H. Ebel

1.9k total citations
126 papers, 1.5k citations indexed

About

H. Ebel is a scholar working on Radiation, Surfaces, Coatings and Films and Electrical and Electronic Engineering. According to data from OpenAlex, H. Ebel has authored 126 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 85 papers in Radiation, 85 papers in Surfaces, Coatings and Films and 39 papers in Electrical and Electronic Engineering. Recurrent topics in H. Ebel's work include Electron and X-Ray Spectroscopy Techniques (83 papers), X-ray Spectroscopy and Fluorescence Analysis (78 papers) and Advancements in Photolithography Techniques (25 papers). H. Ebel is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (83 papers), X-ray Spectroscopy and Fluorescence Analysis (78 papers) and Advancements in Photolithography Techniques (25 papers). H. Ebel collaborates with scholars based in Austria, Germany and Poland. H. Ebel's co-authors include Maria F. Ebel, A. Jabłoński, Robert Svagera, J. Wernisch, K. Burger, Michael Mantler, Abdallah A. Shaltout, J.H. Hubbell, Wolfgang Hanke and K. Hirokawa and has published in prestigious journals such as Analytica Chimica Acta, Surface Science and Physics Letters A.

In The Last Decade

H. Ebel

121 papers receiving 1.3k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
H. Ebel Austria	21	850	774	453	427	247	126	1.5k
A. Berndtsson Sweden	11	513 0.6×	348 0.4×	351 0.8×	405 0.9×	379 1.5×	14	1.1k
D.J. Fabian United Kingdom	19	449 0.5×	236 0.3×	420 0.9×	900 2.1×	386 1.6×	60	1.6k
Rasmus Nilsson Sweden	12	485 0.6×	404 0.5×	280 0.6×	349 0.8×	349 1.4×	26	1.1k
A. Menelle France	23	275 0.3×	339 0.4×	279 0.6×	715 1.7×	433 1.8×	118	1.8k
E. Hartmann Germany	17	234 0.3×	327 0.4×	217 0.5×	551 1.3×	158 0.6×	76	1.2k
T.A. Sasaki Japan	20	306 0.4×	238 0.3×	344 0.8×	511 1.2×	191 0.8×	85	1.2k
Hiroshi Shinotsuka Japan	17	602 0.7×	305 0.4×	414 0.9×	433 1.0×	276 1.1×	51	1.1k
Lo I Yin United States	11	323 0.4×	255 0.3×	156 0.3×	318 0.7×	248 1.0×	26	877
А.Г. Кочур Russia	19	354 0.4×	471 0.6×	153 0.3×	565 1.3×	405 1.6×	116	1.4k
Yasuharu Yoneda Japan	5	161 0.2×	307 0.4×	191 0.4×	349 0.8×	178 0.7×	11	891

Countries citing papers authored by H. Ebel

Since Specialization

Citations

This map shows the geographic impact of H. Ebel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Ebel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Ebel more than expected).

Fields of papers citing papers by H. Ebel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Ebel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Ebel. The network helps show where H. Ebel may publish in the future.

Co-authorship network of co-authors of H. Ebel

This figure shows the co-authorship network connecting the top 25 collaborators of H. Ebel. A scholar is included among the top collaborators of H. Ebel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Ebel. H. Ebel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Ebel, H.. (2004). Quantitative analysis by X-ray induced total electron yield (TEY) compared to XRFA. Powder Diffraction. 19(1). 90–96. 3 indexed citations

Ebel, H., Christina Streli, G. Pepponi, & P. Wobrauschek. (2001). Energy dispersion of X-ray continua in the energy range 8 keV to 16 keV by refraction on Si wafers. Spectrochimica Acta Part B Atomic Spectroscopy. 56(11). 2045–2048. 1 indexed citations

Ebel, H.. (1999). X-ray tube spectra. X-Ray Spectrometry. 28(4). 255–266. 76 indexed citations

Ebel, H., Robert Svagera, & Maria F. Ebel. (1997). Surface analysis by TEY ? Theory and applications. Microchimica Acta. 125(1-4). 165–171. 1 indexed citations

Ebel, Maria F., et al.. (1995). Determination of thickness and composition of thin Al{sub x}Ga{sub 1-x}As layers on GaAs by total electron yield (TEY). Advances in X-ray Analysis. 38. 1 indexed citations

Svagera, Robert, et al.. (1995). Depth profiling by ARXPS in surface analysis. Analytical and Bioanalytical Chemistry. 353(3-4). 473–477. 1 indexed citations

Ebel, H., et al.. (1995). Determination of Thickness and Composition of Thin Al_xGa_1-xAs Films on GaAs substrates by Total Electron Yield (Tey) Measurements. Advances in X-ray Analysis. 39. 683–694. 1 indexed citations

Ebel, H., et al.. (1995). Quantitative surface analysis by total electron yield. Analytical and Bioanalytical Chemistry. 353(3-4). 348–350. 1 indexed citations

Ebel, H., et al.. (1995). Quantitative surface analysis by total electron yield. Analytical and Bioanalytical Chemistry. 353(3-4). 348–350. 3 indexed citations

10.

Ebel, H.. (1988). Crystallite Size Distributions from Intensities of Diffraction Spots. Powder Diffraction. 3(3). 168–171. 2 indexed citations

11.

Hanke, Wolfgang, H. Ebel, Maria F. Ebel, A. Jabłoński, & Kichinosuke Hirokawa. (1986). Quantitative XPS — multiline approach. Journal of Electron Spectroscopy and Related Phenomena. 40(3). 241–257. 47 indexed citations

12.

Wernisch, J., et al.. (1984). μ/ρ Algorithm valid for 1 keV ≤ E ≤ 50 keV and 11 ≤ Z ≤ 83. X-Ray Spectrometry. 13(4). 180–181. 19 indexed citations

13.

Jabłoński, A. & H. Ebel. (1984). Effects of elastic photoelectron collisions in quantitative XPS. Surface and Interface Analysis. 6(1). 21–28. 36 indexed citations

14.

Ebel, Maria F., et al.. (1983). Calibration of an X‐ray photoelectron spectrometer by means of noble metals. Surface and Interface Analysis. 5(4). 170–172. 4 indexed citations

15.

Mantler, Michael & H. Ebel. (1980). X‐ray fluorescence analysis without standards. X-Ray Spectrometry. 9(3). 146–149. 12 indexed citations

16.

Ebel, H., et al.. (1971). Die tertiäranregung in der quantitativen röntgenfluoreszenzanalyse. Spectrochimica Acta Part B Atomic Spectroscopy. 26(12). 761–766. 8 indexed citations

17.

Ebel, H., et al.. (1970). Röntgenabsorptiometrische Pulverkorngrößenbestimmung an feinkörnigen Pulverproben. International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde). 61(2). 156–159.

18.

Ebel, H., et al.. (1968). Notizen: Messungen der Dichte dünner Auf dampf schichten. Zeitschrift für Naturforschung A. 23(11). 1863–1864. 2 indexed citations

19.

Ebel, H., et al.. (1968). Zur Ermittlung der Teilchengröße dichtgeschütteter pulverförmiger Proben durch Röntgenfluoreszenzanalyse. Archiv für das Eisenhüttenwesen. 39(10). 755–757. 2 indexed citations

20.

Ebel, H., et al.. (1966). Notizen:Dickenbestimmung ebener dünner Mehrfachschichten durch Röntgen-Fluoreszenz-analyse. Zeitschrift für Naturforschung A. 21(12). 2108–2109. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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