S. Rezgui

857 total citations
29 papers, 604 citations indexed

About

S. Rezgui is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, S. Rezgui has authored 29 papers receiving a total of 604 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 21 papers in Hardware and Architecture and 3 papers in Computer Networks and Communications. Recurrent topics in S. Rezgui's work include Radiation Effects in Electronics (26 papers), VLSI and Analog Circuit Testing (18 papers) and Semiconductor materials and devices (8 papers). S. Rezgui is often cited by papers focused on Radiation Effects in Electronics (26 papers), VLSI and Analog Circuit Testing (18 papers) and Semiconductor materials and devices (8 papers). S. Rezgui collaborates with scholars based in United States, France and Brazil. S. Rezgui's co-authors include R. Ecoffet, R. Velazco, John McCollum, B. Cronquist, Michael Caffrey, Heather Quinn, Paul Graham, Jim Krone, Luca Sterpone and M. Violante and has published in prestigious journals such as IEEE Transactions on Nuclear Science, Journal of Spacecraft and Rockets and Journal of Electronic Testing.

In The Last Decade

S. Rezgui

29 papers receiving 546 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Rezgui United States 13 577 452 66 34 28 29 604
Austin Lesea United States 11 484 0.8× 348 0.8× 44 0.7× 31 0.9× 10 0.4× 17 532
B. Gill United States 13 980 1.7× 561 1.2× 70 1.1× 64 1.9× 18 0.6× 24 1.0k
Dan Alexandrescu France 12 497 0.9× 317 0.7× 47 0.7× 48 1.4× 21 0.8× 46 525
S. Jagannathan United States 17 834 1.4× 494 1.1× 44 0.7× 34 1.0× 9 0.3× 43 852
Tadanobu Toba Japan 5 414 0.7× 252 0.6× 74 1.1× 22 0.6× 13 0.5× 17 435
M. Alderighi Italy 12 330 0.6× 272 0.6× 46 0.7× 29 0.9× 30 1.1× 46 369
Paul Eaton United States 17 1.4k 2.4× 814 1.8× 58 0.9× 36 1.1× 8 0.3× 32 1.5k
S. D’Angelo Italy 10 316 0.5× 267 0.6× 39 0.6× 26 0.8× 28 1.0× 40 348
Jorge Tonfat Brazil 10 257 0.4× 176 0.4× 46 0.7× 12 0.4× 18 0.6× 23 284
Lucas Antunes Tambara Brazil 12 357 0.6× 239 0.5× 83 1.3× 24 0.7× 35 1.3× 35 386

Countries citing papers authored by S. Rezgui

Since Specialization
Citations

This map shows the geographic impact of S. Rezgui's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Rezgui with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Rezgui more than expected).

Fields of papers citing papers by S. Rezgui

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Rezgui. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Rezgui. The network helps show where S. Rezgui may publish in the future.

Co-authorship network of co-authors of S. Rezgui

This figure shows the co-authorship network connecting the top 25 collaborators of S. Rezgui. A scholar is included among the top collaborators of S. Rezgui based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Rezgui. S. Rezgui is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Rezgui, S., et al.. (2012). SET Characterization and Mitigation in 65-nm CMOS Test Structures. IEEE Transactions on Nuclear Science. 59(4). 851–859. 13 indexed citations
3.
Rezgui, S., et al.. (2012). Investigation of Low Dose Rate and Bias Conditions on the Total Dose Tolerance of a CMOS Flash-Based FPGA. IEEE Transactions on Nuclear Science. 59(1). 134–143. 12 indexed citations
4.
Rezgui, S., et al.. (2011). SET characterization & mitigation in 65-nm test structures. 51. 213–221. 3 indexed citations
5.
Rezgui, S., et al.. (2010). Design and Layout Effects on SET Propagation in 90-nm ASIC and FPGA Test Structures. IEEE Transactions on Nuclear Science. 7 indexed citations
6.
Rezgui, S., et al.. (2010). SEE Characterization of the New RTAX-DSP (RTAX-D) Antifuse-Based FPGA. IEEE Transactions on Nuclear Science. 6 indexed citations
7.
Rezgui, S., et al.. (2008). Configuration and Routing Effects on the SET Propagation in Flash-Based FPGAs. IEEE Transactions on Nuclear Science. 55(6). 3328–3335. 32 indexed citations
8.
Sterpone, Luca, M. Violante, & S. Rezgui. (2006). An Analysis Based on Fault Injection of Hardening Techniques for SRAM-Based FPGAs. IEEE Transactions on Nuclear Science. 53(4). 2054–2059. 33 indexed citations
9.
Sterpone, Luca, M. Violante, & S. Rezgui. (2005). An experimental analysis of hardening techniques for SRAM-based FPGAs. J5–1. 4 indexed citations
10.
Rezgui, S., et al.. (2005). Complex upset mitigation applied to a Re-configurable embedded processor. IEEE Transactions on Nuclear Science. 52(6). 2468–2474. 11 indexed citations
11.
George, J., G.M. Swift, S. M. Guertin, et al.. (2005). Heavy ion SEE testing of Xilinx one-time programmable configuration PROMs. 72–78. 1 indexed citations
12.
13.
Velazco, Raoul, et al.. (2003). Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment: A Case Studied. Journal of Electronic Testing. 19(1). 83–90. 6 indexed citations
14.
Rezgui, S., et al.. (2002). New Methodology for Simulation of Soft Errors in Digital Processors. Journal of Spacecraft and Rockets. 39(4). 495–500. 1 indexed citations
15.
Rezgui, S., et al.. (2002). Validation of an SEU simulation technique for a complex processor: PowerPC7400. IEEE Transactions on Nuclear Science. 49(6). 3156–3162. 6 indexed citations
16.
Rezgui, S., et al.. (2001). Estimating error rates in processor-based architectures. IEEE Transactions on Nuclear Science. 48(5). 1680–1687. 27 indexed citations
17.
Cota, Érika, F. Lima, S. Rezgui, et al.. (2001). Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. Journal of Electronic Testing. 17(2). 149–161. 8 indexed citations
18.
Velazco, R., S. Rezgui, & R. Ecoffet. (2000). Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulating Upsets) injection. IEEE Transactions on Nuclear Science. 47(6). 2405–2411. 95 indexed citations
19.
Velazco, Raoul, et al.. (1998). Digital fuzzy control: a robust alternative suitable for space application. IEEE Transactions on Nuclear Science. 45(6). 2941–2947. 4 indexed citations
20.
Underwood, Craig, et al.. (1998). SEU induced errors observed in microprocessor systems. IEEE Transactions on Nuclear Science. 45(6). 2876–2883. 27 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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