S. Machulik
Impact in
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- Metamaterials and Metasurfaces Applications
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- Thermal Radiation and Cooling Technologies
Papers in
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- Optical Coatings and Gratings 2
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- GaN-based semiconductor devices and materials 2
- Co-authors
- W. T. MasselinkJan KischkatG. MonastyrskyiA. AleksandrovaM. KlinkmüllerM. ChashnikovaM. P. SemtsivYuri V. Flores
In The Last Decade
S. Machulik
7 papers receiving 827 citations
Hit Papers
Peers
Comparison fields: 5 of 59
- Electronic, Optical and Magnetic Materials 245
- Civil and Structural Engineering 247
- Atomic and Molecular Physics, and Optics 270
- Surfaces, Coatings and Films 57
- Electrical and Electronic Engineering 382
Countries citing papers authored by S. Machulik
This map shows the geographic impact of S. Machulik's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Machulik with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Machulik more than expected).
Fields of papers citing papers by S. Machulik
This network shows the impact of papers produced by S. Machulik. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Machulik. The network helps show where S. Machulik may publish in the future.
Co-authors
The 22 scholars most cited alongside S. Machulik, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 20 | |
| 2 | 2016 | 14 | |
| 3 | 2014 | 12 | |
| 4 | Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride Hit paper breakdown → | 2012 | 784 |
| 5 | Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride. Appl. Opt. 51, 6789-6798 | 2012 | 15 |
| 6 | 2010 | 9 | |
| 7 | 2010 | 4 |
About S. Machulik
S. Machulik is a scholar working on Surfaces, Coatings and Films, Condensed Matter Physics, Polymers and Plastics, Electrical and Electronic Engineering and Materials Chemistry, having authored 7 papers that have together received 858 indexed citations. Recurring topics across this work include Gas Sensing Nanomaterials and Sensors (2 papers), Electronic and Structural Properties of Oxides (2 papers), Optical Coatings and Gratings (2 papers), GaN-based semiconductor devices and materials (2 papers), ZnO doping and properties (2 papers), Transition Metal Oxide Nanomaterials (2 papers), Spectroscopy and Laser Applications (1 paper) and Photonic and Optical Devices (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (245 citations), Civil and Structural Engineering (247 citations), Atomic and Molecular Physics, and Optics (270 citations), Surfaces, Coatings and Films (57 citations) and Electrical and Electronic Engineering (382 citations). S. Machulik has collaborated with scholars based in Germany, Ukraine and Portugal. Frequent co-authors include W. T. Masselink, Jan Kischkat, G. Monastyrskyi, A. Aleksandrova, M. Klinkmüller, M. Chashnikova, M. P. Semtsiv, Yuri V. Flores, Bernd Gruska and Sven Peters. Their work appears in journals such as Journal of Crystal Growth, Journal of Applied Physics, Physical review. B., Applied Optics and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.