James M. Burkstrand

1.1k total citations
31 papers, 904 citations indexed

About

James M. Burkstrand is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering. According to data from OpenAlex, James M. Burkstrand has authored 31 papers receiving a total of 904 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Surfaces, Coatings and Films, 16 papers in Atomic and Molecular Physics, and Optics and 10 papers in Electrical and Electronic Engineering. Recurrent topics in James M. Burkstrand's work include Electron and X-Ray Spectroscopy Techniques (19 papers), Surface and Thin Film Phenomena (10 papers) and Advanced Chemical Physics Studies (8 papers). James M. Burkstrand is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (19 papers), Surface and Thin Film Phenomena (10 papers) and Advanced Chemical Physics Studies (8 papers). James M. Burkstrand collaborates with scholars based in United States and Japan. James M. Burkstrand's co-authors include Gary G. Tibbetts, J. C. Tracy, G. G. Kleiman, F. M. Propst, John W. Wilkins, J. F. Herbst, G. L. Eesley, F. J. Boerio, John W. Williams and Dave Edwards and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

James M. Burkstrand

30 papers receiving 849 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
James M. Burkstrand United States 18 367 355 344 332 133 31 904
J. L. Jordan United States 9 200 0.5× 487 1.4× 164 0.5× 386 1.2× 167 1.3× 11 836
R. J. Baird United States 20 529 1.4× 639 1.8× 370 1.1× 414 1.2× 89 0.7× 27 1.3k
Yusuke Mizokawa Japan 15 207 0.6× 530 1.5× 217 0.6× 614 1.8× 146 1.1× 49 996
C. B. Boothroyd United Kingdom 18 202 0.6× 556 1.6× 203 0.6× 301 0.9× 59 0.4× 40 1.0k
W. M. Lau Canada 23 268 0.7× 678 1.9× 346 1.0× 848 2.6× 180 1.4× 91 1.5k
J. Tóth Hungary 13 237 0.6× 358 1.0× 99 0.3× 356 1.1× 91 0.7× 31 786
S. Samarin Australia 19 268 0.7× 246 0.7× 628 1.8× 242 0.7× 116 0.9× 98 1.0k
J. Finster Germany 17 184 0.5× 485 1.4× 153 0.4× 414 1.2× 55 0.4× 28 847
P. B. Sewell Canada 15 187 0.5× 441 1.2× 146 0.4× 231 0.7× 58 0.4× 29 730
Y. Tamminga Netherlands 21 91 0.2× 569 1.6× 350 1.0× 977 2.9× 104 0.8× 51 1.3k

Countries citing papers authored by James M. Burkstrand

Since Specialization
Citations

This map shows the geographic impact of James M. Burkstrand's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James M. Burkstrand with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James M. Burkstrand more than expected).

Fields of papers citing papers by James M. Burkstrand

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by James M. Burkstrand. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James M. Burkstrand. The network helps show where James M. Burkstrand may publish in the future.

Co-authorship network of co-authors of James M. Burkstrand

This figure shows the co-authorship network connecting the top 25 collaborators of James M. Burkstrand. A scholar is included among the top collaborators of James M. Burkstrand based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with James M. Burkstrand. James M. Burkstrand is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ye, Jiping, et al.. (2005). High-Temperature Nanoindentation Measurement for Hardness and Modulus Evaluation of Low-k Films. MRS Proceedings. 863. 1 indexed citations
2.
Burkstrand, James M., et al.. (1983). Phase segregation of Cu in Al–Cu thin films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 1(2). 449–451. 6 indexed citations
3.
Boerio, F. J., John W. Williams, & James M. Burkstrand. (1983). The structure of films formed by γ-aminopropyltriethoxysilane adsorbed onto copper. Journal of Colloid and Interface Science. 91(2). 485–495. 25 indexed citations
4.
Burkstrand, James M.. (1982). ’’Hot’’ atom interactions with polymer surfaces. Journal of Vacuum Science and Technology. 21(1). 70–73. 9 indexed citations
5.
Burkstrand, James M.. (1982). Summary Abstract: Chemical interactions at polymer–metal interfaces and the correlation with adhesion. Journal of Vacuum Science and Technology. 20(3). 440–441. 32 indexed citations
6.
Herbst, J. F., James M. Burkstrand, & John W. Wilkins. (1980). Low-binding-energy satellites in rare-earth-metal3dspectra: An exception at Eu. Physical review. B, Condensed matter. 22(2). 531–533. 35 indexed citations
7.
Burkstrand, James M.. (1979). Substrate effects on the electronic structure of metal overlayers—an XPS study of polymer-metal interfaces. Physical review. B, Condensed matter. 20(12). 4853–4858. 34 indexed citations
8.
Burkstrand, James M.. (1979). Formation of metal–oxygen–polymer complexes on polystyrene with nickel and chromium. Journal of Vacuum Science and Technology. 16(4). 1072–1074. 20 indexed citations
9.
Burkstrand, James M.. (1979). Core-level spectra of chromium and nickel atoms on polystyrene. Journal of Applied Physics. 50(2). 1152–1153. 12 indexed citations
10.
Burkstrand, James M.. (1978). Abstract: An unusual surface complex of copper on polystyrene. Journal of Vacuum Science and Technology. 15(2). 658–658. 2 indexed citations
11.
Burkstrand, James M.. (1978). Unusual core level spectra of copper on polystyrene. Surface Science. 78(3). 513–517. 12 indexed citations
12.
Kleiman, G. G. & James M. Burkstrand. (1977). An objective approach for deriving surface structure: Application to Cu(100)/N. Solid State Communications. 21(1). 5–8. 13 indexed citations
13.
Tibbetts, Gary G., James M. Burkstrand, & J. C. Tracy. (1977). Electronic properties of adsorbed layers of nitrogen, oxygen, and sulfur on copper (100). Physical review. B, Solid state. 15(8). 3652–3660. 160 indexed citations
14.
Burkstrand, James M. & Gary G. Tibbetts. (1977). TheM4,5VVAuger spectra of silver surfaces: An analysis based on the self-convolution of measured photoelectron spectra. Physical review. B, Solid state. 15(12). 5481–5483. 17 indexed citations
15.
Burkstrand, James M., G. G. Kleiman, Gary G. Tibbetts, & J. C. Tracy. (1976). Study of the N–Cu(100) system. Journal of Vacuum Science and Technology. 13(1). 291–295. 66 indexed citations
16.
Kleiman, G. G. & James M. Burkstrand. (1975). Structure of Cu(100) from low energy electron diffraction. Surface Science. 50(2). 493–502. 18 indexed citations
17.
Burkstrand, James M. & G. G. Kleiman. (1974). Abstract: Structure of Cu(100) from LEED. Journal of Vacuum Science and Technology. 11(1). 192–192. 1 indexed citations
18.
Burkstrand, James M., et al.. (1974). Structure of Cu(100) from low energy electron diffraction. Surface Science. 46(1). 43–60. 24 indexed citations
19.
Burkstrand, James M.. (1973). A Rotatable Target Holder for a LEED Diffractometer. Review of Scientific Instruments. 44(6). 774–775. 5 indexed citations
20.
Burkstrand, James M. & F. M. Propst. (1972). Elastic and Inelastic Low-Energy Electron Diffraction (ELEED, ILEED) from an Al(100) Surface. Journal of Vacuum Science and Technology. 9(2). 731–737. 18 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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