Tae Bong Eom

583 total citations
32 papers, 471 citations indexed

About

Tae Bong Eom is a scholar working on Mechanical Engineering, Computer Vision and Pattern Recognition and Computational Mechanics. According to data from OpenAlex, Tae Bong Eom has authored 32 papers receiving a total of 471 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Mechanical Engineering, 15 papers in Computer Vision and Pattern Recognition and 14 papers in Computational Mechanics. Recurrent topics in Tae Bong Eom's work include Advanced Measurement and Metrology Techniques (26 papers), Optical measurement and interference techniques (15 papers) and Surface Roughness and Optical Measurements (12 papers). Tae Bong Eom is often cited by papers focused on Advanced Measurement and Metrology Techniques (26 papers), Optical measurement and interference techniques (15 papers) and Surface Roughness and Optical Measurements (12 papers). Tae Bong Eom collaborates with scholars based in South Korea. Tae Bong Eom's co-authors include Jong-Ahn Kim, Chu-Shik Kang, Jonghan Jin, Jae Wan Kim, Byong Chon Park, Jung Ju, Hee Joo Choi, Myoungsik Cha, Hwan Hong Lim and Han Seb Moon and has published in prestigious journals such as Applied Physics Letters, Optics Express and Japanese Journal of Applied Physics.

In The Last Decade

Tae Bong Eom

31 papers receiving 446 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Tae Bong Eom South Korea 12 295 197 142 138 125 32 471
Marek Dobosz Poland 13 411 1.4× 119 0.6× 134 0.9× 142 1.0× 182 1.5× 55 547
Paul Köchert Germany 10 293 1.0× 94 0.5× 133 0.9× 98 0.7× 75 0.6× 28 367
Masato Aketagawa Japan 13 307 1.0× 83 0.4× 181 1.3× 143 1.0× 87 0.7× 71 504
Rainer Köning Germany 12 366 1.2× 136 0.7× 124 0.9× 135 1.0× 119 1.0× 42 463
Wenmei Hou China 11 350 1.2× 140 0.7× 171 1.2× 77 0.6× 121 1.0× 35 427
Gerd Jäger Germany 10 282 1.0× 71 0.4× 113 0.8× 193 1.4× 114 0.9× 28 417
Sonko Osawa Japan 14 576 2.0× 211 1.1× 86 0.6× 153 1.1× 168 1.3× 55 669
Akihide Kimura Japan 7 358 1.2× 204 1.0× 84 0.6× 116 0.8× 155 1.2× 13 417
Ki-Nam Joo South Korea 15 313 1.1× 212 1.1× 265 1.9× 161 1.2× 111 0.9× 61 604
Roland Füßl Germany 8 218 0.7× 57 0.3× 72 0.5× 150 1.1× 65 0.5× 27 309

Countries citing papers authored by Tae Bong Eom

Since Specialization
Citations

This map shows the geographic impact of Tae Bong Eom's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tae Bong Eom with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tae Bong Eom more than expected).

Fields of papers citing papers by Tae Bong Eom

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Tae Bong Eom. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tae Bong Eom. The network helps show where Tae Bong Eom may publish in the future.

Co-authorship network of co-authors of Tae Bong Eom

This figure shows the co-authorship network connecting the top 25 collaborators of Tae Bong Eom. A scholar is included among the top collaborators of Tae Bong Eom based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tae Bong Eom. Tae Bong Eom is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Kim, Jong-Ahn, et al.. (2015). Absolute angle measurement using a phase-encoded binary graduated disk. Measurement. 80. 288–293. 36 indexed citations
3.
Kang, Chu-Shik, et al.. (2014). An optical straightness measurement sensor for the KRISS watt balance. Measurement. 61. 257–262. 4 indexed citations
4.
Kim, Jong-Ahn, et al.. (2014). Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique. Applied Optics. 53(20). 4604–4604. 12 indexed citations
5.
Kim, Jong-Ahn, et al.. (2014). Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry. Optics Express. 22(6). 6486–6486. 11 indexed citations
6.
Kim, Jong-Ahn, et al.. (2013). Note: Nonlinearity error compensated absolute planar position measurement using a two-dimensional phase-encoded binary grating. Review of Scientific Instruments. 84(5). 56102–56102. 9 indexed citations
7.
Kim, Jong-Ahn, et al.. (2013). Calibration of angle artifacts and instruments using a high precision angle generator. International Journal of Precision Engineering and Manufacturing. 14(3). 367–371. 18 indexed citations
8.
Eom, Tae Bong, et al.. (2013). Tape measuring system using linear encoder and digital camera. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8788. 87883P–87883P. 5 indexed citations
9.
10.
Kim, Jong-Ahn, et al.. (2012). An optical absolute position measurement method using a phase-encoded single track binary code. Review of Scientific Instruments. 83(11). 115115–115115. 34 indexed citations
11.
Choi, Hee Joo, Hwan Hong Lim, Han Seb Moon, et al.. (2010). Measurement of refractive index and thickness of transparent plate by dual-wavelength interference. Optics Express. 18(9). 9429–9429. 54 indexed citations
12.
Jin, Jonghan, et al.. (2010). Thickness and refractive index measurement of a silicon wafer based on an optical comb. Optics Express. 18(17). 18339–18339. 75 indexed citations
13.
Jin, Jonghan, et al.. (2010). Thickness and refractive index measurement of a wafer based on the optical comb. 28. JWA46–JWA46. 2 indexed citations
14.
Kim, Jong-Ahn, et al.. (2010). An interferometric Abbe-type comparator for the calibration of internal and external diameter standards. Measurement Science and Technology. 21(7). 75109–75109. 10 indexed citations
15.
16.
Kim, Jong-Ahn, et al.. (2008). Measurements of Two-dimensional Gratings Using a Metrological Atomic Force Microscope with uncertainty Evaluation. International Journal of Precision Engineering and Manufacturing. 9(2). 18–22. 3 indexed citations
17.
Eom, Tae Bong, et al.. (2007). The Small Angle Generator Based on a Laser Angle Interferometer. International Journal of Precision Engineering and Manufacturing. 8(3). 20–23. 9 indexed citations
18.
Kim, Jong-Ahn, et al.. (2007). Development of a precision dual level stage system for the dimensional metrology of large range surface topography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6672. 66720T–66720T. 1 indexed citations
19.
Park, Jinwon, et al.. (2006). Development of an Angle Calibration System with a Combined Silicon Polygon and Angle Interferometer. Japanese Journal of Applied Physics. 45(6R). 5293–5293. 3 indexed citations
20.
Kwon, Jin Hyuk, et al.. (1998). Portable autocollimators using the laser diode and the position sensitive detector. Review of Scientific Instruments. 69(2). 402–405. 15 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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