Tianwei Yin
- Computer Vision and Pattern Recognition top 1%
- Aerospace Engineering top 2%
- Automotive Engineering top 5%
- Environmental Engineering top 5%
- Artificial Intelligence top 10%
- Co-authors
- Xingyi ZhouPhilipp KrähenbühlVladlen KoltunFrédo DurandWilliam T. FreemanSong HanGuangxuan XiaoEli Shechtman
- Topics
- Video Surveillance and Tracking Methods (2 papers)Advanced Control Systems Optimization (1 paper)Sparse and Compressive Sensing Techniques (1 paper)
- Journals
- International Journal of Computer VisionIEEE Transactions on Computational Imaging2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
- Partner nations
- United States
In The Last Decade
Tianwei Yin
7 papers receiving 1.3k citations
Hit Papers
Peers
Comparison fields: 5 of 65
- Computer Vision and Pattern Recognition 1.1k
- Aerospace Engineering 509
- Automotive Engineering 228
- Environmental Engineering 169
- Artificial Intelligence 153
Countries citing papers authored by Tianwei Yin
This map shows the geographic impact of Tianwei Yin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tianwei Yin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tianwei Yin more than expected).
Fields of papers citing papers by Tianwei Yin
This network shows the impact of papers produced by Tianwei Yin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tianwei Yin. The network helps show where Tianwei Yin may publish in the future.
Co-authorship network of co-authors of Tianwei Yin
This figure shows the co-authorship network connecting the top 25 collaborators of Tianwei Yin. A scholar is included among the top collaborators of Tianwei Yin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tianwei Yin. Tianwei Yin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 2 | |
| 3 | 19 | |
| 4 | 1 | |
| 5 | 32 | |
| 6 | 117 | |
| 7 | Center-based 3D Object Detection and Trackingbreakdown → | 1134 |
About Tianwei Yin
Tianwei Yin is a scholar working on Computer Graphics and Computer-Aided Design, Computer Vision and Pattern Recognition and Computational Mechanics, having authored 7 papers that have together received 1.3k indexed citations. Recurring topics across this work include Video Surveillance and Tracking Methods (2 papers), Advanced Control Systems Optimization (1 paper) and Sparse and Compressive Sensing Techniques (1 paper). The work is most often cited by research in Computer Vision and Pattern Recognition (1.1k citations), Geology (140 citations) and Instrumentation (74 citations). Tianwei Yin has collaborated with scholars based in United States. Frequent co-authors include Xingyi Zhou, Philipp Krähenbühl, Vladlen Koltun, Frédo Durand, William T. Freeman, Song Han, Guangxuan Xiao, Eli Shechtman, Richard Zhang and Taesung Park. Their work appears in journals such as International Journal of Computer Vision, IEEE Transactions on Computational Imaging and 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.