Robert Svagera

951 citations
62 papers · 668 indexed · h-index 14

Robert Svagera

60 papers receiving 651 citations

Peers

Robert Svagera
Comparison fields: 5 of 72
  • Surfaces, Coatings and Films 215
  • Radiation 151
  • Condensed Matter Physics 111
  • Structural Biology 11
  • Electronic, Optical and Magnetic Materials 116
Replace C. J. Powell with:
C. J. Powell United States
Douglas G. Van Campen United States
Yusuke Mizokawa Japan
C. Jardin France
James M. Burkstrand United States
K. Ławniczak‐Jabłońska Poland
Sung Hwan Heo South Korea
B. Egert Germany
Fan Jiang China
P. Mrozek Poland
Robert Svagera relative to C. J. Powell United States C. J. Powell's profile →
Citations per field
00.5×4.6×
C. J. Powell · 1×
Citations per year

Countries citing papers authored by Robert Svagera

Since Specialization
Citations

This map shows the geographic impact of Robert Svagera's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Robert Svagera with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Robert Svagera more than expected).

Fields of papers citing papers by Robert Svagera

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Robert Svagera. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Robert Svagera. The network helps show where Robert Svagera may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Robert Svagera, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Robert Svagera Line = papers co-authored together Robert Svagera links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20240
2 202323
3 202027
4 201765
5 20152
6 200918
7 200513
8 200524
9 20021
10 199911
11 19999
12 199746
13 19971
14
Determination of thickness and composition of thin Al{sub x}Ga{sub 1-x}As layers on GaAs by total electron yield (TEY)
19951
15 19951
16 19951
17 19951
18 199410
19 19921
20 19908

About Robert Svagera

Robert Svagera is a scholar working on Surfaces, Coatings and Films, Radiation and Condensed Matter Physics, having authored 62 papers that have together received 668 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (33 papers), X-ray Spectroscopy and Fluorescence Analysis (28 papers), Advancements in Photolithography Techniques (10 papers), Nuclear Physics and Applications (8 papers), Ion-surface interactions and analysis (7 papers), Surface Modification and Superhydrophobicity (6 papers), Semiconductor materials and devices (6 papers) and Advanced Thermoelectric Materials and Devices (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (215 citations), Radiation (151 citations) and Condensed Matter Physics (111 citations). Robert Svagera has collaborated with scholars based in Austria, Germany and United States. Frequent co-authors include Maria F. Ebel, H. Ebel, Abdallah A. Shaltout, Wolfgang Kern, J.H. Hubbell, S. Paschen, A. Prokofiev, J. Wernisch, Peter Pölt and H. Plenk. Their work appears in journals such as Journal of Electron Spectroscopy and Related Phenomena, Surface and Interface Analysis, Analytical and Bioanalytical Chemistry, Macromolecular Chemistry and Physics and Chemistry of Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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