V. Krastev

715 citations
51 papers · 607 indexed · h-index 13

Impact in

Papers in

V. Krastev

49 papers receiving 588 citations

Peers

V. Krastev
Comparison fields: 5 of 55
  • Materials Chemistry 290
  • Electrical and Electronic Engineering 335
  • Atomic and Molecular Physics, and Optics 155
  • Mechanics of Materials 107
  • Surfaces, Coatings and Films 27
Replace T. R. Ohno with:
T. R. Ohno United States
A. Ermolieff France
Jiann–Ruey Chen Taiwan
R. Alfonsetti Italy
Mario Sahre Germany
A. Czapla Poland
S. Ben Amor France
Milt Jaehnig United States
C. J. Blomfield United Kingdom
M. C. Peignon France
V. Krastev relative to T. R. Ohno United States T. R. Ohno's profile →
Citations per field
00.5×1.5×2.4×
T. R. Ohno · 1×
Citations per year

Countries citing papers authored by V. Krastev

Since Specialization
Citations

This map shows the geographic impact of V. Krastev's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Krastev with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Krastev more than expected).

Fields of papers citing papers by V. Krastev

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Krastev. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Krastev. The network helps show where V. Krastev may publish in the future.

Co-authorship network

The 25 scholars most cited alongside V. Krastev, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with V. Krastev Line = papers co-authored together V. Krastev links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20102
2 20102
3 20084
4 200717
5 200712
6 20064
7 200511
8 200022
9 20004
10 199811
11 19981
12 199799
13 19967
14 199632
15 19969
16 19961
17 199517
18 19952
19 199236
20 19925

About V. Krastev

V. Krastev is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials and Atomic and Molecular Physics, and Optics, having authored 51 papers that have together received 607 indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Electron and X-Ray Spectroscopy Techniques (13 papers), Metal and Thin Film Mechanics (8 papers), Silicon Nanostructures and Photoluminescence (8 papers), Ion-surface interactions and analysis (7 papers), Semiconductor materials and interfaces (7 papers), Diamond and Carbon-based Materials Research (7 papers) and Thin-Film Transistor Technologies (6 papers). The work is most often cited by research in Materials Chemistry (290 citations), Electrical and Electronic Engineering (335 citations), Atomic and Molecular Physics, and Optics (155 citations), Mechanics of Materials (107 citations) and Surfaces, Coatings and Films (27 citations). V. Krastev has collaborated with scholars based in Bulgaria, United Kingdom and Sweden. Frequent co-authors include Ts. Marinova, G. Beshkov, K. Petkov, P. Petrov, D. Dimova‐Malinovska, Paunka Vassileva, Erik Janzén, C. Hallin, M. Sendova-Vassileva and G. Radnóczi. Their work appears in journals such as Applied Surface Science, Surface and Interface Analysis, Thin Solid Films, Journal of Materials Science Materials in Electronics and Materials Science and Engineering B.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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