R. W. Yanka

640 total citations
27 papers, 484 citations indexed

About

R. W. Yanka is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, R. W. Yanka has authored 27 papers receiving a total of 484 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 16 papers in Atomic and Molecular Physics, and Optics and 9 papers in Materials Chemistry. Recurrent topics in R. W. Yanka's work include Advanced Semiconductor Detectors and Materials (21 papers), Semiconductor Quantum Structures and Devices (15 papers) and Chalcogenide Semiconductor Thin Films (14 papers). R. W. Yanka is often cited by papers focused on Advanced Semiconductor Detectors and Materials (21 papers), Semiconductor Quantum Structures and Devices (15 papers) and Chalcogenide Semiconductor Thin Films (14 papers). R. W. Yanka collaborates with scholars based in United States, United Kingdom and Israel. R. W. Yanka's co-authors include J. F. Schetzina, R. N. Bicknell, K. A. Harris, T. H. Myers, N. C. Giles‐Taylor, Eric L. Buckland, D. K. Blanks, N. C. Giles, T. J. Magee and A. R. Reisinger and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

R. W. Yanka

26 papers receiving 462 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. W. Yanka United States 13 419 322 181 43 41 27 484
C. Maissen Switzerland 11 342 0.8× 214 0.7× 281 1.6× 35 0.8× 27 0.7× 29 434
P. Kightley United Kingdom 12 282 0.7× 249 0.8× 107 0.6× 46 1.1× 48 1.2× 16 342
R. Kaspi United States 13 475 1.1× 460 1.4× 148 0.8× 64 1.5× 47 1.1× 31 554
J. K. Furdyna United States 12 344 0.8× 347 1.1× 278 1.5× 43 1.0× 45 1.1× 42 505
J. P. Salerno United States 13 394 0.9× 420 1.3× 92 0.5× 56 1.3× 85 2.1× 31 528
M. J. Cherng United States 8 479 1.1× 516 1.6× 170 0.9× 73 1.7× 58 1.4× 8 615
T. Katsuyama Japan 13 433 1.0× 352 1.1× 84 0.5× 48 1.1× 42 1.0× 44 492
Y. C. Lo United States 12 501 1.2× 437 1.4× 163 0.9× 36 0.8× 19 0.5× 18 556
Tsuyoshi Kotani Japan 13 392 0.9× 382 1.2× 89 0.5× 40 0.9× 34 0.8× 30 464
R. E. Kremer United States 9 256 0.6× 222 0.7× 129 0.7× 18 0.4× 66 1.6× 20 358

Countries citing papers authored by R. W. Yanka

Since Specialization
Citations

This map shows the geographic impact of R. W. Yanka's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. W. Yanka with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. W. Yanka more than expected).

Fields of papers citing papers by R. W. Yanka

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. W. Yanka. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. W. Yanka. The network helps show where R. W. Yanka may publish in the future.

Co-authorship network of co-authors of R. W. Yanka

This figure shows the co-authorship network connecting the top 25 collaborators of R. W. Yanka. A scholar is included among the top collaborators of R. W. Yanka based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. W. Yanka. R. W. Yanka is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gębski, Marcin, et al.. (2020). Baseline 1300 nm dilute nitride VCSELs. OSA Continuum. 3(7). 1952–1952. 16 indexed citations
2.
Dargis, Rytis, Andrew Clark, Azadeh Ansari, et al.. (2020). Single‐Crystal Multilayer Nitride, Metal, and Oxide Structures on Engineered Silicon for New‐Generation Radio Frequency Filter Applications. physica status solidi (a). 217(7). 32 indexed citations
3.
Barratt, C., et al.. (2007). Development and Ramping of pHEMT in an "HBT Fab". 1 indexed citations
4.
5.
Eastman, L.F., et al.. (1997). Narrow-channel GaInP/InGaAs/GaAs MODFETs for high-frequency and power applications. IEEE Transactions on Electron Devices. 44(9). 1341–1348. 13 indexed citations
6.
Myers, T. H., et al.. (1995). Scanning tunneling microscopy of etched HgTe/CdTe superlattices. Applied Physics Letters. 66(2). 224–226. 7 indexed citations
7.
Yu, Zhonghai, T. H. Myers, K. A. Harris, et al.. (1995). Reflectance and photoreflectance for in-situ monitoring of the molecular beam epitaxial growth of CdTe and Hg-based materials. Journal of Electronic Materials. 24(5). 685–690. 2 indexed citations
8.
Meyer, J. R., K. A. Harris, R. W. Yanka, et al.. (1995). Investigation of monolayer roughness in HgTe-CdTe superlattices. Journal of Electronic Materials. 24(5). 707–712. 2 indexed citations
9.
Harris, K. A., et al.. (1995). Electron cyclotron resonance plasma etching of HgTe-CdTe superlattices grown by photo-assisted molecular beam epitaxy. Journal of Electronic Materials. 24(9). 1201–1206. 6 indexed citations
10.
Meyer, J. R., et al.. (1994). Photoluminescence study of HgTe-Hg0.9Cd0.1Te superlattices. Journal of Crystal Growth. 138(1-4). 981–987. 5 indexed citations
11.
Meyer, J. R., et al.. (1994). Monolayer thickness fluctuations in infrared photoluminescence for [211]-oriented HgTe-CdTe superlattices. Applied Physics Letters. 64(5). 545–547. 6 indexed citations
12.
Lo, Ikai, W. C. Mitchel, K. A. Harris, et al.. (1993). Wannier–Stark quantization by internal field in the HgTe/CdTe superlattice. Applied Physics Letters. 62(13). 1533–1535. 6 indexed citations
13.
Reisinger, A. R., et al.. (1992). Carrier lifetime in HgTe/CdTe superlattices grown by photoassisted molecular beam epitaxy. Applied Physics Letters. 61(6). 699–701. 13 indexed citations
14.
Myers, T. H., et al.. (1992). Dopant diffusion in HgCdTe grown by photon assisted molecular-beam epitaxy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(4). 1438–1443. 26 indexed citations
15.
Harris, K. A., R. W. Yanka, A. R. Reisinger, et al.. (1992). Properties of (211)B HgTe–CdTe superlattices grown by photon assisted molecular-beam epitaxy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(4). 1574–1581. 13 indexed citations
16.
Harris, K. A., et al.. (1990). Microstructural defect reduction in HgCdTe grown by photoassisted molecular-beam epitaxy. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(2). 1013–1019. 23 indexed citations
17.
Myers, T. H., R. W. Yanka, James P. Karins, et al.. (1986). Characterization of HgCdTe Epilayers and HgTe-CdTe Superlattice Structures Grown by Molecular Beam Epitaxy. MRS Proceedings. 90. 4 indexed citations
18.
Bicknell, R. N., N. C. Giles‐Taylor, D. K. Blanks, et al.. (1985). Properties of Cd1−xMnxTe–CdTe superlattices grown by molecular beam epitaxy. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 3(2). 709–713. 34 indexed citations
19.
Bicknell, R. N., N. C. Giles‐Taylor, R. W. Yanka, et al.. (1984). Summary Abstract: Growth of high quality (100)CdTe films on (100)GaAs substrates by molecular beam epitaxy. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 2(3). 417–418. 10 indexed citations
20.
Bicknell, R. N., R. W. Yanka, N. C. Giles‐Taylor, et al.. (1984). Cd1−xMnxTe-CdTe multilayers grown by molecular beam epitaxy. Applied Physics Letters. 45(1). 92–94. 91 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by C. Maissen Breakdown of academic impact, for papers by P. Kightley Breakdown of academic impact, for papers by R. Kaspi Breakdown of academic impact, for papers by J. K. Furdyna Breakdown of academic impact, for papers by J. P. Salerno Breakdown of academic impact, for papers by M. J. Cherng Breakdown of academic impact, for papers by T. Katsuyama Breakdown of academic impact, for papers by Y. C. Lo Breakdown of academic impact, for papers by Tsuyoshi Kotani Breakdown of academic impact, for papers by R. E. Kremer
Rankless by CCL
2026