P. Jacob
Impact in
-
- Silicon Carbide Semiconductor Technologies
- Electromagnetic Compatibility and Noise Suppression
- Electrostatic Discharge in Electronics
- Electronic Packaging and Soldering Technologies
- Multilevel Inverters and Converters
- Semiconductor materials and devices
- Advanced DC-DC Converters
- Advancements in Semiconductor Devices and Circuit Design
Papers in ⓘ
-
- Integrated Circuits and Semiconductor Failure Analysis 9
- Silicon Carbide Semiconductor Technologies 9
- Electrostatic Discharge in Electronics 7
- Semiconductor materials and devices 4
- Electromagnetic Compatibility and Noise Suppression 4
- Co-authors
- Martin Held (8 shared papers)G. Nicoletti (5 shared papers)Max Poech (2 shared papers)Wuchen Wu (5 shared papers)Alessandro Birolini (2 shared papers)Zhengyuan Wang (1 shared paper)Peter Corbett (1 shared paper)Richard Hartley (1 shared paper)
- Journals
- Microelectronics Reliability (6 papers)Biomedical Chromatography (1 paper)IEEE Transactions on Device and Materials Reliability (1 paper)International Journal of Electronics (1 paper)SHILAP Revista de lepidopterología (1 paper)
- Partner nations
- SwitzerlandChinaUnited States
In The Last Decade
P. Jacob
23 papers receiving 740 citations
Hit Papers
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 730
- Automotive Engineering 51
- Mechanical Engineering 105
- Control and Systems Engineering 56
- Safety, Risk, Reliability and Quality 20
Countries citing papers authored by P. Jacob
This map shows the geographic impact of P. Jacob's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Jacob with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Jacob more than expected).
Fields of papers citing papers by P. Jacob
This network shows the impact of papers produced by P. Jacob. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Jacob. The network helps show where P. Jacob may publish in the future.
Co-authors
The 25 scholars most cited alongside P. Jacob, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Fast power cycling test of IGBT modules in traction application Hit paper breakdown → | 2002 | 479 |
| 2 | 1999 | 66 | |
| 3 | 2002 | 54 | |
| 4 | 1995 | 48 | |
| 5 | 2002 | 37 | |
| 6 | 2002 | 35 | |
| 7 | 1989 | 17 | |
| 8 | 2003 | 17 | |
| 9 | 2005 | 6 | |
| 10 | 2002 | 5 | |
| 11 | 2003 | 5 | |
| 12 | 2017 | 4 | |
| 13 | 2016 | 3 | |
| 14 | 2006 | 3 | |
| 15 | 2002 | 3 | |
| 16 | 2006 | 3 | |
| 17 | 1999 | 2 | |
| 18 | 2015 | 2 | |
| 19 | 1999 | 2 | |
| 20 | 2023 | 1 |
About P. Jacob
P. Jacob is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Control and Systems Engineering, Hardware and Architecture and Materials Chemistry, having authored 24 papers that have together received 795 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (9 papers), Silicon Carbide Semiconductor Technologies (9 papers), Electrostatic Discharge in Electronics (7 papers), Semiconductor materials and devices (4 papers), Electromagnetic Compatibility and Noise Suppression (4 papers), Industrial Vision Systems and Defect Detection (3 papers), Electron and X-Ray Spectroscopy Techniques (2 papers) and High voltage insulation and dielectric phenomena (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (730 citations), Automotive Engineering (51 citations), Mechanical Engineering (105 citations), Control and Systems Engineering (56 citations) and Safety, Risk, Reliability and Quality (20 citations). P. Jacob has collaborated with scholars based in Switzerland, China and United States. Frequent co-authors include Martin Held, G. Nicoletti, Max Poech, Wuchen Wu, Alessandro Birolini, Zhengyuan Wang, Peter Corbett, Richard Hartley, J. Kavalieros and Jai-Lin Tsai. Their work appears in journals such as Microelectronics Reliability, Biomedical Chromatography, IEEE Transactions on Device and Materials Reliability, International Journal of Electronics and SHILAP Revista de lepidopterología.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.