Thomas J. Regan
- Atomic and Molecular Physics, and Optics top 5%
- Materials Chemistry top 10%
- Electronic, Optical and Magnetic Materials top 5%
- Condensed Matter Physics top 5%
- Electrical and Electronic Engineering
- Topics
- Magnetic properties of thin films (6 papers)ZnO doping and properties (3 papers)Magnetic and transport properties of perovskites and related materials (2 papers)
- Partner nations
- United StatesSwitzerlandGermany
In The Last Decade
Thomas J. Regan
7 papers receiving 888 citations
Hit Papers
Peers
Comparison fields: 5 of 58
- Atomic and Molecular Physics, and Optics 523
- Materials Chemistry 420
- Electronic, Optical and Magnetic Materials 389
- Condensed Matter Physics 238
- Electrical and Electronic Engineering 169
Countries citing papers authored by Thomas J. Regan
This map shows the geographic impact of Thomas J. Regan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas J. Regan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas J. Regan more than expected).
Fields of papers citing papers by Thomas J. Regan
This network shows the impact of papers produced by Thomas J. Regan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas J. Regan. The network helps show where Thomas J. Regan may publish in the future.
Co-authorship network of co-authors of Thomas J. Regan
This figure shows the co-authorship network connecting the top 25 collaborators of Thomas J. Regan. A scholar is included among the top collaborators of Thomas J. Regan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Thomas J. Regan. Thomas J. Regan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 197 | |
| 2 | X-ray absorption spectroscopy and microscopy study of ferro- and antiferromagnetic thin films, with applications to exchange anisotropy | 4 |
| 3 | Chemical effects at metal/oxide interfaces studied by x-ray-absorption spectroscopybreakdown → | 501 |
| 4 | 17 | |
| 5 | 165 | |
| 6 | 18 | |
| 7 | 1 |
About Thomas J. Regan
Thomas J. Regan is a scholar working on Structural Biology, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, having authored 7 papers that have together received 903 indexed citations. Recurring topics across this work include Magnetic properties of thin films (6 papers), ZnO doping and properties (3 papers) and Magnetic and transport properties of perovskites and related materials (2 papers). The work is most often cited by research in Structural Biology (48 citations), Electronic, Optical and Magnetic Materials (389 citations) and Condensed Matter Physics (238 citations). Thomas J. Regan has collaborated with scholars based in United States, Switzerland and Germany. Frequent co-authors include Robert L. White, J. Stöhr, J. Lüning, Hendrik Ohldag, F. Nolting, C. Stamm, S. Anders, A. Schöll, H. A. Padmore and M. R. Scheinfein. Their work appears in journals such as Physical Review Letters, Physical review. B, Condensed matter and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.