R. A. Lux

886 total citations
40 papers, 720 citations indexed

About

R. A. Lux is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, R. A. Lux has authored 40 papers receiving a total of 720 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Electrical and Electronic Engineering, 16 papers in Atomic and Molecular Physics, and Optics and 12 papers in Materials Chemistry. Recurrent topics in R. A. Lux's work include Semiconductor materials and devices (18 papers), Silicon Nanostructures and Photoluminescence (9 papers) and Semiconductor Quantum Structures and Devices (8 papers). R. A. Lux is often cited by papers focused on Semiconductor materials and devices (18 papers), Silicon Nanostructures and Photoluminescence (9 papers) and Semiconductor Quantum Structures and Devices (8 papers). R. A. Lux collaborates with scholars based in United States, Germany and Canada. R. A. Lux's co-authors include James Harvey, Raphael Tsu, D. W. Eckart, M. W. Cole, Geoffrey F. Davies, John H. Thomas, Mitra Dutta, H. Shen, Edward H. Poindexter and M.H. Weichold and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

R. A. Lux

37 papers receiving 664 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. A. Lux United States 18 515 317 271 161 61 40 720
Igor Kudryashov United States 14 374 0.7× 259 0.8× 311 1.1× 90 0.6× 75 1.2× 56 662
A. R. Moore United States 14 826 1.6× 504 1.6× 533 2.0× 131 0.8× 31 0.5× 36 1.1k
T. R. Hart United States 6 271 0.5× 317 1.0× 191 0.7× 152 0.9× 46 0.8× 13 564
A. Desalvo Italy 17 510 1.0× 429 1.4× 141 0.5× 95 0.6× 146 2.4× 72 796
K. Scheerschmidt Germany 15 468 0.9× 284 0.9× 395 1.5× 142 0.9× 19 0.3× 63 777
J. Pastrňák Czechia 12 275 0.5× 269 0.8× 209 0.8× 210 1.3× 28 0.5× 57 644
Carl F. Buhrer Israel 13 394 0.8× 390 1.2× 252 0.9× 220 1.4× 19 0.3× 28 768
R. Carey United Kingdom 12 200 0.4× 156 0.5× 491 1.8× 134 0.8× 26 0.4× 83 721
E. Arnold United States 18 1.1k 2.1× 233 0.7× 343 1.3× 54 0.3× 34 0.6× 61 1.3k
V.A. Kudryashov Russia 10 163 0.3× 75 0.2× 119 0.4× 171 1.1× 50 0.8× 46 472

Countries citing papers authored by R. A. Lux

Since Specialization
Citations

This map shows the geographic impact of R. A. Lux's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. A. Lux with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. A. Lux more than expected).

Fields of papers citing papers by R. A. Lux

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. A. Lux. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. A. Lux. The network helps show where R. A. Lux may publish in the future.

Co-authorship network of co-authors of R. A. Lux

This figure shows the co-authorship network connecting the top 25 collaborators of R. A. Lux. A scholar is included among the top collaborators of R. A. Lux based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. A. Lux. R. A. Lux is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Heinrich, Andreas, et al.. (2006). Pulsed Laser Deposition and Growth Studies of Bi3Fe5O12 on Gd3Ga5O12 and SiO2. Journal of the Magnetics Society of Japan. 30(6−2). 584–587. 6 indexed citations
2.
Lux, R. A., et al.. (2006). Pulsed-laser deposition and growth studies of Bi3Fe5O12 thin films. Journal of Applied Physics. 100(11). 22 indexed citations
3.
Heinrich, Andreas, et al.. (2004). Influence of oxygen pressure, temperature and substrate/target distance on Cu2Ta4O12 thin films prepared by pulsed-laser deposition. Thin Solid Films. 479(1-2). 12–16. 10 indexed citations
4.
Woolard, Dwight, et al.. (1996). On the different physical roles of hysteresis and intrinsic oscillations in resonant tunneling structures. Journal of Applied Physics. 79(3). 1515–1525. 20 indexed citations
5.
Tsu, Raphael, L. Ioriatti, James Harvey, Haibo Shen, & R. A. Lux. (1992). Quantum Confinement Effects on the Dielectric Constant of Porous Silicon. MRS Proceedings. 283. 22 indexed citations
6.
Kalnitsky, A., et al.. (1990). Rechargeable E′ centers in silicon-implanted SiO2 films. Journal of Applied Physics. 67(12). 7359–7367. 28 indexed citations
7.
Weichold, M.H., et al.. (1989). Analysis of defect-assisted tunneling based on low frequency noise measurements of resonant tunnel diodes. Solid-State Electronics. 32(12). 1551–1555. 6 indexed citations
8.
Weichold, M.H., et al.. (1989). Low-frequency noise measurements on AlGaAs/GaAs resonant tunnel diodes. Applied Physics Letters. 55(19). 1969–1971. 7 indexed citations
9.
Lux, R. A., et al.. (1987). Hysteresis predicted in I–V curve of heterojunction resonant tunneling diodes simulated by a self-consistent quantum method. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 5(4). 967–970. 20 indexed citations
10.
Lux, R. A., et al.. (1986). Diboride diffusion barriers in silicon and GaAs technology. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 4(6). 1409–1415. 23 indexed citations
11.
Lux, R. A., et al.. (1985). TiB2 and ZrB2 diffusion barriers in GaAs Ohmic contact technology. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(6). 2255–2258. 46 indexed citations
12.
Scott, D. M., S.S. Lau, Robert Pfeffer, et al.. (1983). The Effects of Interfacial SiO2 on Pd2Si Formation. Thin Solid Films. 104(1-2). 227–233. 27 indexed citations
13.
Scott, D. M., et al.. (1982). The Effects of Interfacial SiO2 on Pd2Si Formation. MRS Proceedings. 18.
14.
Lux, R. A., et al.. (1981). An Efficient Integration Technique for Use in the Multilayer Analysis of Spreading Resistance Profiles. Journal of The Electrochemical Society. 128(5). 1137–1141. 38 indexed citations
15.
Lux, R. A., Geoffrey F. Davies, & John H. Thomas. (1979). Moving lithospheric plates and mantle convection. Geophysical Journal International. 58(1). 209–228. 57 indexed citations
16.
Lux, R. A., et al.. (1979). Errors in Resistivities Calculated by Multilayer Analysis of Spreading Resistances. Journal of The Electrochemical Society. 126(9). 1479–1482. 5 indexed citations
17.
Lux, R. A., et al.. (1974). Gamma ray induced charge buildup in insulators. IEEE Transactions on Nuclear Science. 21(6). 243–248. 3 indexed citations
18.
Maurer, R. D., et al.. (1973). Effect of Neutron- and Gamma-Radiation on Glass Optical Waveguides. Applied Optics. 12(9). 2024–2024. 27 indexed citations
19.
Lux, R. A., et al.. (1972). Anisotropic dose and its applications in directional radiation sensing.. Defense Technical Information Center (DTIC). 1 indexed citations
20.
Lux, R. A., et al.. (1971). Relative Biological Effectiveness of X-Rays Delivered at Very High Dose Rates to Radish Seeds (Raphanus sativus). Radiation Research. 47(3). 589–589. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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