Jean Paillol
- Electrical and Electronic Engineering top 10%
- Radiology, Nuclear Medicine and Imaging top 5%
- Materials Chemistry
- Astronomy and Astrophysics top 10%
- Atomic and Molecular Physics, and Optics
- Topics
- Plasma Applications and Diagnostics (12 papers)Plasma Diagnostics and Applications (12 papers)High voltage insulation and dielectric phenomena (11 papers)
- Cited by
- Radiology, Nuclear Medicine and ImagingElectrical and Electronic EngineeringAstronomy and Astrophysics
In The Last Decade
Jean Paillol
36 papers receiving 623 citations
Peers
Comparison fields: 5 of 51
- Electrical and Electronic Engineering 516
- Radiology, Nuclear Medicine and Imaging 293
- Materials Chemistry 207
- Astronomy and Astrophysics 120
- Atomic and Molecular Physics, and Optics 112
Countries citing papers authored by Jean Paillol
This map shows the geographic impact of Jean Paillol's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jean Paillol with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jean Paillol more than expected).
Fields of papers citing papers by Jean Paillol
This network shows the impact of papers produced by Jean Paillol. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jean Paillol. The network helps show where Jean Paillol may publish in the future.
Co-authorship network of co-authors of Jean Paillol
This figure shows the co-authorship network connecting the top 25 collaborators of Jean Paillol. A scholar is included among the top collaborators of Jean Paillol based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jean Paillol. Jean Paillol is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 0 | |
| 3 | 19 | |
| 4 | 11 | |
| 5 | 7 | |
| 6 | 50 | |
| 7 | 11 | |
| 8 | 39 | |
| 9 | 2 | |
| 10 | 32 | |
| 11 | 84 | |
| 12 | 3 | |
| 13 | 32 | |
| 14 | 11 | |
| 15 | 35 | |
| 16 | 25 | |
| 17 | 10 | |
| 18 | 17 | |
| 19 | 3 | |
| 20 | 1 |
About Jean Paillol
Jean Paillol is a scholar working on Electrical and Electronic Engineering, Astronomy and Astrophysics and Radiology, Nuclear Medicine and Imaging, having authored 38 papers that have together received 657 indexed citations. Recurring topics across this work include Plasma Applications and Diagnostics (12 papers), Plasma Diagnostics and Applications (12 papers) and High voltage insulation and dielectric phenomena (11 papers). The work is most often cited by research in Radiology, Nuclear Medicine and Imaging (293 citations), Electrical and Electronic Engineering (516 citations) and Astronomy and Astrophysics (120 citations). Jean Paillol has collaborated with scholars based in France, Czechia and Slovakia. Frequent co-authors include Thierry Reess, F. Massines, David Bessières, P. Domens, P. Ségur, Anne Bourdon, E. Marode, A Gibert, Jean‐Luc Daridon and Mirko Černák. Their work appears in journals such as Journal of Applied Physics, Journal of Computational Physics and Journal of Physics D Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.