Michael Kolbe

1.3k total citations
61 papers, 892 citations indexed

About

Michael Kolbe is a scholar working on Radiation, Surfaces, Coatings and Films and Materials Chemistry. According to data from OpenAlex, Michael Kolbe has authored 61 papers receiving a total of 892 indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Radiation, 34 papers in Surfaces, Coatings and Films and 23 papers in Materials Chemistry. Recurrent topics in Michael Kolbe's work include Electron and X-Ray Spectroscopy Techniques (32 papers), X-ray Spectroscopy and Fluorescence Analysis (32 papers) and Nuclear Physics and Applications (11 papers). Michael Kolbe is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (32 papers), X-ray Spectroscopy and Fluorescence Analysis (32 papers) and Nuclear Physics and Applications (11 papers). Michael Kolbe collaborates with scholars based in Germany, Belgium and Austria. Michael Kolbe's co-authors include Burkhard Beckhoff, Philipp Hönicke, Matthias Müller, G. Ulm, Michael Krumrey, R. Fliegauf, Jan Weser, K. Stock, Stephan G. Wetzel and Ernst W. Radue and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Analytical Chemistry.

In The Last Decade

Michael Kolbe

58 papers receiving 871 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Michael Kolbe Germany 16 449 244 194 166 153 61 892
Hiroshi Takada Japan 17 725 1.6× 22 0.1× 326 1.7× 196 1.2× 96 0.6× 146 1.4k
Yasuhiro Koguchi Japan 14 270 0.6× 19 0.1× 197 1.0× 70 0.4× 32 0.2× 52 521
R. Henkelmann Germany 16 316 0.7× 39 0.2× 158 0.8× 156 0.9× 63 0.4× 45 643
M. Procop Germany 13 343 0.8× 247 1.0× 204 1.1× 161 1.0× 143 0.9× 53 660
A. J. Antolak United States 14 304 0.7× 150 0.6× 113 0.6× 184 1.1× 150 1.0× 68 609
A.F. Gurbich Russia 18 490 1.1× 173 0.7× 237 1.2× 151 0.9× 96 0.6× 56 874
Joost F. Peters Netherlands 16 121 0.3× 25 0.1× 211 1.1× 106 0.6× 188 1.2× 25 756
В. П. Афанасьев Russia 14 138 0.3× 221 0.9× 263 1.4× 244 1.5× 221 1.4× 130 802
Ray Conley United States 15 556 1.2× 93 0.4× 90 0.5× 175 1.1× 80 0.5× 28 751
Tianxi Sun China 17 644 1.4× 128 0.5× 165 0.9× 68 0.4× 49 0.3× 104 842

Countries citing papers authored by Michael Kolbe

Since Specialization
Citations

This map shows the geographic impact of Michael Kolbe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Kolbe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Kolbe more than expected).

Fields of papers citing papers by Michael Kolbe

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michael Kolbe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Kolbe. The network helps show where Michael Kolbe may publish in the future.

Co-authorship network of co-authors of Michael Kolbe

This figure shows the co-authorship network connecting the top 25 collaborators of Michael Kolbe. A scholar is included among the top collaborators of Michael Kolbe based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Michael Kolbe. Michael Kolbe is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ciesielski, Richard, Roger Loo, Yosuke Shimura, et al.. (2024). Interface sharpness in stacked thin film structures: a comparison of soft X-ray reflectometry and transmission electron microscopy. Journal of Micro/Nanopatterning Materials and Metrology. 23(4). 1 indexed citations
2.
Ciesielski, Richard, Roger Loo, Yosuke Shimura, et al.. (2024). Soft x-ray reflectometry for the inspection of interlayer roughness in stacked thin film structures. Ghent University Academic Bibliography (Ghent University). 2 indexed citations
3.
Eichert, Diane, Michael Kolbe, & J. Hoszowska. (2020). In memoriam Jean‐Claude Dousse. X-Ray Spectrometry. 50(2). 145–146.
4.
Gottwald, Alexander, et al.. (2019). The U125 insertion device beamline at the Metrology Light Source. Journal of Synchrotron Radiation. 26(2). 535–542. 11 indexed citations
5.
Darlatt, Erik, Roland Roesch, C. Lupulescu, et al.. (2016). Irradiation-induced degradation of PTB7 investigated by valence band and S 2pphotoelectron spectroscopy. Nanotechnology. 27(32). 324005–324005. 8 indexed citations
6.
Hönicke, Philipp, et al.. (2016). Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils. Spectrochimica Acta Part B Atomic Spectroscopy. 124. 94–98. 23 indexed citations
7.
Fliegauf, R., Burkhard Beckhoff, Erik Darlatt, et al.. (2016). Surface characterization of silicon spheres by combined XRF and XPS analysis for determination of the avogadro constant. 1–2. 4 indexed citations
8.
Kolbe, Michael & Philipp Hönicke. (2015). Fundamental parameters of Zr and Ti for a reliable quantitative X‐ray fluorescence analysis. X-Ray Spectrometry. 44(4). 217–220. 25 indexed citations
9.
Hönicke, Philipp, Michael Kolbe, Matthias Müller, et al.. (2014). Experimental Verification of the Individual Energy Dependencies of the PartialL-Shell Photoionization Cross Sections of Pd and Mo. Physical Review Letters. 113(16). 163001–163001. 23 indexed citations
10.
Klein, R., Alexander Gottwald, Michael Kolbe, et al.. (2013). UV and VUV calibration capabilities at the Metrology Light Source for solar and atmospheric research. AIP conference proceedings. 879–882. 8 indexed citations
11.
Kolbe, Michael, Philipp Hönicke, Matthias Müller, & Burkhard Beckhoff. (2012). L-subshell fluorescence yields and Coster-Kronig transition probabilities with a reliable uncertainty budget for selected high- and medium-Zelements. Physical Review A. 86(4). 48 indexed citations
12.
Sioncke, Sonja, Claudia Fleischmann, Dennis Lin, et al.. (2012). S-Passivation of the Ge Gate Stack Using (NH<sub>4</sub>)<sub>2</sub>S. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 187. 23–26. 1 indexed citations
13.
Sokaras, Dimosthenis, А.Г. Кочур, Michael Kolbe, et al.. (2011). Cascade L-shell soft x-ray emission as incident x-ray photons are tuned across 1s ionization threshold. HZB Repository (Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB)). 42. 1 indexed citations
14.
Kolbe, Michael, Burkhard Beckhoff, Michael Krumrey, et al.. (2009). Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation. ECS Transactions. 25(3). 293–300. 3 indexed citations
15.
Hönicke, Philipp, Burkhard Beckhoff, Michael Kolbe, et al.. (2009). Depth profile characterization of ultra shallow junction implants. Analytical and Bioanalytical Chemistry. 396(8). 2825–2832. 43 indexed citations
16.
17.
Beckhoff, Burkhard, Michael Kolbe, Oliver Hahn, et al.. (2008). Reference‐free x‐ray fluorescence analysis of an ancient Chinese ceramic. X-Ray Spectrometry. 37(4). 462–465. 16 indexed citations
18.
Hoffmann, P., S. Flege, Hugo M. Ortner, et al.. (2008). Nondestructive characterization of nanoscale layered samples. Analytical and Bioanalytical Chemistry. 393(2). 623–634. 6 indexed citations
19.
Hönicke, Philipp, et al.. (2008). Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray flourescence. Spectrochimica Acta Part B Atomic Spectroscopy. 63(12). 1359–1364. 7 indexed citations
20.
Beckhoff, Burkhard, R. Fliegauf, Philipp Hönicke, et al.. (2007). Advanced Metrologies for Wafer Contamination and Nanolayer Characterization Using XRF Methods. ECS Transactions. 11(3). 273–279. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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