H. Laflère
This network shows the impact of papers produced by W.H. Laflère. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W.H. Laflère. The network helps show where W.H. Laflère may publish in the future.
Co-authorship network of co-authors of W.H. Laflère
This figure shows the co-authorship network connecting the top 25 collaborators of W.H. Laflère. A scholar is included among the top collaborators of W.H. Laflère based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W.H. Laflère. W.H. Laflère is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 25 | |
| 2 | 69 | |
| 3 | 122 | |
| 4 | 136 | |
| 5 | 13 | |
| 6 | 53 | |
| 7 | 7 | |
| 8 | 9 | |
| 9 | 2 | |
| 10 | 34 | |
| 11 | 14 | |
| 12 | 3 | |
| 13 | 3 | |
| 14 | 1 | |
| 15 | 44 | |
| 16 | On the difference in apparent barrier height as obtained from capacitance-voltage and current-voltage-temperature measurements on Al/p-InP Schottky barriersbreakdown → | 533 |
| 17 | 12 | |
| 18 | 6 | |
| 19 | 11 | |
| 20 | 45 |
About W.H. Laflère
W.H. Laflère is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Electrochemistry, having authored 46 papers that have together received 1.7k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (37 papers), Semiconductor materials and devices (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (1.2k citations), Electrical and Electronic Engineering (1.4k citations) and Materials Chemistry (537 citations). W.H. Laflère has collaborated with scholars based in Belgium and Switzerland. Frequent co-authors include F. Cardon, R.L. Van Meirhaeghe, Dirk Poelman, W. P. Gomes, Michel Depas, L. Fiermans, Peter Hanselaer, Veerle De Bosscher, Yumin Li and Kristiaan Neyts. Their work appears in journals such as Journal of Applied Physics, Surface Science and Journal of Physics D Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.