Shirley Hemar

494 total citations
5 papers, 9 citations indexed

About

Shirley Hemar is a scholar working on Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Computational Mechanics. According to data from OpenAlex, Shirley Hemar has authored 5 papers receiving a total of 9 indexed citations (citations by other indexed papers that have themselves been cited), including 5 papers in Electrical and Electronic Engineering, 3 papers in Industrial and Manufacturing Engineering and 1 paper in Computational Mechanics. Recurrent topics in Shirley Hemar's work include Advancements in Photolithography Techniques (5 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Industrial Vision Systems and Defect Detection (3 papers). Shirley Hemar is often cited by papers focused on Advancements in Photolithography Techniques (5 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Industrial Vision Systems and Defect Detection (3 papers). Shirley Hemar collaborates with scholars based in Israel, United States and Taiwan. Shirley Hemar's co-authors include Kezhi Li, Mircea Dusa and John C. Lin and has published in prestigious journals such as Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

In The Last Decade

Shirley Hemar

4 papers receiving 9 citations

Peers

Shirley Hemar
S.H. Lee South Korea
Dingdong Yang China
H. X. Yang China
M. Begalli Brazil
J. Imong United Kingdom
R Takahashi Japan
Jeffrey Cichocki United States
A. J. Martin France
S. Carrillo Mexico
S. Hamilton United Kingdom
S.H. Lee South Korea
Shirley Hemar
Citations per year, relative to Shirley Hemar Shirley Hemar (= 1×) peers S.H. Lee

Countries citing papers authored by Shirley Hemar

Since Specialization
Citations

This map shows the geographic impact of Shirley Hemar's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shirley Hemar with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shirley Hemar more than expected).

Fields of papers citing papers by Shirley Hemar

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shirley Hemar. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shirley Hemar. The network helps show where Shirley Hemar may publish in the future.

Co-authorship network of co-authors of Shirley Hemar

This figure shows the co-authorship network connecting the top 25 collaborators of Shirley Hemar. A scholar is included among the top collaborators of Shirley Hemar based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shirley Hemar. Shirley Hemar is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

5 of 5 papers shown
1.
Hemar, Shirley, et al.. (2008). SEM-based methodology for root cause analysis of wafer edge and bevel defects. 11–14. 5 indexed citations
2.
Hemar, Shirley, et al.. (2002). Inspecting Alternating Phase Shift Masks by Matching Stepper Conditions. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4889. 247–247. 1 indexed citations
3.
Lin, John C., et al.. (2002). Aerial image-based inspection of binary (OPC) and embedded-attenuated PSM. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4889. 1010–1010. 2 indexed citations
4.
Hemar, Shirley, et al.. (2000). In-line verification of linewidth uniformity for 0.18 and below: design rule reticles. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4066. 348–348. 1 indexed citations
5.
Hemar, Shirley, et al.. (2000). New approach to mask and wafer performance optimization for system-on-a-chip (SOC) devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4066. 496–496.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026