R. W. Cheary

3.3k total citations · 2 hit papers
40 papers, 2.8k citations indexed

About

R. W. Cheary is a scholar working on Materials Chemistry, Radiation and Mechanical Engineering. According to data from OpenAlex, R. W. Cheary has authored 40 papers receiving a total of 2.8k indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Materials Chemistry, 9 papers in Radiation and 9 papers in Mechanical Engineering. Recurrent topics in R. W. Cheary's work include X-ray Diffraction in Crystallography (19 papers), Nuclear materials and radiation effects (12 papers) and Crystal Structures and Properties (8 papers). R. W. Cheary is often cited by papers focused on X-ray Diffraction in Crystallography (19 papers), Nuclear materials and radiation effects (12 papers) and Crystal Structures and Properties (8 papers). R. W. Cheary collaborates with scholars based in Australia, United States and United Kingdom. R. W. Cheary's co-authors include Alan A. Coelho, James P. Cline, Katherine L. Smith, Svetlana Dligatch, N. W. Grimes, E. Dooryhée, Neal R. Armstrong, P. Swift, Patricia L. Watson and Rachel Thompson and has published in prestigious journals such as Journal of Materials Science, Applied Surface Science and Journal of Applied Crystallography.

In The Last Decade

R. W. Cheary

40 papers receiving 2.8k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

A fundamental parameters approach to X-ray line-profile fitting

1992 1.4k citations R. W. Cheary, Alan A. Coelho Journal of Applied Crystallography profile →
Fundamental parameters line profile fitting in laboratory diffractometers

2004 568 citations R. W. Cheary, Alan A. Coelho et al. Journal of Research of the National Institute of Standards and Technology profile →

Peers

R. W. Cheary

MC

EOMM

EEE

IC

CMP

H. De×pert France

N. Ishizawa Japan

P. Berthet France

P. Tasker United Kingdom

A. Rulmont Belgium

Barbara Albert Germany

C. J. Howard Australia

G. Miehe Germany

R. X. Fischer Germany

Yu. D. Tret’yakov Russia

H. De×pert France

R. W. Cheary

2.0k ×1.0

MC

423 ×0.8

EOMM

550 ×1.1

EEE

386 ×0.8

IC

224 ×0.7

CMP

Citations per year, relative to R. W. Cheary R. W. Cheary (= 1×) peers H. De×pert

Countries citing papers authored by R. W. Cheary

Since Specialization

Citations

This map shows the geographic impact of R. W. Cheary's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. W. Cheary with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. W. Cheary more than expected).

Fields of papers citing papers by R. W. Cheary

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. W. Cheary. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. W. Cheary. The network helps show where R. W. Cheary may publish in the future.

Co-authorship network of co-authors of R. W. Cheary

This figure shows the co-authorship network connecting the top 25 collaborators of R. W. Cheary. A scholar is included among the top collaborators of R. W. Cheary based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. W. Cheary. R. W. Cheary is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

1.

Tang, Chiu C., Peter A. Lynch, R. W. Cheary, & S. M. Clark. (2007). Anin situmethod for the study of strain broadening using synchrotron X-ray diffraction. Journal of Applied Crystallography. 40(4). 642–649. 6 indexed citations

2.

Cheary, R. W., et al.. (2005). X-ray reflectivity study of radio frequency sputtered silicon oxide on silicon. Thin Solid Films. 489(1-2). 37–41. 3 indexed citations

3.

Cheary, R. W., Alan A. Coelho, & James P. Cline. (2004). Fundamental parameters line profile fitting in laboratory diffractometers. Journal of Research of the National Institute of Standards and Technology. 109(1). 1–1. 568 indexed citations breakdown →

4.

Masson, Olivier, E. Dooryhée, R. W. Cheary, & Andrew N. Fitch. (2001). Instrumental Resolution Function of the ESRF Powder Diffraction Beamline BM16. Materials science forum. 378-381. 300–307. 10 indexed citations

5.

Cheary, R. W., et al.. (2000). Quantitative phase analysis by X-ray diffraction of martensite and austenite in strongly oriented orthodontic stainless steel wires. Journal of Materials Science. 35(5). 1105–1113. 19 indexed citations

6.

Cheary, R. W., et al.. (2000). Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy. Thin Solid Films. 372(1-2). 94–103. 16 indexed citations

7.

Cheary, R. W. & Alan A. Coelho. (1998). An experimental investigation of the effects of axial divergence on diffraction line profiles. Powder Diffraction. 13(2). 100–106. 8 indexed citations

8.

Cheary, R. W. & Alan A. Coelho. (1998). Axial Divergence in a Conventional X-ray Powder Diffractometer. II. Realization and Evaluation in a Fundamental-Parameter Profile Fitting Procedure. Journal of Applied Crystallography. 31(6). 862–868. 105 indexed citations

9.

Cheary, R. W. & Alan A. Coelho. (1998). Axial Divergence in a Conventional X-ray Powder Diffractometer. I. Theoretical Foundations. Journal of Applied Crystallography. 31(6). 851–861. 169 indexed citations

10.

Coelho, Alan A. & R. W. Cheary. (1997). A fast and simple method for calculating electrostatic potentials. Computer Physics Communications. 104(1-3). 15–22. 9 indexed citations

11.

Cheary, R. W., Rachel Thompson, & Patricia L. Watson. (1996). Characteristics of the Monoclinic-Tetragonal Transition and the Order-Disorder Transition in Barium Hollandites. Materials science forum. 228-231. 777–782. 12 indexed citations

12.

Cheary, R. W., et al.. (1995). Characterisation and Modelling of Peak Shifts in Conventional Powder Diffractometry. Advances in X-ray Analysis. 39. 579–587. 3 indexed citations

13.

Cheary, R. W.. (1992). Zirconolite CaZr0.92Ti2.08O7 from 294 to 1173 K. Journal of Solid State Chemistry. 98(2). 323–329. 17 indexed citations

14.

Cheary, R. W. & Alan A. Coelho. (1992). A fundamental parameters approach to X-ray line-profile fitting. Journal of Applied Crystallography. 25(2). 109–121. 1415 indexed citations breakdown →

15.

Cheary, R. W., et al.. (1989). A structural analysis of barium magnesium hollandites. Acta Crystallographica Section B Structural Science. 45(3). 205–212. 26 indexed citations

16.

Cheary, R. W.. (1988). The Immobilisation of Cesium in Synroc. Materials science forum. 27-28. 397–406. 18 indexed citations

17.

Cheary, R. W.. (1986). An analysis of the structural characteristics of hollandite compounds. Acta Crystallographica Section B Structural Science. 42(3). 229–236. 71 indexed citations

18.

Cheary, R. W., et al.. (1984). An X-ray structural analysis of cesium substitution in the barium hollandite phase of synroc. Journal of Nuclear Materials. 125(2). 236–243. 27 indexed citations

19.

Cheary, R. W. & N. W. Grimes. (1978). Investigation of antiphase domains in lithium ferrite by analysis of the broadened X-ray lines. Acta Crystallographica Section A. 34(1). 74–84. 12 indexed citations

20.

Cheary, R. W. & N. W. Grimes. (1972). The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines. Journal of Applied Crystallography. 5(2). 57–63. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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