R.L. Naone

1.2k total citations
34 papers, 914 citations indexed

About

R.L. Naone is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, R.L. Naone has authored 34 papers receiving a total of 914 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Electrical and Electronic Engineering, 23 papers in Atomic and Molecular Physics, and Optics and 5 papers in Materials Chemistry. Recurrent topics in R.L. Naone's work include Semiconductor Lasers and Optical Devices (29 papers), Photonic and Optical Devices (23 papers) and Semiconductor Quantum Structures and Devices (17 papers). R.L. Naone is often cited by papers focused on Semiconductor Lasers and Optical Devices (29 papers), Photonic and Optical Devices (23 papers) and Semiconductor Quantum Structures and Devices (17 papers). R.L. Naone collaborates with scholars based in United States, Sweden and Türkiye. R.L. Naone's co-authors include Erik A. Edelberg, Eray S. Aydil, L.A. Coldren, E.R. Hegblom, B.J. Thibeault, Michael G. Hall, John F. Klem, Philip D. Floyd, K.M. Geib and A. J. Fischer and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

R.L. Naone

30 papers receiving 861 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R.L. Naone United States 15 856 530 265 105 86 34 914
J. Oshinowo Germany 11 538 0.6× 768 1.4× 324 1.2× 106 1.0× 102 1.2× 26 822
R. J. Dalby United States 12 493 0.6× 465 0.9× 151 0.6× 33 0.3× 43 0.5× 21 562
R. Kaspi United States 13 475 0.6× 460 0.9× 148 0.6× 64 0.6× 47 0.5× 31 554
G. Saint‐Girons France 14 550 0.6× 506 1.0× 227 0.9× 86 0.8× 50 0.6× 43 654
P. Roentgen Switzerland 12 431 0.5× 467 0.9× 100 0.4× 65 0.6× 95 1.1× 37 570
J. C. P. Chang United States 14 378 0.4× 444 0.8× 163 0.6× 47 0.4× 52 0.6× 28 512
M. Hovinen United States 11 399 0.5× 388 0.7× 149 0.6× 31 0.3× 65 0.8× 30 453
T. Katsuyama Japan 13 433 0.5× 352 0.7× 84 0.3× 48 0.5× 42 0.5× 44 492
L. A. Koszi United States 15 564 0.7× 431 0.8× 91 0.3× 44 0.4× 43 0.5× 38 640
Byung-Doo Choe South Korea 14 437 0.5× 432 0.8× 209 0.8× 56 0.5× 94 1.1× 52 559

Countries citing papers authored by R.L. Naone

Since Specialization
Citations

This map shows the geographic impact of R.L. Naone's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.L. Naone with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.L. Naone more than expected).

Fields of papers citing papers by R.L. Naone

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.L. Naone. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.L. Naone. The network helps show where R.L. Naone may publish in the future.

Co-authorship network of co-authors of R.L. Naone

This figure shows the co-authorship network connecting the top 25 collaborators of R.L. Naone. A scholar is included among the top collaborators of R.L. Naone based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.L. Naone. R.L. Naone is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Naone, R.L., et al.. (2004). Reliability evaluation of 1.3 micron, oxide-apertured, InGaAsN, VCSELs. 1. 404–405. 2 indexed citations
2.
Naone, R.L., L. M. F. Chirovsky, W. Andrew Jackson, et al.. (2003). Commercialization of 1.3 micron VCSELs for metro area network applications. TuH2–31. 2 indexed citations
3.
Klem, John F., Kent D. Choquette, A. J. Fischer, et al.. (2002). 1.3 μm InGaAsN quantum well vertical cavity surface emitting lasers on GaAs substrates. 1. 127–128.
4.
Hegblom, E.R., R.L. Naone, N.M. Margalit, & L.A. Coldren. (2002). Comparison of tapered apertures in vertical cavity lasers. 2. 350–351.
5.
Kurtz, S. R., R. M. Sieg, Andrew A. Allerman, Kent D. Choquette, & R.L. Naone. (2001). MOCVD-grown 1.3-μm InGaAsN multiple quantum well lasers incorporating GaAsP strain-compensation layers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4287. 170–170. 2 indexed citations
6.
Klem, John F., A. J. Fischer, O. Blum, et al.. (2000). Room temperature continuous wave InGaAsN quantumwellvertical-cavity lasers emitting at 1.3 µm. Electronics Letters. 36(16). 1388–1390. 190 indexed citations
7.
Naone, R.L., et al.. (2000). Lateral carrier confinement in miniature lasers using quantum dots. IEEE Journal of Selected Topics in Quantum Electronics. 6(3). 504–510. 21 indexed citations
8.
Hall, E., et al.. (2000). Increased lateral oxidation rates of AllnAs on InP using short-period superlattices. Journal of Electronic Materials. 29(9). 1100–1104. 8 indexed citations
9.
Strand, T., et al.. (1999). Design parameters for lateral carrier confinement in quantum-dot lasers. Applied Physics Letters. 74(19). 2752–2754. 32 indexed citations
10.
Bek, Alpan, Atilla Aydınlı, James G. Champlain, R.L. Naone, & Nadir Dagli. (1999). A study of wet oxidized Al/sub x/Ga/sub 1-x/As for integrated optics. IEEE Photonics Technology Letters. 11(4). 436–438. 9 indexed citations
11.
Naone, R.L., et al.. (1999). Tapered-apertures for high-efficiency miniature VCSELs. III17–III18. 3 indexed citations
12.
Hall, E., et al.. (1998). Operational experience with a valved antimony cracker source for use in molecular beam epitaxy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(5). 2660–2664. 15 indexed citations
13.
Edelberg, Erik A., et al.. (1997). Luminescence from plasma deposited silicon films. Journal of Applied Physics. 81(5). 2410–2417. 80 indexed citations
14.
Naone, R.L., E.R. Hegblom, B.J. Thibeault, & L.A. Coldren. (1997). Oxidation of AlGaAs layers for tapered aperturesin vertical-cavity lasers. Electronics Letters. 33(4). 300–301. 23 indexed citations
15.
Thibeault, B.J., E.R. Hegblom, Yuliya Akulova, et al.. (1997). <title>Electrical and optical losses in dielectrically apertured vertical-cavity lasers</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3003. 86–99. 6 indexed citations
16.
Hegblom, E.R., B.J. Thibeault, R.L. Naone, & L.A. Coldren. (1997). Vertical cavity lasers with tapered oxide aperturesfor low scattering loss. Electronics Letters. 33(10). 869–871. 14 indexed citations
17.
Naone, R.L. & L.A. Coldren. (1997). Surface energy model for the thickness dependence of the lateral oxidation of AlAs. Journal of Applied Physics. 82(5). 2277–2280. 36 indexed citations
18.
Strand, T., R.L. Naone, L.A. Coldren, & Evelyn L. Hu. (1996). Formation of GaAs quantum well islands by thermal desorption using an AlAs mask. Surface Science. 359(1-3). L456–L460. 3 indexed citations
19.
Thibeault, B.J., E.R. Hegblom, Philip D. Floyd, et al.. (1996). Reduced optical scattering loss in vertical-cavity lasers using a thin (300 /spl Aring/) oxide aperture. IEEE Photonics Technology Letters. 8(5). 593–595. 58 indexed citations
20.
Margalit, N.M., D.I. Babic, K. Streubel, et al.. (1996). Submilliamp long wavelength vertical cavity lasers. Electronics Letters. 32(18). 1675–1677. 51 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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