Michael C. Burrell

819 total citations
42 papers, 674 citations indexed

About

Michael C. Burrell is a scholar working on Surfaces, Coatings and Films, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, Michael C. Burrell has authored 42 papers receiving a total of 674 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Surfaces, Coatings and Films, 21 papers in Materials Chemistry and 10 papers in Computational Mechanics. Recurrent topics in Michael C. Burrell's work include Electron and X-Ray Spectroscopy Techniques (17 papers), Corrosion Behavior and Inhibition (11 papers) and Ion-surface interactions and analysis (9 papers). Michael C. Burrell is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (17 papers), Corrosion Behavior and Inhibition (11 papers) and Ion-surface interactions and analysis (9 papers). Michael C. Burrell collaborates with scholars based in United States. Michael C. Burrell's co-authors include Neal R. Armstrong, W. F. Banholzer, A. Mogro‐Campero, L. G. Turner, Ernest L. Hall, H. S. Cole, B. D. Hunt, M. D. McConnell, Robert J. Perry and Matthew D. Butts and has published in prestigious journals such as Nature, Applied Physics Letters and Analytical Chemistry.

In The Last Decade

Michael C. Burrell

41 papers receiving 620 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Michael C. Burrell United States 15 275 206 160 126 112 42 674
M. Tirrell United States 13 333 1.2× 118 0.6× 173 1.1× 153 1.2× 39 0.3× 19 736
S. Ben Amor France 16 573 2.1× 475 2.3× 78 0.5× 120 1.0× 66 0.6× 32 1.0k
L. Cota‐Araiza Mexico 19 619 2.3× 424 2.1× 91 0.6× 72 0.6× 40 0.4× 92 896
H. K. Wong Hong Kong 14 333 1.2× 147 0.7× 155 1.0× 97 0.8× 304 2.7× 47 768
Deborah P. Partlow United States 9 385 1.4× 337 1.6× 117 0.7× 207 1.6× 47 0.4× 19 810
T. N. Wittberg United States 12 205 0.7× 198 1.0× 67 0.4× 54 0.4× 52 0.5× 38 459
J. Houdková Czechia 18 396 1.4× 362 1.8× 169 1.1× 58 0.5× 32 0.3× 57 837
M. R. Mohammadizadeh Iran 22 616 2.2× 244 1.2× 92 0.6× 95 0.8× 322 2.9× 74 1.2k
Markus Hund Germany 14 346 1.3× 106 0.5× 79 0.5× 93 0.7× 35 0.3× 19 608
Flávio Horowitz Brazil 18 313 1.1× 211 1.0× 296 1.9× 52 0.4× 17 0.2× 70 828

Countries citing papers authored by Michael C. Burrell

Since Specialization
Citations

This map shows the geographic impact of Michael C. Burrell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael C. Burrell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael C. Burrell more than expected).

Fields of papers citing papers by Michael C. Burrell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michael C. Burrell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael C. Burrell. The network helps show where Michael C. Burrell may publish in the future.

Co-authorship network of co-authors of Michael C. Burrell

This figure shows the co-authorship network connecting the top 25 collaborators of Michael C. Burrell. A scholar is included among the top collaborators of Michael C. Burrell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Michael C. Burrell. Michael C. Burrell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Burrell, Michael C., et al.. (2025). X-ray photoelectron spectroscopy investigation of chemical changes to nickel oxide and iron–nickel oxide surfaces caused by monoatomic argon ion and gas cluster ion beam sputtering. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 43(3). 1 indexed citations
2.
Burrell, Michael C., et al.. (2023). XPS investigation of monoatomic and cluster argon sputtering of zirconium dioxide. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 41(4). 2 indexed citations
3.
Burrell, Michael C.. (2019). Method for correcting peak overlaps in quantitative Auger electron spectroscopy of Cr-containing oxides. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 38(1). 3 indexed citations
4.
Burrell, Michael C., et al.. (2016). A Consistent Interpretation of Corrosion Test Results Using the Marcus Film Growth Model. 1–14. 1 indexed citations
5.
Burrell, Michael C., et al.. (2012). Corrosion Behavior of Three Steels in High Temperature Water. 1–16. 2 indexed citations
6.
Burrell, Michael C., et al.. (1999). Polybutylene Terephthalate (PBT) Spin Cast Films by XPS. Surface Science Spectra. 6(1). 5–8. 4 indexed citations
7.
Burrell, Michael C., et al.. (1999). 1,2-Polybutadiene Spin Cast Films by XPS. Surface Science Spectra. 6(1). 23–26.
8.
Burrell, Michael C., et al.. (1999). Polyetherimide (Ultem®) Spin Cast Films by XPS. Surface Science Spectra. 6(1). 18–22. 10 indexed citations
9.
Burrell, Michael C., et al.. (1999). Polycarbonate Spin Cast Films by XPS. Surface Science Spectra. 6(1). 1–4. 10 indexed citations
10.
Burrell, Michael C., et al.. (1994). XPS and static SIMS studies of copoly(ether–esters) containing mixed polyether soft blocks. Surface and Interface Analysis. 21(8). 553–559. 11 indexed citations
11.
Burrell, Michael C., et al.. (1992). Copper deposition onto polyetherimide: Interface composition and adhesion. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(4). 2752–2757. 9 indexed citations
12.
Mogro‐Campero, A., et al.. (1988). Y-Ba-Cu-O superconducting thin films by simultaneous or sequential evaporation. Applied Physics Letters. 52(7). 584–586. 61 indexed citations
13.
Burrell, Michael C., et al.. (1988). Surface analysis of BPA-polycarbonate/ poly(butylene terephthalate) blends by X-ray photoelectron spectroscopy. Applied Surface Science. 35(1). 110–120. 8 indexed citations
14.
Burrell, Michael C., et al.. (1988). Characterization of PdCl 2 /SnCl 2 metallization catalysts on a polyetherimide surface by XPS and RBS. Surface and Interface Analysis. 11(3). 160–164. 11 indexed citations
15.
Burrell, Michael C., et al.. (1988). Characterization of copper/enamel interfacial reactions during aging. Surface and Interface Analysis. 11(9). 487–496. 6 indexed citations
16.
17.
Banholzer, W. F. & Michael C. Burrell. (1986). XPS, Auger study of Cu3Si and its reaction with oxygen. Surface Science. 176(1-2). 125–133. 55 indexed citations
18.
Burrell, Michael C. & Neal R. Armstrong. (1985). Deuterium uptake in titanium thin films: t ssc00621 the effect of oxide, and the metal (Ti and Fe) overlayers. Surface Science. 160(1). 235–252. 20 indexed citations
19.
Burrell, Michael C. & Neal R. Armstrong. (1983). A sequential method for removing the inelastic loss contribution from Auger electron spectroscopic data. Applications of Surface Science. 17(1). 53–69. 44 indexed citations
20.
Burrell, Michael C., et al.. (1982). Data acquisition and processing modes for quantitative Auger electron spectroscopy. Analytical Chemistry. 54(14). 2511–2517. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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