R. R. Haering
- Electrical and Electronic Engineering top 2%
- Materials Chemistry top 5%
- Atomic and Molecular Physics, and Optics top 5%
- Electronic, Optical and Magnetic Materials top 5%
- Automotive Engineering top 5%
- Co-authors
- J. R. DahnM. PyKonrad ColbowW. R. McKinnonDouglas C. DahnJ. S. KirkaldyW. W. SmeltzerP. B. Miller
- Topics
- Chalcogenide Semiconductor Thin Films (10 papers)Solid-state spectroscopy and crystallography (8 papers)Quantum and electron transport phenomena (7 papers)
- Partner nations
- CanadaUnited StatesFrance
In The Last Decade
R. R. Haering
60 papers receiving 2.3k citations
Hit Papers
Peers
Comparison fields: 5 of 62
- Electrical and Electronic Engineering 1.5k
- Materials Chemistry 1.2k
- Atomic and Molecular Physics, and Optics 473
- Electronic, Optical and Magnetic Materials 397
- Automotive Engineering 299
Countries citing papers authored by R. R. Haering
This map shows the geographic impact of R. R. Haering's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. R. Haering with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. R. Haering more than expected).
Fields of papers citing papers by R. R. Haering
This network shows the impact of papers produced by R. R. Haering. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. R. Haering. The network helps show where R. R. Haering may publish in the future.
Co-authorship network of co-authors of R. R. Haering
This figure shows the co-authorship network connecting the top 25 collaborators of R. R. Haering. A scholar is included among the top collaborators of R. R. Haering based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. R. Haering. R. R. Haering is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 21 | |
| 3 | 95 | |
| 4 | 40 | |
| 5 | 56 | |
| 6 | 94 | |
| 7 | 18 | |
| 8 | 31 | |
| 9 | 4 | |
| 10 | 30 | |
| 11 | 1 | |
| 12 | 16 | |
| 13 | 2 | |
| 14 | 42 | |
| 15 | 2 | |
| 16 | 11 | |
| 17 | 20 | |
| 18 | 31 | |
| 19 | 6 | |
| 20 | 37 |
About R. R. Haering
R. R. Haering is a scholar working on Acoustics and Ultrasonics, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 64 papers that have together received 2.4k indexed citations. Recurring topics across this work include Chalcogenide Semiconductor Thin Films (10 papers), Solid-state spectroscopy and crystallography (8 papers) and Quantum and electron transport phenomena (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.5k citations), Materials Chemistry (1.2k citations) and Automotive Engineering (299 citations). R. R. Haering has collaborated with scholars based in Canada, United States and France. Frequent co-authors include J. R. Dahn, M. Py, Konrad Colbow, W. R. McKinnon, Douglas C. Dahn, J. S. Kirkaldy, W. W. Smeltzer, P. B. Miller, A. J. Berlinsky and W. G. Unruh. Their work appears in journals such as Physical Review Letters, Physical review. B, Condensed matter and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.