R.H. Richter
- Radiation top 5%
- Radiation Detection and Scintillator Technologies 10
- Nuclear Physics and Applications 2
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- Particle Detector Development and Performance 15
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- CCD and CMOS Imaging Sensors 8
- Semiconductor materials and devices 2
- Advanced Semiconductor Detectors and Materials 1
- Thin-Film Transistor Technologies 1
- Plasma Diagnostics and Applications 1
R.H. Richter
18 papers receiving 311 citations
Peers
Comparison fields: 5 of 27
- Radiation 213
- Nuclear and High Energy Physics 276
- Electrical and Electronic Engineering 227
- Instrumentation 13
- Radiology, Nuclear Medicine and Imaging 20
Countries citing papers authored by R.H. Richter
This map shows the geographic impact of R.H. Richter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.H. Richter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.H. Richter more than expected).
Fields of papers citing papers by R.H. Richter
This network shows the impact of papers produced by R.H. Richter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.H. Richter. The network helps show where R.H. Richter may publish in the future.
Co-authorship network
The 25 scholars most cited alongside R.H. Richter, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 3 | |
| 2 | 2010 | 29 | |
| 3 | 2008 | 16 | |
| 4 | 2007 | 16 | |
| 5 | 2006 | 5 | |
| 6 | 2006 | 8 | |
| 7 | 2006 | 25 | |
| 8 | 2005 | 17 | |
| 9 | 2005 | 1 | |
| 10 | 2004 | 57 | |
| 11 | 2003 | 4 | |
| 12 | 2003 | 46 | |
| 13 | 2003 | 14 | |
| 14 | Imaging Spectrometers for Future X-ray Missions | 2001 | 1 |
| 15 | 2000 | 13 | |
| 16 | 1999 | 14 | |
| 17 | 1998 | 7 | |
| 18 | 1993 | 52 |
About R.H. Richter
R.H. Richter is a scholar working on Radiation, Nuclear and High Energy Physics, Instrumentation, Electrical and Electronic Engineering and Spectroscopy, having authored 18 papers that have together received 328 indexed citations. Recurring topics across this work include Particle Detector Development and Performance (15 papers), Radiation Detection and Scintillator Technologies (10 papers), CCD and CMOS Imaging Sensors (8 papers), Nuclear Physics and Applications (2 papers), Semiconductor materials and devices (2 papers), Advanced Semiconductor Detectors and Materials (1 paper), Thin-Film Transistor Technologies (1 paper) and Plasma Diagnostics and Applications (1 paper). The work is most often cited by research in Radiation (213 citations), Nuclear and High Energy Physics (276 citations), Electrical and Electronic Engineering (227 citations), Instrumentation (13 citations) and Radiology, Nuclear Medicine and Imaging (20 citations). R.H. Richter has collaborated with scholars based in Germany, Switzerland and Italy. Frequent co-authors include G. Lutz, L. Andricek, Manfred Reiche, L. Strüder, P. Lechner, D. Hauff, M. Trimpl, N. Wermes, H. Soltau and J. Kemmer. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, IEEE Transactions on Nuclear Science, Surface and Coatings Technology, Max Planck Institute for Plasma Physics and ARCA (Università Ca' Foscari Venezia).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.