V. A. J. van Lint
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Nuclear and High Energy Physics top 10%
- Radiation top 10%
- Co-authors
- R. E. LeadonJ. A. RutherfordW. L. FiteD. P. SnowdenR. A. SchmittD. K. NicholsJ. ErlerRoger Stettner
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (13 papers)Semiconductor materials and devices (11 papers)Silicon and Solar Cell Technologies (10 papers)
- Partner nations
- United StatesUnited Kingdom
In The Last Decade
V. A. J. van Lint
56 papers receiving 531 citations
Peers
Comparison fields: 5 of 58
- Electrical and Electronic Engineering 394
- Materials Chemistry 116
- Atomic and Molecular Physics, and Optics 94
- Nuclear and High Energy Physics 93
- Radiation 87
Countries citing papers authored by V. A. J. van Lint
This map shows the geographic impact of V. A. J. van Lint's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. A. J. van Lint with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. A. J. van Lint more than expected).
Fields of papers citing papers by V. A. J. van Lint
This network shows the impact of papers produced by V. A. J. van Lint. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. A. J. van Lint. The network helps show where V. A. J. van Lint may publish in the future.
Co-authorship network of co-authors of V. A. J. van Lint
This figure shows the co-authorship network connecting the top 25 collaborators of V. A. J. van Lint. A scholar is included among the top collaborators of V. A. J. van Lint based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. A. J. van Lint. V. A. J. van Lint is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 6 | |
| 2 | 3 | |
| 3 | 1 | |
| 4 | Charging and Discharging of Spacecraft Thermal Control Dielectrics. | 2 |
| 5 | 2 | |
| 6 | Mechanisms of radiation effects in electronic materials. Volume 1 | 4 |
| 7 | 1 | |
| 8 | 3 | |
| 9 | 36 | |
| 10 | 8 | |
| 11 | 5 | |
| 12 | 40 | |
| 13 | IONIZATION-INDUCED CONDUCTIVITY IN MgO. | 1 |
| 14 | 15 | |
| 15 | 6 | |
| 16 | 9 | |
| 17 | 30 | |
| 18 | 8 | |
| 19 | 9 | |
| 20 | 6 |
About V. A. J. van Lint
V. A. J. van Lint is a scholar working on Radiation, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 59 papers that have together received 625 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (13 papers), Semiconductor materials and devices (11 papers) and Silicon and Solar Cell Technologies (10 papers). The work is most often cited by research in Radiation (87 citations), Nuclear and High Energy Physics (93 citations) and Electrical and Electronic Engineering (394 citations). V. A. J. van Lint has collaborated with scholars based in United States and United Kingdom. Frequent co-authors include R. E. Leadon, J. A. Rutherford, W. L. Fite, D. P. Snowden, R. A. Schmitt, D. K. Nichols, J. Erler, Roger Stettner, E. G. Wikner and G.C. Morris. Their work appears in journals such as Journal of Applied Physics, Proceedings of the IEEE and Review of Scientific Instruments.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.