Vladislav Jovanov
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Biomedical Engineering
- Polymers and Plastics top 10%
- Atomic and Molecular Physics, and Optics
- Co-authors
- Dietmar KnippRahul DewanAsman TamangH. StiebigJ. HüpkesMohammad Ismail HossainWayesh QaronyYuen Hong Tsang
- Topics
- Thin-Film Transistor Technologies (32 papers)Silicon and Solar Cell Technologies (23 papers)Silicon Nanostructures and Photoluminescence (16 papers)
- Partner nations
- GermanyUnited StatesSerbia
In The Last Decade
Vladislav Jovanov
48 papers receiving 803 citations
Peers
Comparison fields: 5 of 45
- Electrical and Electronic Engineering 736
- Materials Chemistry 404
- Biomedical Engineering 200
- Polymers and Plastics 103
- Atomic and Molecular Physics, and Optics 81
Countries citing papers authored by Vladislav Jovanov
This map shows the geographic impact of Vladislav Jovanov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Vladislav Jovanov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Vladislav Jovanov more than expected).
Fields of papers citing papers by Vladislav Jovanov
This network shows the impact of papers produced by Vladislav Jovanov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Vladislav Jovanov. The network helps show where Vladislav Jovanov may publish in the future.
Co-authorship network of co-authors of Vladislav Jovanov
This figure shows the co-authorship network connecting the top 25 collaborators of Vladislav Jovanov. A scholar is included among the top collaborators of Vladislav Jovanov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Vladislav Jovanov. Vladislav Jovanov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | 1 | |
| 5 | 6 | |
| 6 | 3 | |
| 7 | 1 | |
| 8 | 13 | |
| 9 | 8 | |
| 10 | 2 | |
| 11 | 4 | |
| 12 | 48 | |
| 13 | 16 | |
| 14 | 7 | |
| 15 | 6 | |
| 16 | 52 | |
| 17 | 38 | |
| 18 | 8 | |
| 19 | 11 | |
| 20 | 10 |
About Vladislav Jovanov
Vladislav Jovanov is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films, having authored 51 papers that have together received 823 indexed citations. Recurring topics across this work include Thin-Film Transistor Technologies (32 papers), Silicon and Solar Cell Technologies (23 papers) and Silicon Nanostructures and Photoluminescence (16 papers). The work is most often cited by research in Electrical and Electronic Engineering (736 citations), Surfaces, Coatings and Films (78 citations) and Materials Chemistry (404 citations). Vladislav Jovanov has collaborated with scholars based in Germany, United States and Serbia. Frequent co-authors include Dietmar Knipp, Rahul Dewan, Asman Tamang, H. Stiebig, J. Hüpkes, Mohammad Ismail Hossain, Wayesh Qarony, Yuen Hong Tsang, Porponth Sichanugrist and V. Wagner. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Scientific Reports.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.