R.G. Yaccarino
- Electrical and Electronic Engineering top 10%
- Aerospace Engineering top 5%
- Biomedical Engineering
- Ocean Engineering top 10%
- Atomic and Molecular Physics, and Optics
- Topics
- Electromagnetic Compatibility and Measurements (17 papers)Antenna Design and Optimization (11 papers)Electromagnetic Compatibility and Noise Suppression (6 papers)
- Journals
- IEEE Transactions on Antennas and PropagationIEEE Antennas and Propagation MagazineInternational Journal of Imaging Systems and Technology
- Partner nations
- United StatesSpain
In The Last Decade
R.G. Yaccarino
16 papers receiving 366 citations
Peers
Comparison fields: 5 of 22
- Electrical and Electronic Engineering 374
- Aerospace Engineering 250
- Biomedical Engineering 67
- Ocean Engineering 49
- Atomic and Molecular Physics, and Optics 29
Countries citing papers authored by R.G. Yaccarino
This map shows the geographic impact of R.G. Yaccarino's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.G. Yaccarino with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.G. Yaccarino more than expected).
Fields of papers citing papers by R.G. Yaccarino
This network shows the impact of papers produced by R.G. Yaccarino. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.G. Yaccarino. The network helps show where R.G. Yaccarino may publish in the future.
Co-authorship network of co-authors of R.G. Yaccarino
This figure shows the co-authorship network connecting the top 25 collaborators of R.G. Yaccarino. A scholar is included among the top collaborators of R.G. Yaccarino based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.G. Yaccarino. R.G. Yaccarino is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 5 | |
| 5 | 4 | |
| 6 | 5 | |
| 7 | 4 | |
| 8 | 1 | |
| 9 | 140 | |
| 10 | 2 | |
| 11 | 9 | |
| 12 | 56 | |
| 13 | 79 | |
| 14 | 42 | |
| 15 | 44 | |
| 16 | The bi-polar planar near-field measurement and diagnostic facility | 1 |
| 17 | 1 | |
| 18 | 2 |
About R.G. Yaccarino
R.G. Yaccarino is a scholar working on Aerospace Engineering, Electrical and Electronic Engineering and Signal Processing, having authored 18 papers that have together received 399 indexed citations. Recurring topics across this work include Electromagnetic Compatibility and Measurements (17 papers), Antenna Design and Optimization (11 papers) and Electromagnetic Compatibility and Noise Suppression (6 papers). The work is most often cited by research in Aerospace Engineering (250 citations), Electrical and Electronic Engineering (374 citations) and Ocean Engineering (49 citations). R.G. Yaccarino has collaborated with scholars based in United States and Spain. Frequent co-authors include Yahya Rahmat‐Samii, Y. Rahmat–Samii, S.R. Rengarajan, J. Romeu, S. Blanch and K.L. Virga. Their work appears in journals such as IEEE Transactions on Antennas and Propagation, IEEE Antennas and Propagation Magazine and International Journal of Imaging Systems and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.