W. F. J. Slijkerman

593 total citations
18 papers, 509 citations indexed

About

W. F. J. Slijkerman is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, W. F. J. Slijkerman has authored 18 papers receiving a total of 509 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 5 papers in Computational Mechanics. Recurrent topics in W. F. J. Slijkerman's work include Semiconductor materials and interfaces (7 papers), Semiconductor materials and devices (5 papers) and Ion-surface interactions and analysis (4 papers). W. F. J. Slijkerman is often cited by papers focused on Semiconductor materials and interfaces (7 papers), Semiconductor materials and devices (5 papers) and Ion-surface interactions and analysis (4 papers). W. F. J. Slijkerman collaborates with scholars based in Netherlands, Australia and Japan. W. F. J. Slijkerman's co-authors include J. P. Hofman, J. F. van der Veen, W.J. Looyestijn, Yakov Volokitin, P. M. Zagwijn, Iwao Ohdomari, S. Yoshida, S. Misawa, G. F. A. van de Walle and E. Sakuma and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

W. F. J. Slijkerman

18 papers receiving 488 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
W. F. J. Slijkerman Netherlands	11	212	185	156	140	90	18	509
M. Katayama Japan	11	157 0.7×	109 0.6×	166 1.1×	138 1.0×	65 0.7×	32	471
B. Bora Chile	15	326 1.5×	182 1.0×	65 0.4×	177 1.3×	51 0.6×	56	643
M. Hoppe United States	12	63 0.3×	172 0.9×	200 1.3×	76 0.5×	23 0.3×	43	432
Masaya Hamada Japan	12	138 0.7×	219 1.2×	156 1.0×	163 1.2×	93 1.0×	30	470
H. Wagenfeld Australia	12	55 0.3×	95 0.5×	28 0.2×	80 0.6×	40 0.4×	27	420
L J Atherton United States	9	118 0.6×	96 0.5×	131 0.8×	143 1.0×	34 0.4×	14	521
D. L. Jacobson United States	15	153 0.7×	91 0.5×	78 0.5×	156 1.1×	332 3.7×	68	758
Jay B. Chase United States	9	106 0.5×	59 0.3×	101 0.6×	41 0.3×	13 0.1×	34	351
Atul Saxena India	12	268 1.3×	60 0.3×	39 0.3×	191 1.4×	155 1.7×	78	712
V. P. Efremov Russia	10	93 0.4×	107 0.6×	76 0.5×	105 0.8×	22 0.2×	67	375

Countries citing papers authored by W. F. J. Slijkerman

Since Specialization

Citations

This map shows the geographic impact of W. F. J. Slijkerman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. F. J. Slijkerman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. F. J. Slijkerman more than expected).

Fields of papers citing papers by W. F. J. Slijkerman

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. F. J. Slijkerman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. F. J. Slijkerman. The network helps show where W. F. J. Slijkerman may publish in the future.

Co-authorship network of co-authors of W. F. J. Slijkerman

This figure shows the co-authorship network connecting the top 25 collaborators of W. F. J. Slijkerman. A scholar is included among the top collaborators of W. F. J. Slijkerman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W. F. J. Slijkerman. W. F. J. Slijkerman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

18 of 18 papers shown

Slijkerman, W. F. J., J. P. Hofman, W.J. Looyestijn, & Yakov Volokitin. (2001). A Practical Approach To Obtain Primary Drainage Capillary Pressure Curves From Nmr Core And Log Data. Petrophysics – The SPWLA Journal of Formation Evaluation and Reservoir Description. 42(4). 152 indexed citations

Slijkerman, W. F. J., et al.. (2000). Processing of Multi-Acquisition NMR Data. SPE Reservoir Evaluation & Engineering. 3(6). 492–497. 4 indexed citations

Slijkerman, W. F. J., et al.. (1999). Processing of Multi-Acquisition NMR Data. SPE Annual Technical Conference and Exhibition. 5 indexed citations

Slijkerman, W. F. J. & J. P. Hofman. (1998). Determination of surface relaxivity from NMR diffusion measurements. Magnetic Resonance Imaging. 16(5-6). 541–544. 50 indexed citations

Slijkerman, W. F. J., et al.. (1996). Multiphase Flow Measurement Using Multiple Energy Gamma Ray Absorption (MEGRA) Composition Measurement. SPE Annual Technical Conference and Exhibition. 19 indexed citations

O’Connor, D.J., A. W. Denier van der Gon, J. Vrijmoeth, et al.. (1993). Oxidation of Al(111). Surface Science. 287-288. 438–442. 22 indexed citations

O’Connor, D.J., J. F. van der Veen, P. M. Zagwijn, et al.. (1993). The initial stages of the oxidation of Al(111). II. Surface Science. 296(2). 141–148. 10 indexed citations

O’Connor, D.J., A. W. Denier van der Gon, J. Vrijmoeth, et al.. (1993). Oxidation of Al(111). Surface Science Letters. 287-288. A394–A395. 3 indexed citations

Slijkerman, W. F. J., P. M. Zagwijn, J. F. van der Veen, D. J. Gravesteijn, & G. F. A. van de Walle. (1992). The interaction of Sb overlayers with Si(001). Surface Science. 262(1-2). 25–32. 34 indexed citations

10.

Slijkerman, W. F. J., P. M. Zagwijn, J. F. van der Veen, G. F. A. van de Walle, & D. J. Gravesteijn. (1991). Anomalous Sb redistribution during the preparation of delta-doping layers in silicon. Journal of Applied Physics. 70(4). 2111–2116. 10 indexed citations

11.

Zagwijn, P. M., W. F. J. Slijkerman, J. F. van der Veen, et al.. (1991). Ga delta-doping layers in silicon. Applied Physics Letters. 59(12). 1461–1463. 4 indexed citations

12.

Slijkerman, W. F. J., J.M. Gay, P. M. Zagwijn, et al.. (1990). X-ray reflectivity of an Sb delta-doping layer in silicon. Journal of Applied Physics. 68(10). 5105–5108. 16 indexed citations

13.

Fischer, Axel, W. F. J. Slijkerman, J. F. van der Veen, & Iwao Ohdomari. (1990). Thermal stability of supersaturated oxygen-doped silicon epitaxial films. Applied Surface Science. 44(2). 115–119. 1 indexed citations

14.

Hara, Shiro, W. F. J. Slijkerman, J. F. van der Veen, et al.. (1990). Elemental composition of β-Sic(001) surface phases studied by medium energy ion scattering. Surface Science. 231(3). L196–L200. 88 indexed citations

15.

Slijkerman, W. F. J., Axel Fischer, J. F. van der Veen, et al.. (1989). Formation of the Ni-SiC(001) interface studied by high-resolution ion backscattering. Journal of Applied Physics. 66(2). 666–673. 33 indexed citations

16.

Slijkerman, W. F. J., P. M. Zagwijn, J. F. van der Veen, A. A. van Gorkum, & G. F. A. van de Walle. (1989). Structural characterization of an Sb delta-doping layer in silicon. Applied Physics Letters. 55(10). 963–965. 23 indexed citations

17.

Rizzi, A., A. Förster, H. Lüth, & W. F. J. Slijkerman. (1989). Epitaxial growth and characterization of Si/NiSi2/Si(111) heterostructures. Surface Science. 211-212. 620–629. 3 indexed citations

18.

Fischer, Axel, W. F. J. Slijkerman, Kosuke Nakagawa, et al.. (1988). Growth of uniform epitaxial CoSi2 films on Si(111). Journal of Applied Physics. 64(6). 3005–3013. 32 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact