P. Humbert
- Atomic and Molecular Physics, and Optics top 10%
- Electronic, Optical and Magnetic Materials top 10%
- Materials Chemistry
- Electrical and Electronic Engineering
- Condensed Matter Physics top 10%
- Co-authors
- V. S. SperiosuB. A. GurneyH. LefakisB. DiényP. BaumgartS. MetinJ.P. DevilleJ. P. Nozières
- Topics
- Copper Interconnects and Reliability (7 papers)Magnetic properties of thin films (6 papers)Magnetic Properties and Applications (4 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsAtomic and Molecular Physics, and OpticsCondensed Matter Physics
- Partner nations
- FranceUnited StatesGermany
In The Last Decade
P. Humbert
20 papers receiving 341 citations
Peers
Comparison fields: 5 of 40
- Atomic and Molecular Physics, and Optics 270
- Electronic, Optical and Magnetic Materials 186
- Materials Chemistry 125
- Electrical and Electronic Engineering 84
- Condensed Matter Physics 83
Countries citing papers authored by P. Humbert
This map shows the geographic impact of P. Humbert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Humbert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Humbert more than expected).
Fields of papers citing papers by P. Humbert
This network shows the impact of papers produced by P. Humbert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Humbert. The network helps show where P. Humbert may publish in the future.
Co-authorship network of co-authors of P. Humbert
This figure shows the co-authorship network connecting the top 25 collaborators of P. Humbert. A scholar is included among the top collaborators of P. Humbert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Humbert. P. Humbert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 6 | |
| 3 | 4 | |
| 4 | 6 | |
| 5 | 10 | |
| 6 | 7 | |
| 7 | 12 | |
| 8 | 17 | |
| 9 | 23 | |
| 10 | 119 | |
| 11 | 79 | |
| 12 | 1 | |
| 13 | 4 | |
| 14 | 2 | |
| 15 | 14 | |
| 16 | 30 | |
| 17 | 12 | |
| 18 | 4 | |
| 19 | 2 | |
| 20 | 4 |
About P. Humbert
P. Humbert is a scholar working on Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films and Metals and Alloys, having authored 20 papers that have together received 361 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (7 papers), Magnetic properties of thin films (6 papers) and Magnetic Properties and Applications (4 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (186 citations), Atomic and Molecular Physics, and Optics (270 citations) and Condensed Matter Physics (83 citations). P. Humbert has collaborated with scholars based in France, United States and Germany. Frequent co-authors include V. S. Speriosu, B. A. Gurney, H. Lefakis, B. Diény, P. Baumgart, S. Metin, J.P. Deville, J. P. Nozières, C. Mény and A. Mosser. Their work appears in journals such as Physical review. B, Condensed matter, Journal of Materials Science and Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.