P. Jacob

1.5k total citations · 1 hit paper
24 papers, 795 citations indexed

About

P. Jacob is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Control and Systems Engineering. According to data from OpenAlex, P. Jacob has authored 24 papers receiving a total of 795 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Electrical and Electronic Engineering, 4 papers in Biomedical Engineering and 3 papers in Control and Systems Engineering. Recurrent topics in P. Jacob's work include Integrated Circuits and Semiconductor Failure Analysis (9 papers), Silicon Carbide Semiconductor Technologies (9 papers) and Electrostatic Discharge in Electronics (7 papers). P. Jacob is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (9 papers), Silicon Carbide Semiconductor Technologies (9 papers) and Electrostatic Discharge in Electronics (7 papers). P. Jacob collaborates with scholars based in Switzerland, China and United States. P. Jacob's co-authors include Martin Held, G. Nicoletti, Max Poech, Wuchen Wu, Alessandro Birolini, Zhengyuan Wang, Peter Corbett, Richard Hartley, P. Charvát and Yajie Wang and has published in prestigious journals such as SHILAP Revista de lepidopterología, Microelectronics Reliability and IEEE Transactions on Device and Materials Reliability.

In The Last Decade

P. Jacob

23 papers receiving 740 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Fast power cycling test of IGBT modules in traction application

2002 479 citations Martin Held, P. Jacob et al. profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
P. Jacob Switzerland	8	730	105	56	51	27	24	795
Pramod Ghimire Denmark	13	606 0.8×	109 1.0×	78 1.4×	41 0.8×	7 0.3×	25	649
Michel Mermet-Guyennet France	14	634 0.9×	115 1.1×	52 0.9×	36 0.7×	5 0.2×	39	680
G. Grellet France	8	343 0.5×	78 0.7×	201 3.6×	84 1.6×	15 0.6×	15	472
Guicui Fu China	10	286 0.4×	171 1.6×	39 0.7×	22 0.4×	72 2.7×	82	456
Hélder de Paula Brazil	13	527 0.7×	128 1.2×	163 2.9×	22 0.4×	13 0.5×	85	581
Hag-Wone Kim South Korea	12	691 0.9×	56 0.5×	304 5.4×	46 0.9×	12 0.4×	85	771
Rejeki Simanjorang Singapore	19	1.2k 1.6×	161 1.5×	180 3.2×	87 1.7×	11 0.4×	69	1.3k
Lin Xue China	9	191 0.3×	139 1.3×	30 0.5×	121 2.4×	19 0.7×	26	380
Xinzhen Wu China	14	445 0.6×	90 0.9×	250 4.5×	71 1.4×	24 0.9×	66	635
Ray P. Stratford United States	9	605 0.8×	62 0.6×	282 5.0×	40 0.8×	9 0.3×	15	638

Countries citing papers authored by P. Jacob

Since Specialization

Citations

This map shows the geographic impact of P. Jacob's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Jacob with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Jacob more than expected).

Fields of papers citing papers by P. Jacob

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Jacob. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Jacob. The network helps show where P. Jacob may publish in the future.

Co-authorship network of co-authors of P. Jacob

This figure shows the co-authorship network connecting the top 25 collaborators of P. Jacob. A scholar is included among the top collaborators of P. Jacob based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Jacob. P. Jacob is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Jacob, P., Shan Deng, Kai Ni, et al.. (2023). A Comparative Study of n- and p-Channel FeFETs with Ferroelectric HZO Gate Dielectric. SHILAP Revista de lepidopterología. 4(4). 356–367. 1 indexed citations

2.

Jacob, P., et al.. (2017). New ESD challenges in RFID manufacturing. Microelectronics Reliability. 76-77. 395–399. 4 indexed citations

3.

Jacob, P.. (2016). Failure mechanisms and precautions in plug connectors and relays. Microelectronics Reliability. 64. 693–698. 3 indexed citations

4.

Jacob, P.. (2016). Early life field failures in modern automotive electronics – An overview; root causes and precautions. Microelectronics Reliability. 64. 79–83. 1 indexed citations

5.

Jacob, P.. (2015). Failure analysis and reliability on system level. Microelectronics Reliability. 55(9-10). 2154–2158. 1 indexed citations

6.

Jacob, P.. (2015). Unusual defects, generated by wafer sawing: An update, including pick&place processing. Microelectronics Reliability. 55(9-10). 1826–1831. 2 indexed citations

7.

Jacob, P. & G. Nicoletti. (2006). Surface Electrostatic Damage by Microprocess Robotic Machines: Diagnosis and Reliability, Process Auditing, and Remedies. IEEE Transactions on Device and Materials Reliability. 6(2). 213–220. 3 indexed citations

8.

Wu, Wuchen, et al.. (2005). SEM investigation on IGBT latch-up failure. 2. 1040–1042. 6 indexed citations

9.

Ghani, T., P. Charvát, Chu Chen, et al.. (2003). 100 nm gate length high performance/low power CMOS transistor structure. 415–418. 17 indexed citations

10.

Jacob, P.. (2003). Defect- and structure-weakness-localization on power semiconductors using OBIRCH (optical beam induced resistivity change). 41. 152–156. 5 indexed citations

11.

Wu, Wuchen, Wu Li, Hua Zhang, et al.. (2002). A study of EOS failures in power IGBT modules. 4. 152–155. 3 indexed citations

12.

Wu, Wuchen, et al.. (2002). Investigation on the long term reliability of power IGBT modules. 443–448. 54 indexed citations

13.

Wu, Wuchen, et al.. (2002). Thermal stress related packaging failure in power IGBT modules. DORA Empa (Swiss Federal Laboratories for Materials Science and Technology (Empa)). 35 indexed citations

14.

Wu, Wuchen, et al.. (2002). Thermal reliability of power insulated gate bipolar transistor (IGBT) modules. 136–141. 37 indexed citations

15.

Jacob, P., et al.. (2002). IGBT power semiconductor reliability analysis for traction application. DORA Empa (Swiss Federal Laboratories for Materials Science and Technology (Empa)). 22. 169–175. 5 indexed citations

16.

Neumann, Michael, W. Ehrfeld, Kai Han, et al.. (1999). Electrophoretic sizing of DNA fragments and detection of single mononucleotide molecules in microstructures. Biomedical Chromatography. 13(2). 109–110. 2 indexed citations

17.

Held, Martin, et al.. (1999). Fast power cycling test for insulated gate bipolar transistor modules in traction application. International Journal of Electronics. 86(10). 1193–1204. 66 indexed citations

18.

Jacob, P., et al.. (1999). New FIB-supported approaches for EELS-capable TEM-lamella preparation. DORA Empa (Swiss Federal Laboratories for Materials Science and Technology (Empa)). 69–72. 2 indexed citations

19.

Jacob, P.. (1995). Reliability testing and analysis of IGBT power semiconductor modules. 1995. 4–4. 48 indexed citations

20.

Hartley, Richard, et al.. (1989). A high speed FIR filter designed by compiler. 20.2/1–20.2/4. 17 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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