Warren R. DeVries

723 citations
20 papers · 545 · h-index 9

Impact in

Papers in

    • Advanced Measurement and Metrology Techniques 5
    • Advanced machining processes and optimization 3
    • Tribology and Lubrication Engineering 2
    • Manufacturing Process and Optimization 7
    • Engineering Technology and Methodologies 3
    • Industrial Vision Systems and Defect Detection 2

Warren R. DeVries

19 papers receiving 509 citations

Peers

Warren R. DeVries
Comparison fields: 5 of 40
  • Industrial and Manufacturing Engineering 381
  • Mechanical Engineering 282
  • Automotive Engineering 88
  • Management of Technology and Innovation 35
  • Control and Systems Engineering 108
Replace K.P. Padmanaban with:
K.P. Padmanaban India
Pei-Hao Tai Taiwan
J. Yuan United States
A.H. Streppel Netherlands
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Citations per year

Countries citing papers authored by Warren R. DeVries

Since Specialization
Citations

This map shows the geographic impact of Warren R. DeVries's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Warren R. DeVries with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Warren R. DeVries more than expected).

Fields of papers citing papers by Warren R. DeVries

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Warren R. DeVries. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Warren R. DeVries. The network helps show where Warren R. DeVries may publish in the future.

Co-authors

The 11 scholars most cited alongside Warren R. DeVries, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Warren R. DeVries Line = papers co-authored together Warren R. DeVries links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 1991184
2 197861
3 199256
4 198949
5 199943
6 199140
7 199133
8 199126
9 198516
10 19957
11 19826
12 19914
13 19784
14
An integrated methodology for fixture design, analysis, and optimization
19974
15 19773
16 19843
17 19842
18 19912
19 19861
20 19821

About Warren R. DeVries

Warren R. DeVries is a scholar working on Mechanical Engineering, Industrial and Manufacturing Engineering, Mechanics of Materials, Computational Mechanics and Control and Systems Engineering, having authored 20 papers that have together received 545 indexed citations. Recurring topics across this work include Manufacturing Process and Optimization (7 papers), Advanced Measurement and Metrology Techniques (5 papers), Advanced machining processes and optimization (3 papers), Engineering Technology and Methodologies (3 papers), Surface Roughness and Optical Measurements (2 papers), Industrial Vision Systems and Defect Detection (2 papers), Advanced Surface Polishing Techniques (2 papers) and Tribology and Lubrication Engineering (2 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (381 citations), Mechanical Engineering (282 citations), Automotive Engineering (88 citations), Management of Technology and Innovation (35 citations) and Control and Systems Engineering (108 citations). Warren R. DeVries has collaborated with scholars based in United States. Frequent co-authors include Roland Menassa, S. M. Wu, Xin Dong, Michael J. Pratt, S. M. Wu, Leal K. Lauderbaugh, S. M. Pandit, Samuel S. Wu, David L. Goetsch and David Dornfeld. Their work appears in journals such as CIRP Annals, IEEE Transactions on Automatic Control, Structural and Multidisciplinary Optimization and Journal of Engineering for Industry.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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