Shih‐Fu Liu
- Electrical and Electronic Engineering top 10%
- Electronic, Optical and Magnetic Materials
- Hardware and Architecture top 5%
- Computer Networks and Communications
- Automotive Engineering
- Co-authors
- Juan Antonio MaestroPedro ReviriegoHan‐Yi ChenMark F. FlanaganChung‐Sheng NiChun‐Han KuoChia‐Ching LinChia‐Liang Sun
- Topics
- VLSI and Analog Circuit Testing (11 papers)Radiation Effects in Electronics (11 papers)Supercapacitor Materials and Fabrication (7 papers)
- Cited by
- Hardware and ArchitectureElectronic, Optical and Magnetic MaterialsElectrical and Electronic Engineering
- Journals
- SHILAP Revista de lepidopterologíaAdvanced Energy MaterialsJournal of Power Sources
In The Last Decade
Shih‐Fu Liu
23 papers receiving 327 citations
Peers
Comparison fields: 5 of 35
- Electrical and Electronic Engineering 321
- Electronic, Optical and Magnetic Materials 111
- Hardware and Architecture 105
- Computer Networks and Communications 40
- Automotive Engineering 35
Countries citing papers authored by Shih‐Fu Liu
This map shows the geographic impact of Shih‐Fu Liu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shih‐Fu Liu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shih‐Fu Liu more than expected).
Fields of papers citing papers by Shih‐Fu Liu
This network shows the impact of papers produced by Shih‐Fu Liu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shih‐Fu Liu. The network helps show where Shih‐Fu Liu may publish in the future.
Co-authorship network of co-authors of Shih‐Fu Liu
This figure shows the co-authorship network connecting the top 25 collaborators of Shih‐Fu Liu. A scholar is included among the top collaborators of Shih‐Fu Liu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shih‐Fu Liu. Shih‐Fu Liu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 9 | |
| 3 | 10 | |
| 4 | 15 | |
| 5 | 22 | |
| 6 | 16 | |
| 7 | 31 | |
| 8 | 1 | |
| 9 | 22 | |
| 10 | 26 | |
| 11 | 1 | |
| 12 | 11 | |
| 13 | 6 | |
| 14 | 34 | |
| 15 | 5 | |
| 16 | 12 | |
| 17 | 15 | |
| 18 | 58 | |
| 19 | 10 | |
| 20 | 1 |
About Shih‐Fu Liu
Shih‐Fu Liu is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 24 papers that have together received 348 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (11 papers), Radiation Effects in Electronics (11 papers) and Supercapacitor Materials and Fabrication (7 papers). The work is most often cited by research in Hardware and Architecture (105 citations), Electronic, Optical and Magnetic Materials (111 citations) and Electrical and Electronic Engineering (321 citations). Shih‐Fu Liu has collaborated with scholars based in Spain, Taiwan and Ireland. Frequent co-authors include Juan Antonio Maestro, Pedro Reviriego, Han‐Yi Chen, Mark F. Flanagan, Chung‐Sheng Ni, Chun‐Han Kuo, Chia‐Ching Lin, Chia‐Liang Sun, Jyh‐Fu Lee and Jin‐Hua Huang. Their work appears in journals such as SHILAP Revista de lepidopterología, Advanced Energy Materials and Journal of Power Sources.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.