J. Silcox

12.6k total citations · 1 hit paper
176 papers, 9.3k citations indexed

About

J. Silcox is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, J. Silcox has authored 176 papers receiving a total of 9.3k indexed citations (citations by other indexed papers that have themselves been cited), including 74 papers in Electrical and Electronic Engineering, 63 papers in Atomic and Molecular Physics, and Optics and 61 papers in Surfaces, Coatings and Films. Recurrent topics in J. Silcox's work include Electron and X-Ray Spectroscopy Techniques (60 papers), Advanced Electron Microscopy Techniques and Applications (38 papers) and Semiconductor materials and devices (29 papers). J. Silcox is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (60 papers), Advanced Electron Microscopy Techniques and Applications (38 papers) and Semiconductor materials and devices (29 papers). J. Silcox collaborates with scholars based in United States, United Kingdom and Germany. J. Silcox's co-authors include David A. Muller, Russell F. Loane, P. B. Hirsch, K. Andre Mkhoyan, Sean Hillyard, Earl J. Kirkland, Derek A. Stewart, Cecilia Mattevi, Goki Eda and Manish Chhowalla and has published in prestigious journals such as Nature, Science and Physical Review Letters.

In The Last Decade

J. Silcox

170 papers receiving 8.8k citations

Hit Papers

Atomic and Electronic Structure of Graphene-Oxide 2009 2026 2014 2020 2009 250 500 750 1000

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Silcox United States 47 4.4k 3.3k 2.4k 2.1k 1.8k 176 9.3k
K. Urban Germany 55 8.4k 1.9× 3.2k 0.9× 2.8k 1.2× 1.8k 0.9× 2.0k 1.1× 420 13.3k
A. Howie United Kingdom 43 2.4k 0.5× 1.8k 0.5× 1.8k 0.8× 2.3k 1.1× 1.5k 0.8× 138 6.3k
S. Y. Tong United States 50 3.9k 0.9× 2.8k 0.8× 5.2k 2.1× 2.8k 1.4× 939 0.5× 309 9.8k
K. Heinz Germany 49 4.0k 0.9× 2.2k 0.7× 5.5k 2.3× 1.5k 0.7× 499 0.3× 253 9.0k
Johan Verbeeck Belgium 55 6.5k 1.5× 4.7k 1.4× 3.2k 1.3× 1.5k 0.7× 1.9k 1.1× 337 13.0k
Peter Ercius United States 50 5.4k 1.2× 2.6k 0.8× 1.4k 0.6× 1.7k 0.8× 2.2k 1.3× 224 9.8k
Ondrej L. Krivanek United States 42 3.4k 0.8× 2.7k 0.8× 2.0k 0.8× 3.6k 1.8× 3.8k 2.1× 147 8.3k
Koji Kimoto Japan 42 4.3k 1.0× 2.6k 0.8× 3.3k 1.4× 922 0.4× 876 0.5× 267 9.2k
Sandra Van Aert Belgium 43 4.3k 1.0× 2.1k 0.6× 1.4k 0.6× 1.9k 0.9× 2.1k 1.2× 166 7.2k
Angus I. Kirkland United Kingdom 55 6.1k 1.4× 3.0k 0.9× 1.1k 0.5× 1.6k 0.8× 2.0k 1.1× 283 10.1k

Countries citing papers authored by J. Silcox

Since Specialization
Citations

This map shows the geographic impact of J. Silcox's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Silcox with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Silcox more than expected).

Fields of papers citing papers by J. Silcox

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Silcox. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Silcox. The network helps show where J. Silcox may publish in the future.

Co-authorship network of co-authors of J. Silcox

This figure shows the co-authorship network connecting the top 25 collaborators of J. Silcox. A scholar is included among the top collaborators of J. Silcox based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Silcox. J. Silcox is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Mkhoyan, K. Andre, S. Maccagnano, E.J. Kirkland, & J. Silcox. (2008). Effects of amorphous layers on ADF-STEM imaging. Ultramicroscopy. 108(8). 791–803. 45 indexed citations
2.
Mkhoyan, K. Andre, Philip E. Batson, Judy Cha, W. J. Schaff, & J. Silcox. (2007). Direct Determination of Local Lattice Polarity in Crystals. Microscopy and Microanalysis. 13(S02). 2 indexed citations
3.
Jiang, Nan & J. Silcox. (2000). Observations of reaction zones at chromium/oxide glass interfaces. Journal of Applied Physics. 87(8). 3768–3776. 25 indexed citations
4.
Silcox, J., et al.. (2000). Annular dark-field image simulation of the YBa2Cu3O7−δ/BaF2 interface. Ultramicroscopy. 84(1-2). 65–74. 5 indexed citations
5.
Weiss, Charles, et al.. (1999). Scanning transmission electron microscopy studies of the microstructure and chemistry of the YBa2Cu3O7−/BaF2 interface. Micron. 30(5). 437–447. 2 indexed citations
6.
Jiang, Nan & J. Silcox. (1999). Interfacial Interaction Between Cr Thin Films and Oxide Glasses. MRS Proceedings. 589. 2 indexed citations
7.
Deshmukh, Mandar M., et al.. (1999). Nanofabrication using a stencil mask. Applied Physics Letters. 75(11). 1631–1633. 159 indexed citations
8.
Muller, David A., et al.. (1997). Chemistry and Bonding at {222}Mgo/Cu Heterophase Interfaces. Microscopy and Microanalysis. 3(S2). 647–648. 1 indexed citations
9.
Muller, David A., et al.. (1997). Detailed Calculations of Thermal Diffuse Scattering. Microscopy and Microanalysis. 3(S2). 1153–1154. 3 indexed citations
10.
Subramanian, Shanthi, David A. Muller, J. Silcox, & S.L. Sass. (1997). The role of chemistry in controlling the bonding and fracture properties of grain boundaries in L12 intermetallic compounds. Materials Science and Engineering A. 239-240. 297–308. 10 indexed citations
11.
Muller, David A. & J. Silcox. (1995). Radiation damage of Ni3Al by 100 keV electrons. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 71(6). 1375–1387. 42 indexed citations
12.
Hung, L. S., et al.. (1992). Limitations on the critical current density in Bi2Sr2CaCu2O8 films grown on MgO(001) by metalorganic deposition. Journal of Applied Physics. 71(5). 2356–2362. 6 indexed citations
13.
Loane, Russell F., et al.. (1988). Visibility of single heavy atoms on thin crystalline silicon in simulated annular dark-field STEM images. Acta Crystallographica Section A Foundations of Crystallography. 44(6). 912–927. 148 indexed citations
14.
Kirkland, Earl J., Russell F. Loane, & J. Silcox. (1987). Simulation of annular dark field stem images using a modified multislice method. Ultramicroscopy. 23(1). 77–96. 284 indexed citations
15.
Fernandez, A., et al.. (1987). Nickel Silicide Structures on Single-Crystal Silicon Membranes. MRS Proceedings. 102. 1 indexed citations
16.
Silcox, J.. (1978). Inelastic Electron-Matter Interactions. Proceedings annual meeting Electron Microscopy Society of America. 36(3). 259–267. 1 indexed citations
17.
Silcox, J., et al.. (1974). Oxide structure in evaporated aluminum films. Journal of Applied Physics. 45(7). 2858–2866. 15 indexed citations
18.
Schwerer, F. C. & J. Silcox. (1972). Electrical resistivity due to dislocations in nickel at low temperatures. Philosophical magazine. 26(5). 1105–1119. 9 indexed citations
19.
Geiss, Roy H. & J. Silcox. (1968). Effect of Dislocation Distribution on the Coercivity of Nickel Single Crystals. Journal of Applied Physics. 39(2). 982–983. 13 indexed citations
20.
Silcox, J. & P. B. Hirsch. (1959). Direct observations of defects in quenched gold. Philosophical magazine. 4(37). 72–89. 356 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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