Thomas Schmidt
Impact in
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Surface and Thin Film Phenomena 45
- Advanced Chemical Physics Studies 26
- Semiconductor Quantum Structures and Devices 25
-
- Electron and X-Ray Spectroscopy Techniques 38
- Co-authors
- Eberhard Umbach (29 shared papers)R. Fink (19 shared papers)Achim Schöll (10 shared papers)J. Falta (56 shared papers)Ying Zou (5 shared papers)Alfred Forchel (7 shared papers)Hans‐Joachim Freund (20 shared papers)Ernst Bauer (9 shared papers)
- Journals
- Surface Science (16 papers)The Journal of Physical Chemistry C (8 papers)Journal of Applied Physics (7 papers)Physical Review B (6 papers)Applied Surface Science (5 papers)
- Partner nations
- GermanyItalyUnited States
In The Last Decade
Thomas Schmidt
210 papers receiving 5.6k citations
Peers
Comparison fields: 5 of 102
- Structural Biology 493
- Surfaces, Coatings and Films 748
- Atomic and Molecular Physics, and Optics 2.3k
- Radiation 476
- Materials Chemistry 2.4k
Countries citing papers authored by Thomas Schmidt
This map shows the geographic impact of Thomas Schmidt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Schmidt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Schmidt more than expected).
Fields of papers citing papers by Thomas Schmidt
This network shows the impact of papers produced by Thomas Schmidt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Schmidt. The network helps show where Thomas Schmidt may publish in the future.
Co-authors
The 25 scholars most cited alongside Thomas Schmidt, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 213 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 371 | |
| 2 | 2010 | 303 | |
| 3 | 2013 | 275 | |
| 4 | 2006 | 254 | |
| 5 | 1998 | 222 | |
| 6 | 2003 | 151 | |
| 7 | 2007 | 149 | |
| 8 | 1997 | 126 | |
| 9 | 2004 | 124 | |
| 10 | 1998 | 119 | |
| 11 | 2010 | 88 | |
| 12 | 2004 | 79 | |
| 13 | 2002 | 78 | |
| 14 | 2006 | 78 | |
| 15 | 1998 | 76 | |
| 16 | 2010 | 75 | |
| 17 | 2002 | 70 | |
| 18 | 2002 | 69 | |
| 19 | 2003 | 68 | |
| 20 | 2006 | 68 |
About Thomas Schmidt
Thomas Schmidt is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Materials Chemistry, Electrical and Electronic Engineering and Radiation, having authored 213 papers that have together received 5.7k indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (45 papers), Electron and X-Ray Spectroscopy Techniques (38 papers), Semiconductor materials and devices (33 papers), Advanced Chemical Physics Studies (26 papers), Semiconductor Quantum Structures and Devices (25 papers), Molecular Junctions and Nanostructures (18 papers), Catalytic Processes in Materials Science (18 papers) and X-ray Spectroscopy and Fluorescence Analysis (17 papers). The work is most often cited by research in Structural Biology (493 citations), Surfaces, Coatings and Films (748 citations), Atomic and Molecular Physics, and Optics (2.3k citations), Radiation (476 citations) and Materials Chemistry (2.4k citations). Thomas Schmidt has collaborated with scholars based in Germany, Italy and United States. Frequent co-authors include Eberhard Umbach, R. Fink, Achim Schöll, J. Falta, Ying Zou, Alfred Forchel, Hans‐Joachim Freund, Ernst Bauer, G. Lilienkamp and Stefan Heun. Their work appears in journals such as Surface Science, The Journal of Physical Chemistry C, Journal of Applied Physics, Physical Review B and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.