R.S. Amos

428 total citations
9 papers, 114 citations indexed

About

R.S. Amos is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Condensed Matter Physics. According to data from OpenAlex, R.S. Amos has authored 9 papers receiving a total of 114 indexed citations (citations by other indexed papers that have themselves been cited), including 5 papers in Electrical and Electronic Engineering, 4 papers in Biomedical Engineering and 3 papers in Condensed Matter Physics. Recurrent topics in R.S. Amos's work include Physics of Superconductivity and Magnetism (3 papers), Semiconductor materials and devices (3 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). R.S. Amos is often cited by papers focused on Physics of Superconductivity and Magnetism (3 papers), Semiconductor materials and devices (3 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). R.S. Amos collaborates with scholars based in United States and China. R.S. Amos's co-authors include C. Cabral, Sufi Zafar, Agnese Callegari, Arthur W. Lichtenberger, Xiangchao Meng, F. S. Pierce, Bascom S. Deaver, K. M. Wong, S. J. Poon and M. J. Feldman and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and IEEE Transactions on Magnetics.

In The Last Decade

R.S. Amos

8 papers receiving 104 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
R.S. Amos United States	6	87	32	24	21	15	9	114
Dilini Hemakumara United Kingdom	5	50 0.6×	23 0.7×	35 1.5×	23 1.1×	11 0.7×	9	84
H.-B. Schilling Germany	4	46 0.5×	33 1.0×	7 0.3×	20 1.0×	13 0.9×	8	80
George B. Norris United States	11	278 3.2×	32 1.0×	31 1.3×	85 4.0×	12 0.8×	23	328
F. Münz Czechia	5	16 0.2×	29 0.9×	20 0.8×	8 0.4×	14 0.9×	18	77
Liu Xinyu China	8	146 1.7×	20 0.6×	88 3.7×	54 2.6×	36 2.4×	50	183
Y. Yeh United States	7	132 1.5×	38 1.2×	9 0.4×	84 4.0×	5 0.3×	31	175
Juliette Martin France	6	48 0.6×	17 0.5×	8 0.3×	27 1.3×	3 0.2×	9	88
Justin Brockman United States	7	70 0.8×	53 1.7×	6 0.3×	20 1.0×	31 2.1×	10	142
K. A. Jones United States	6	47 0.5×	26 0.8×	43 1.8×	37 1.8×	16 1.1×	14	75
R. Modica Italy	8	122 1.4×	25 0.8×	71 3.0×	26 1.2×	40 2.7×	22	144

Countries citing papers authored by R.S. Amos

Since Specialization

Citations

This map shows the geographic impact of R.S. Amos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.S. Amos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.S. Amos more than expected).

Fields of papers citing papers by R.S. Amos

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.S. Amos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.S. Amos. The network helps show where R.S. Amos may publish in the future.

Co-authorship network of co-authors of R.S. Amos

This figure shows the co-authorship network connecting the top 25 collaborators of R.S. Amos. A scholar is included among the top collaborators of R.S. Amos based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.S. Amos. R.S. Amos is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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9 of 9 papers shown

1.

Cabral, C., C. Lavoie, Ahmet S. Özcan, et al.. (2004). Evaluation of Thermal Stability for CMOS Gate Metal Materials. Journal of The Electrochemical Society. 151(12). F283–F283. 14 indexed citations

2.

Zafar, Sufi, C. Cabral, R.S. Amos, & Agnese Callegari. (2002). A method for measuring barrier heights, metal work functions and fixed charge densities in metal/SiO2/Si capacitors. Applied Physics Letters. 80(25). 4858–4860. 38 indexed citations

3.

Amos, R.S., A. W. Lichtenberger, Edward Tong, et al.. (1999). Nb/Al-AlOx/Nb edge junctions for distributed mixers. IEEE Transactions on Applied Superconductivity. 9(2). 3878–3881.

4.

Amos, R.S., et al.. (1996). Newnes Dictionary of Electronics. Medical Entomology and Zoology. 5 indexed citations

5.

Amos, R.S., et al.. (1995). Stress and source conditions of DC magnetron sputtered Nb films. IEEE Transactions on Applied Superconductivity. 5(2). 2326–2329. 23 indexed citations

6.

Meng, Xiangchao, F. S. Pierce, K. M. Wong, et al.. (1991). Preparation and properties of in-situ YBaCuO films on Si substrates with buffer layers. IEEE Transactions on Magnetics. 27(2). 1638–1641. 22 indexed citations

7.

Amos, R.S., Arthur W. Lichtenberger, M. J. Feldman, R.J. Mattauch, & E. J. Cukauskas. (1991). Fabrication of NbCN/PbBi edge junctions with extremely low leakage currents. IEEE Transactions on Magnetics. 27(2). 3200–3202. 3 indexed citations

8.

Meng, Xiangchao, R.S. Amos, F. S. Pierce, et al.. (1991). YBaCuO superconducting microbridges on Si substrates made by a novel method. IEEE Transactions on Magnetics. 27(2). 3305–3307. 4 indexed citations

9.

Meng, Xiangchao, R.S. Amos, Arthur W. Lichtenberger, R.J. Mattauch, & M. J. Feldman. (1989). NbN edge junction fabrication: edge profile control by reactive ion etching. IEEE Transactions on Magnetics. 25(2). 1239–1242. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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