Seongyoon Kim
- Automotive Engineering top 5%
- Electrical and Electronic Engineering
- Control and Systems Engineering top 10%
- Safety, Risk, Reliability and Quality top 5%
- Biomedical Engineering
- Co-authors
- Jung‐Il ChoiYun Young ChoiKi Jae KimSoowhan KimMin‐Ho LeeSang‐Hee LeeHyunsoon ChoSeung Hwan Ko
- Topics
- Advanced Battery Technologies Research (10 papers)Advancements in Battery Materials (7 papers)Advanced Battery Materials and Technologies (3 papers)
- Cited by
- Automotive EngineeringSafety, Risk, Reliability and QualityElectrical and Electronic Engineering
- Partner nations
- South KoreaUnited StatesChina
In The Last Decade
Seongyoon Kim
19 papers receiving 365 citations
Peers
Comparison fields: 5 of 79
- Automotive Engineering 246
- Electrical and Electronic Engineering 238
- Control and Systems Engineering 65
- Safety, Risk, Reliability and Quality 60
- Biomedical Engineering 31
Countries citing papers authored by Seongyoon Kim
This map shows the geographic impact of Seongyoon Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Seongyoon Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Seongyoon Kim more than expected).
Fields of papers citing papers by Seongyoon Kim
This network shows the impact of papers produced by Seongyoon Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Seongyoon Kim. The network helps show where Seongyoon Kim may publish in the future.
Co-authorship network of co-authors of Seongyoon Kim
This figure shows the co-authorship network connecting the top 25 collaborators of Seongyoon Kim. A scholar is included among the top collaborators of Seongyoon Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Seongyoon Kim. Seongyoon Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 4 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 19 | |
| 6 | 33 | |
| 7 | 5 | |
| 8 | 0 | |
| 9 | 3 | |
| 10 | 103 | |
| 11 | 56 | |
| 12 | 10 | |
| 13 | 39 | |
| 14 | 40 | |
| 15 | 28 | |
| 16 | 0 | |
| 17 | 5 | |
| 18 | 8 | |
| 19 | 3 | |
| 20 | 12 |
About Seongyoon Kim
Seongyoon Kim is a scholar working on Automotive Engineering, Safety, Risk, Reliability and Quality and Internal Medicine, having authored 21 papers that have together received 372 indexed citations. Recurring topics across this work include Advanced Battery Technologies Research (10 papers), Advancements in Battery Materials (7 papers) and Advanced Battery Materials and Technologies (3 papers). The work is most often cited by research in Automotive Engineering (246 citations), Safety, Risk, Reliability and Quality (60 citations) and Electrical and Electronic Engineering (238 citations). Seongyoon Kim has collaborated with scholars based in South Korea, United States and China. Frequent co-authors include Jung‐Il Choi, Yun Young Choi, Ki Jae Kim, Soowhan Kim, Min‐Ho Lee, Sang‐Hee Lee, Hyunsoon Cho, Seung Hwan Ko, Sukjoon Hong and Jaeho Shin. Their work appears in journals such as ACS Nano, Journal of Power Sources and Applied Energy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.