P. Chaparala

1.1k total citations
64 papers, 886 citations indexed

About

P. Chaparala is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Bioengineering. According to data from OpenAlex, P. Chaparala has authored 64 papers receiving a total of 886 indexed citations (citations by other indexed papers that have themselves been cited), including 63 papers in Electrical and Electronic Engineering, 10 papers in Biomedical Engineering and 4 papers in Bioengineering. Recurrent topics in P. Chaparala's work include Semiconductor materials and devices (49 papers), Advancements in Semiconductor Devices and Circuit Design (32 papers) and Integrated Circuits and Semiconductor Failure Analysis (24 papers). P. Chaparala is often cited by papers focused on Semiconductor materials and devices (49 papers), Advancements in Semiconductor Devices and Circuit Design (32 papers) and Integrated Circuits and Semiconductor Failure Analysis (24 papers). P. Chaparala collaborates with scholars based in United States, Ireland and Egypt. P. Chaparala's co-authors include John S. Suehle, Richard E. Cavicchi, K.G. Kreider, Michael Gaitan, J.S. Suehle, W.M. Miller, Peng Lim, S. Semancik, J. A. Small and M.L. Roush and has published in prestigious journals such as Applied Physics Letters, Sensors and Actuators B Chemical and IEEE Transactions on Electron Devices.

In The Last Decade

P. Chaparala

59 papers receiving 836 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
P. Chaparala United States 16 829 242 171 110 69 64 886
A. Martínez France 16 540 0.7× 180 0.7× 110 0.6× 154 1.4× 216 3.1× 41 649
Yao Yao China 16 496 0.6× 206 0.9× 66 0.4× 75 0.7× 93 1.3× 68 712
Kirubaveni Savarimuthu India 13 413 0.5× 268 1.1× 57 0.3× 85 0.8× 15 0.2× 64 541
Alois Friedberger Germany 12 328 0.4× 232 1.0× 58 0.3× 60 0.5× 60 0.9× 30 413
Zhenan Tang China 12 385 0.5× 291 1.2× 200 1.2× 88 0.8× 63 0.9× 27 451
Jiuru Yang China 15 518 0.6× 78 0.3× 41 0.2× 26 0.2× 178 2.6× 65 577
Cheng-Chih Hsu Taiwan 14 331 0.4× 206 0.9× 97 0.6× 74 0.7× 65 0.9× 42 493
R. Chabicovsky Austria 10 229 0.3× 165 0.7× 73 0.4× 63 0.6× 61 0.9× 30 374
R.H. Womack United States 11 571 0.7× 164 0.7× 13 0.1× 369 3.4× 40 0.6× 18 717

Countries citing papers authored by P. Chaparala

Since Specialization
Citations

This map shows the geographic impact of P. Chaparala's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Chaparala with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Chaparala more than expected).

Fields of papers citing papers by P. Chaparala

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Chaparala. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Chaparala. The network helps show where P. Chaparala may publish in the future.

Co-authorship network of co-authors of P. Chaparala

This figure shows the co-authorship network connecting the top 25 collaborators of P. Chaparala. A scholar is included among the top collaborators of P. Chaparala based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Chaparala. P. Chaparala is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Chaparala, P.. (2015). Defining reliability specifications for consumer electronic devices. ix–ix. 1 indexed citations
2.
Chaparala, P., et al.. (2008). The Effect of the Subthreshold Slope Degradation on NBTI Device Characterization. 1–18. 5 indexed citations
3.
Chaparala, P., et al.. (2006). Effect of Photo Misalignment on N-LDMOS Hot Carrier Device Reliability. 44–48. 1 indexed citations
4.
Chaparala, P., et al.. (2005). Anomalous NMOSFET hot carrier degradation due to hole injection in a DGO CMOS process. 102–108. 4 indexed citations
5.
Cavicchi, Richard E., John S. Suehle, K.G. Kreider, Michael Gaitan, & P. Chaparala. (2005). Optimized Temperature Pulse Sequences For The Enhancement Of Chemically-specific Response Patterns From Micro-hotplate Gas Sensors. Proceedings of the International Solid-State Sensors and Actuators Conference - TRANSDUCERS '95. 1. 823–826. 4 indexed citations
6.
Ващенко, В.А., et al.. (2005). Electrical characteristics and reliability of extended drain voltage NMOS devices with multi-RESURF junction. 565–572. 5 indexed citations
7.
Semancik, S., Richard E. Cavicchi, K.G. Kreider, John S. Suehle, & P. Chaparala. (2005). Selected-area Deposition Of Multiple Active Films For Conductometric Microsensor Arrays. Proceedings of the International Solid-State Sensors and Actuators Conference - TRANSDUCERS '95. 1. 831–834.
8.
Chaparala, P., et al.. (2004). Optimizing the hot carrier reliability of N-LDMOS transistor arrays. Microelectronics Reliability. 45(7-8). 1021–1032. 28 indexed citations
9.
Chaparala, P., et al.. (2003). 1-D and 2-D hot carrier layout optimization of N-LDMOS transistor arrays. 120–124. 3 indexed citations
10.
11.
Chaparala, P., et al.. (2003). NBTI in dual gate oxide PMOSFETs. 138–141. 9 indexed citations
12.
Souza, M.M. De, et al.. (2003). Influence of mobility model on extraction of stress dependent source–drain series resistance. Microelectronics Reliability. 44(1). 25–32. 1 indexed citations
13.
14.
Chaparala, P., et al.. (2002). Time-dependent dielectric breakdown of intrinsic SiO/sub 2/ films under dynamic stress. 104–112. 1 indexed citations
15.
Chen, Weidong, et al.. (1997). RCA and IMEC/SC2 Clean: Metallic Immunity and Gate Oxide Integrity. MRS Proceedings. 477. 2 indexed citations
16.
Suehle, J.S., et al.. (1996). A new physics-based model for time-dependent-dielectric-breakdown. 84–92. 16 indexed citations
17.
Cole, Edward I., et al.. (1995). OBIC Analysis of Stressed, Thermally-Isolated Polysilicon Resistors. 234–243. 2 indexed citations
18.
Suehle, J.S. & P. Chaparala. (1995). Time-Dependent Dielectric Breakdown in Thin Intrinsic SiO2 Films. MRS Proceedings. 386. 3 indexed citations
19.
20.
Cavicchi, Richard E., John S. Suehle, P. Chaparala, et al.. (1994). MICRO-HOTPLATE GAS SENSOR. 53–56. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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