V. Krastev

715 total citations
51 papers, 607 citations indexed

About

V. Krastev is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, V. Krastev has authored 51 papers receiving a total of 607 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 25 papers in Materials Chemistry and 14 papers in Surfaces, Coatings and Films. Recurrent topics in V. Krastev's work include Semiconductor materials and devices (22 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Metal and Thin Film Mechanics (8 papers). V. Krastev is often cited by papers focused on Semiconductor materials and devices (22 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Metal and Thin Film Mechanics (8 papers). V. Krastev collaborates with scholars based in Bulgaria, United Kingdom and Sweden. V. Krastev's co-authors include Ts. Marinova, G. Beshkov, K. Petkov, P. Petrov, D. Dimova‐Malinovska, Paunka Vassileva, C. Hallin, M. Sendova-Vassileva, Erik Janzén and A. Kakanakova‐Georgieva and has published in prestigious journals such as Journal of The Electrochemical Society, International Journal of Hydrogen Energy and Journal of Materials Science.

In The Last Decade

V. Krastev

49 papers receiving 588 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
V. Krastev Bulgaria	13	335	290	155	107	100	51	607
C. J. Blomfield United Kingdom	11	258 0.8×	285 1.0×	92 0.6×	123 1.1×	96 1.0×	18	574
R. Alfonsetti Italy	9	310 0.9×	247 0.9×	85 0.5×	55 0.5×	104 1.0×	17	539
Jiann–Ruey Chen Taiwan	13	346 1.0×	358 1.2×	118 0.8×	80 0.7×	62 0.6×	47	585
A. Ermolieff France	14	510 1.5×	382 1.3×	95 0.6×	87 0.8×	131 1.3×	38	723
T. R. Ohno United States	15	341 1.0×	535 1.8×	188 1.2×	77 0.7×	81 0.8×	51	776
Michael C. Burrell United States	15	206 0.6×	275 0.9×	96 0.6×	104 1.0×	91 0.9×	42	674
R. Raman India	15	398 1.2×	369 1.3×	154 1.0×	112 1.0×	167 1.7×	60	842
Mario Sahre Germany	14	212 0.6×	253 0.9×	49 0.3×	100 0.9×	103 1.0×	36	536
M. C. Peignon France	12	362 1.1×	186 0.6×	43 0.3×	164 1.5×	129 1.3×	16	531
Satoshi Nakamura Japan	20	541 1.6×	624 2.2×	120 0.8×	63 0.6×	107 1.1×	53	910

Countries citing papers authored by V. Krastev

Since Specialization

Citations

This map shows the geographic impact of V. Krastev's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Krastev with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Krastev more than expected).

Fields of papers citing papers by V. Krastev

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Krastev. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Krastev. The network helps show where V. Krastev may publish in the future.

Co-authorship network of co-authors of V. Krastev

This figure shows the co-authorship network connecting the top 25 collaborators of V. Krastev. A scholar is included among the top collaborators of V. Krastev based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. Krastev. V. Krastev is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Sellin, P.J., D. Dimova‐Malinovska, O. Angelov, et al.. (2010). X-ray photoelectron study of high-energy He⁺implanted a-SiC:H thin films. Journal of Physics Conference Series. 253. 12052–12052. 2 indexed citations

Balabanov, Stanislav, et al.. (2010). X-ray photoelectron study of Si⁺ion implanted polymers. Journal of Physics Conference Series. 253. 12070–12070. 2 indexed citations

Pecheva, E., et al.. (2007). Ion implantation modified stainless steel as a substrate for hydroxyapatite deposition. Part I. Surface modification and characterization. Journal of Materials Science Materials in Medicine. 18(3). 435–440. 17 indexed citations

Pecheva, E., et al.. (2007). Ion implantation modified stainless steel as a substrate for hydroxyapatite deposition. Part II. Biomimetic layer growth and characterization. Journal of Materials Science Materials in Medicine. 18(3). 441–447. 12 indexed citations

Krastev, V., et al.. (2006). Suppression of carbon depletion from carbon-doped low-k dielectric layers during fluorocarbon based plasma etching. Microelectronic Engineering. 83(11-12). 2458–2461. 4 indexed citations

Krastev, V., et al.. (2005). Influence of C4F8/Ar/O2 plasma etching on SiO2 surface chemistry. Journal of Materials Science Materials in Electronics. 16(8). 541–547. 11 indexed citations

Iordanova, I., M. Surtchev, K.S. Forcey, & V. Krastev. (2000). High-temperature surface oxidation of low-carbon rimming steel. Surface and Interface Analysis. 30(1). 158–160. 22 indexed citations

Krastev, V., et al.. (2000). XPS-investigation of proton exchanged waveguides in LiNbO3. Journal of Materials Science Materials in Electronics. 11(8). 629–632. 4 indexed citations

Beshkov, G., et al.. (1998). XPS study of plasma treated carbon layers deposited on porous silicon. Materials Science and Engineering B. 56(1). 1–4. 11 indexed citations

10.

Marinova, Ts., A. Kakanakova‐Georgieva, V. Krastev, et al.. (1997). Nickel based ohmic contacts on SiC. Materials Science and Engineering B. 46(1-3). 223–226. 99 indexed citations

11.

Dragieva, I., et al.. (1997). Impedance Spectroscopy and XPS Comparative Investigations of the State of Boron Atoms in an Amorphous Metallic Matrix. Journal of Solid State Chemistry. 133(1). 273–278. 2 indexed citations

12.

Kalitzova, M., D.S. Karpuzov, Ts. Marinova, et al.. (1997). InP crystals-ion implantation and laser annealing: RHEED, XPS and computer simulation studies. Applied Surface Science. 115(1). 1–9.

13.

Marinova, Ts., V. Krastev, C. Hallin, Rositza Yakimova, & Erik Janzén. (1996). Interface chemistry and electric characterisation of nickel metallisation on 6HSiC. Applied Surface Science. 99(2). 119–125. 32 indexed citations

14.

Dimova‐Malinovska, D., Marian Tzolov, N. Malinowski, Ts. Marinova, & V. Krastev. (1996). Laser-induced formation of visible light emitting silicon. Applied Surface Science. 96-98. 457–462. 7 indexed citations

15.

Krastev, V., et al.. (1996). XPS, TEM and SAD investigations of nanosized CoxByHz particles obtained by two different borohydride methods. Journal of Alloys and Compounds. 240(1-2). 186–192. 6 indexed citations

16.

Marinova, Ts., V. Krastev, C. Hallin, Rositza Yakimova, & Erik Janzén. (1996). XPS Study of Ni Layers Deposited on 6H-SiC. Materials science forum. 207-209. 293–296. 2 indexed citations

17.

Dimova‐Malinovska, D., et al.. (1995). Correlation between the photoluminescence and chemical bonding in porous silicon. Thin Solid Films. 255(1-2). 191–195. 17 indexed citations

18.

Petkov, K., V. Krastev, & Ts. Marinova. (1992). XPS analysis of thin chromium films. Surface and Interface Analysis. 18(7). 487–490. 36 indexed citations

19.

Marinova, Ts., V. Krastev, & R. Yakimova. (1992). Investigation of Residual Oxide Layers on GaAs Surfaces. Crystal Research and Technology. 27(6). 809–815. 5 indexed citations

20.

Krastev, V., et al.. (1991). Investigation of the structure of poly(dodecalactam) obtained by anionic bulk polymerization. Acta Polymerica. 42(5). 240–242. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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