W. Katz

968 total citations
50 papers, 782 citations indexed

About

W. Katz is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, W. Katz has authored 50 papers receiving a total of 782 indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 20 papers in Atomic and Molecular Physics, and Optics and 18 papers in Computational Mechanics. Recurrent topics in W. Katz's work include Semiconductor materials and interfaces (19 papers), Ion-surface interactions and analysis (18 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). W. Katz is often cited by papers focused on Semiconductor materials and interfaces (19 papers), Ion-surface interactions and analysis (18 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). W. Katz collaborates with scholars based in United States and Switzerland. W. Katz's co-authors include C. A. Evans, Peter Williams, V. R. Deline, T. Paul Chow, Gary A. Smith, Kenneth Rose, O. Aina, T. Ferbel, John G. Newman and Joseph M. Pimbley and has published in prestigious journals such as Journal of the American Chemical Society, Physical Review Letters and Applied Physics Letters.

In The Last Decade

W. Katz

50 papers receiving 696 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
W. Katz United States	16	488	268	259	185	101	50	782
D. P. Griffis United States	17	469 1.0×	321 1.2×	169 0.7×	188 1.0×	123 1.2×	65	776
Bernard Goldstein United States	17	381 0.8×	69 0.3×	327 1.3×	223 1.2×	191 1.9×	31	770
J. W. Farmer United States	19	535 1.1×	84 0.3×	377 1.5×	332 1.8×	28 0.3×	76	1.1k
Heinz Niedrig Germany	13	283 0.6×	135 0.5×	160 0.6×	215 1.2×	379 3.8×	62	719
Tokuo Suita Japan	15	159 0.3×	131 0.5×	131 0.5×	312 1.7×	24 0.2×	130	750
P. J. Scanlon Canada	14	687 1.4×	163 0.6×	184 0.7×	416 2.2×	74 0.7×	39	1.0k
F. Lama Italy	11	422 0.9×	51 0.2×	494 1.9×	163 0.9×	43 0.4×	40	676
Takeyoshi Nakayama Japan	14	165 0.3×	238 0.9×	235 0.9×	163 0.9×	29 0.3×	52	641
M. A. Briere United States	15	290 0.6×	503 1.9×	274 1.1×	217 1.2×	243 2.4×	29	753
G L R Mair Germany	18	616 1.3×	367 1.4×	116 0.4×	357 1.9×	92 0.9×	85	963

Countries citing papers authored by W. Katz

Since Specialization

Citations

This map shows the geographic impact of W. Katz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Katz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Katz more than expected).

Fields of papers citing papers by W. Katz

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. Katz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Katz. The network helps show where W. Katz may publish in the future.

Co-authorship network of co-authors of W. Katz

This figure shows the co-authorship network connecting the top 25 collaborators of W. Katz. A scholar is included among the top collaborators of W. Katz based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W. Katz. W. Katz is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Katz, W., et al.. (1989). Comparison of Wafer Cleaning Processes Using Total Reflection X‐ray Fluorescence (TXRF). Journal of The Electrochemical Society. 136(11). 3481–3486. 18 indexed citations

O’Clock, George D., et al.. (1988). Comparison of I-V, CV, and chemical data for quality control studies of SiO/sub x/N/sub y/ films on Si. IEEE Transactions on Semiconductor Manufacturing. 1(4). 133–139. 3 indexed citations

Katz, W. & John G. Newman. (1987). Fundamentals of Secondary Ion Mass Spectrometry. MRS Bulletin. 12(6). 40–47. 32 indexed citations

Valenty, S. J., et al.. (1984). Monitoring polymer surface derivatization by RBS and ESCA. Journal of Polymer Science Polymer Chemistry Edition. 22(11). 3367–3381. 4 indexed citations

Chow, T. Paul, S. Ashok, B. Jayant Baliga, & W. Katz. (1984). Modification of Schottky Barriers in Silicon by Reactive Ion Etching in NF 3 Gas Mixtures. Journal of The Electrochemical Society. 131(1). 156–160. 7 indexed citations

Katz, W., et al.. (1983). The Effects of Thermal and Transient Annealing on the Redistribution of Indium Implanted Silicon. MRS Proceedings. 23. 5 indexed citations

Katz, W., Gary A. Smith, & Ching-Yeu Wei. (1983). Quantitative analysis in chemically dissimilar matrices by secondary ion mass spectrometry. Applications of Surface Science. 15(1-4). 247–254. 2 indexed citations

Baliga, B. Jayant, et al.. (1983). Low temperature aluminum oxide deposition using trimethylaluminum. Journal of Electronic Materials. 12(3). 587–601. 22 indexed citations

Gildenblat, G., et al.. (1983). Interface states induced in silicon by tungsten as a result of reactive ion beam etching. Journal of Applied Physics. 54(4). 1855–1859. 4 indexed citations

10.

Smith, Gary A., et al.. (1983). Migration of implanted indium in silicon as a function of thermal annealing. Applied Physics Letters. 42(7). 575–577. 7 indexed citations

11.

Chow, T. Paul, et al.. (1983). Properties of Sputtered Molybdenum Silicide Thin Films. Journal of The Electrochemical Society. 130(4). 952–956. 16 indexed citations

12.

Wei, Ching-Yeu, W. Katz, & Gary A. Smith. (1983). The effects of PtxSi growth on the redistribution of p-type dopants in silicon. Thin Solid Films. 104(1-2). 215–220. 7 indexed citations

13.

Pimbley, Joseph M. & W. Katz. (1983). Infrared optical constants of PtSi. Applied Physics Letters. 42(11). 984–986. 23 indexed citations

14.

Baliga, B. Jayant, et al.. (1982). Breakdown stability of gold, aluminum, and tungsten Schottky barriers on gallium arsenide. IEEE Electron Device Letters. 3(7). 177–179. 5 indexed citations

15.

Katz, W., et al.. (1981). Oxygen-Trapping and Oxidation Induced by Laser Irradiation in Silicon. MRS Proceedings. 4. 1 indexed citations

16.

Aina, O., W. Katz, & Kenneth Rose. (1981). Electrical properties of laser annealed AuGe/GaAs ohmic contacts. Journal of Applied Physics. 52(11). 6997–7001. 6 indexed citations

17.

Buske, N., et al.. (1980). A method for measuring particle and aggregate size distribution in colloidal dispersions. Colloid & Polymer Science. 258(11). 1303–1304. 23 indexed citations

18.

Gibbons, J. F., A. Gat, L. Gerzberg, et al.. (1979). Annealing of ion-implanted Si using scanned laser and electron beams. AIP conference proceedings. 50. 365–380. 1 indexed citations

19.

Gibbons, J. F., J.L. Regolini, A. Lietoila, et al.. (1979). Amorphous-crystalline transition of arsenic-implanted silicon caused by multiple-pulsed ruby laser. Journal of Applied Physics. 50(6). 4388–4390. 2 indexed citations

20.

Katz, W., et al.. (1967). Large-Anglep¯pElastic Scattering at 3.66 GeV/c. Physical Review Letters. 19(5). 265–267. 36 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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