Nasser Fard
- Safety, Risk, Reliability and Quality top 2%
- Statistics, Probability and Uncertainty top 2%
- Statistics and Probability top 5%
- Software top 5%
- Electrical and Electronic Engineering
- Topics
- Reliability and Maintenance Optimization (12 papers)Software Reliability and Analysis Research (9 papers)Statistical Distribution Estimation and Applications (9 papers)
- Journals
- Reliability Engineering & System SafetyThe International Journal of Advanced Manufacturing TechnologyComputers & Industrial Engineering
- Partner nations
- United StatesMexicoChina
In The Last Decade
Nasser Fard
35 papers receiving 380 citations
Peers
Comparison fields: 5 of 63
- Safety, Risk, Reliability and Quality 234
- Statistics, Probability and Uncertainty 143
- Statistics and Probability 128
- Software 86
- Electrical and Electronic Engineering 52
Countries citing papers authored by Nasser Fard
This map shows the geographic impact of Nasser Fard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nasser Fard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nasser Fard more than expected).
Fields of papers citing papers by Nasser Fard
This network shows the impact of papers produced by Nasser Fard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nasser Fard. The network helps show where Nasser Fard may publish in the future.
Co-authorship network of co-authors of Nasser Fard
This figure shows the co-authorship network connecting the top 25 collaborators of Nasser Fard. A scholar is included among the top collaborators of Nasser Fard based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nasser Fard. Nasser Fard is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 1 | |
| 3 | 4 | |
| 4 | 14 | |
| 5 | 6 | |
| 6 | 1 | |
| 7 | 2 | |
| 8 | 0 | |
| 9 | 1 | |
| 10 | 3 | |
| 11 | 59 | |
| 12 | 36 | |
| 13 | 15 | |
| 14 | 3 | |
| 15 | 2 | |
| 16 | 37 | |
| 17 | 15 | |
| 18 | 1 | |
| 19 | 13 | |
| 20 | 22 |
About Nasser Fard
Nasser Fard is a scholar working on Software, Statistics, Probability and Uncertainty and Statistics and Probability, having authored 36 papers that have together received 403 indexed citations. Recurring topics across this work include Reliability and Maintenance Optimization (12 papers), Software Reliability and Analysis Research (9 papers) and Statistical Distribution Estimation and Applications (9 papers). The work is most often cited by research in Safety, Risk, Reliability and Quality (234 citations), Software (86 citations) and Statistics, Probability and Uncertainty (143 citations). Nasser Fard has collaborated with scholars based in United States, Mexico and China. Frequent co-authors include Chenhua Li, Indra Gunawan, Indra Gunawan, Abdul Hannan Chowdhury, Emanuel Melachrinoudis, Chun-An Chou and Luo Li. Their work appears in journals such as Reliability Engineering & System Safety, The International Journal of Advanced Manufacturing Technology and Computers & Industrial Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.