P.C.T. van der Laan

51 papers receiving 446 citations

Peers

P.C.T. van der Laan
Comparison fields: 5 of 56
  • Electrical and Electronic Engineering 368
  • Materials Chemistry 171
  • Astronomy and Astrophysics 110
  • Radiology, Nuclear Medicine and Imaging 97
  • Control and Systems Engineering 65
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P. Domens France
A Gibert France
Jean Paillol France
N.L. Allen United Kingdom
Tamiya Fujiwara Japan
Tomas Hurtig Sweden
Olivier Ducasse France
M.P.J. Gaudreau United States
N. Wiegart Germany
Denis Packan France
P.C.T. van der Laan relative to P. Domens France P. Domens's profile →
Citations per field
00.5×1.5×
P. Domens · 1×
Citations per year

Countries citing papers authored by P.C.T. van der Laan

Since Specialization
Citations

This map shows the geographic impact of P.C.T. van der Laan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.C.T. van der Laan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.C.T. van der Laan more than expected).

Fields of papers citing papers by P.C.T. van der Laan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P.C.T. van der Laan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.C.T. van der Laan. The network helps show where P.C.T. van der Laan may publish in the future.

Co-authorship network of co-authors of P.C.T. van der Laan

This figure shows the co-authorship network connecting the top 25 collaborators of P.C.T. van der Laan. A scholar is included among the top collaborators of P.C.T. van der Laan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P.C.T. van der Laan. P.C.T. van der Laan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 3
2
Some cabling EMC issues inside the ITER cryostat
0
3 5
4
A novel electrical circuit for large pulsed power generation
1
5
Pulsed Corona for Sustainable Technology
1
6 60
7 1
8 7
9 8
10
A diagnostic toolbox for turbine generators
1
11
Coupling on a multilayer printed circuit board and the current distribution in the ground plane
3
12 3
13 2
14 5
15 8
16 1
17 3
18 4
19 2
20 16

About P.C.T. van der Laan

P.C.T. van der Laan is a scholar working on Astronomy and Astrophysics, Electrical and Electronic Engineering and Control and Systems Engineering, having authored 56 papers that have together received 476 indexed citations. Recurring topics across this work include Lightning and Electromagnetic Phenomena (15 papers), High voltage insulation and dielectric phenomena (12 papers) and Plasma Diagnostics and Applications (8 papers). The work is most often cited by research in Astronomy and Astrophysics (110 citations), Electrical and Electronic Engineering (368 citations) and Radiology, Nuclear Medicine and Imaging (97 citations). P.C.T. van der Laan has collaborated with scholars based in Netherlands, United States and Curacao. Frequent co-authors include A.J.M. Pemen, A.P.J. van Deursen, J.M. Wetzer, E.J.M. van Heesch, Peter J. de Jong, Keping Yan, M. G. Danikas, P.A.A.F. Wouters, A.A.M. Oomens and R. Woltjer. Their work appears in journals such as Journal of Applied Physics, Journal of Physics D Applied Physics and Review of Scientific Instruments.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026