Jan Weser

506 total citations
23 papers, 399 citations indexed

About

Jan Weser is a scholar working on Radiation, Surfaces, Coatings and Films and Electrical and Electronic Engineering. According to data from OpenAlex, Jan Weser has authored 23 papers receiving a total of 399 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Radiation, 15 papers in Surfaces, Coatings and Films and 8 papers in Electrical and Electronic Engineering. Recurrent topics in Jan Weser's work include Electron and X-Ray Spectroscopy Techniques (15 papers), X-ray Spectroscopy and Fluorescence Analysis (14 papers) and Advanced X-ray Imaging Techniques (5 papers). Jan Weser is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (15 papers), X-ray Spectroscopy and Fluorescence Analysis (14 papers) and Advanced X-ray Imaging Techniques (5 papers). Jan Weser collaborates with scholars based in Germany, Russia and Czechia. Jan Weser's co-authors include Burkhard Beckhoff, R. Fliegauf, G. Ulm, Matthias Müller, Michael Kolbe, Beatrix Pollakowski, Philipp Hönicke, G. Mirek Brandt, Frank Scholze and R. Klein and has published in prestigious journals such as Analytical Chemistry, The Journal of Physical Chemistry B and Small.

In The Last Decade

Jan Weser

21 papers receiving 392 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jan Weser Germany 10 258 130 102 102 55 23 399
R. Fliegauf Germany 11 310 1.2× 137 1.1× 128 1.3× 92 0.9× 67 1.2× 33 500
Tonči Tadić Croatia 12 197 0.8× 110 0.8× 126 1.2× 134 1.3× 28 0.5× 46 471
Z. Medunić Croatia 10 84 0.3× 47 0.4× 192 1.9× 124 1.2× 37 0.7× 29 375
R. L. Myklebust United States 12 188 0.7× 206 1.6× 48 0.5× 78 0.8× 76 1.4× 33 405
O. Kakuee Iran 11 153 0.6× 28 0.2× 37 0.4× 101 1.0× 39 0.7× 52 411
Teresa I. Madeira Portugal 11 89 0.3× 53 0.4× 53 0.5× 113 1.1× 61 1.1× 34 307
N. Dytlewski Australia 12 274 1.1× 106 0.8× 258 2.5× 179 1.8× 30 0.5× 69 672
H. R. Verma India 13 357 1.4× 108 0.8× 18 0.2× 125 1.2× 87 1.6× 37 501
M.D. Ashbaugh United States 10 145 0.6× 37 0.3× 104 1.0× 141 1.4× 36 0.7× 19 376
C. J. Powell United States 4 275 1.1× 282 2.2× 73 0.7× 55 0.5× 26 0.5× 8 385

Countries citing papers authored by Jan Weser

Since Specialization
Citations

This map shows the geographic impact of Jan Weser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jan Weser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jan Weser more than expected).

Fields of papers citing papers by Jan Weser

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jan Weser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jan Weser. The network helps show where Jan Weser may publish in the future.

Co-authorship network of co-authors of Jan Weser

This figure shows the co-authorship network connecting the top 25 collaborators of Jan Weser. A scholar is included among the top collaborators of Jan Weser based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jan Weser. Jan Weser is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hönicke, Philipp, Jonas Baumann, Daniel Grötzsch, et al.. (2022). Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples. Nanomaterials. 12(21). 3766–3766. 10 indexed citations
2.
Hönicke, Philipp, Yves Kayser, Jan Weser, et al.. (2022). Quantitative Element‐Sensitive Analysis of Individual Nanoobjects. Small. 19(9). e2204943–e2204943. 3 indexed citations
3.
Grötzsch, Daniel, Jan Weser, Wolfgang Malzer, et al.. (2022). In situ gas cell for the analysis of adsorption behaviour on surfaces using X-ray spectroscopy. Applied Surface Science. 609. 155179–155179. 1 indexed citations
4.
Kayser, Yves, et al.. (2021). A double crystal von Hamos spectrometer for traceable x-ray emission spectroscopy. Review of Scientific Instruments. 92(12). 123105–123105. 6 indexed citations
5.
6.
Hönicke, Philipp, et al.. (2017). Determination of SiO2and C layers on a monocrystalline silicon sphere by reference-free x-ray fluorescence analysis. Metrologia. 54(4). 481–486. 7 indexed citations
7.
Ménesguen, Yves, H. Rotella, Jan Weser, et al.. (2017). CASTOR, a new instrument for combined XRR‐GIXRF analysis at SOLEIL. X-Ray Spectrometry. 46(5). 303–308. 17 indexed citations
8.
Grötzsch, Daniel, Ioanna Mantouvalou, Jan Weser, et al.. (2016). A flexible setup for angle-resolved X-ray fluorescence spectrometry with laboratory sources. Review of Scientific Instruments. 87(3). 35108–35108. 12 indexed citations
9.
Mantouvalou, Ioanna, Heiko Lokstein, Daniel Grötzsch, et al.. (2016). Magnesium K-Edge NEXAFS Spectroscopy of Chlorophyll a in Solution. The Journal of Physical Chemistry B. 120(45). 11619–11627. 14 indexed citations
10.
Beckhoff, Burkhard, R. Fliegauf, Philipp Hönicke, et al.. (2013). A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies. Review of Scientific Instruments. 84(4). 45106–45106. 89 indexed citations
11.
Hoffmann, P., S. Flege, Hugo M. Ortner, et al.. (2008). Nondestructive characterization of nanoscale layered samples. Analytical and Bioanalytical Chemistry. 393(2). 623–634. 6 indexed citations
12.
Beckhoff, Burkhard, R. Fliegauf, Philipp Hönicke, et al.. (2007). Advanced Metrologies for Wafer Contamination and Nanolayer Characterization Using XRF Methods. ECS Transactions. 11(3). 273–279. 3 indexed citations
13.
Beckhoff, Burkhard, R. Fliegauf, Michael Kolbe, et al.. (2007). Reference-Free Total Reflection X-ray Fluorescence Analysis of Semiconductor Surfaces with Synchrotron Radiation. Analytical Chemistry. 79(20). 7873–7882. 101 indexed citations
14.
Beckhoff, Burkhard, R. Fliegauf, Michael Kolbe, et al.. (2007). X-Ray Spectrometry for Wafer Contamination Analysis and Speciation as Well as for Reference-Free Nanolayer Characterization. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 134. 277–280. 1 indexed citations
15.
Beckhoff, Burkhard, R. Fliegauf, Michael Kolbe, et al.. (2007). Wafer Contamination Analysis, Speciation and Reference-free Nanolayer Characterization using Synchrotron Radiation based X-ray Spectrometry. ECS Transactions. 10(1). 51–56. 1 indexed citations
16.
Beckhoff, Burkhard, R. Fliegauf, Michael Kolbe, et al.. (2007). Advanced Metrology for Wafer Contamination and Nanolayer Characterization Using XRF Methods. ECS Meeting Abstracts. MA2007-02(19). 1106–1106. 1 indexed citations
17.
Bechstein, S., Burkhard Beckhoff, R. Fliegauf, Jan Weser, & G. Ulm. (2004). Characterization of an Nb/Al/AlOx/Al/Nb superconducting tunnel junction detector with a very high spatial resolution in the soft X-ray range. Spectrochimica Acta Part B Atomic Spectroscopy. 59(2). 215–221. 15 indexed citations
18.
Beckhoff, Burkhard, R. Fliegauf, G. Ulm, et al.. (2003). TXRF Analysis of Low Z Elements and TXRF-NEXAFS Speciation of Organic Contaminants on Silicon Wafer Surfaces Excited by Monochromatized Undulator Radiation. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 92. 165–170. 4 indexed citations
19.
Beckhoff, Burkhard, R. Fliegauf, Jan Weser, & G. Ulm. (2003). A Novel Instrumentation for Contamination and Deposition Control on 300 mm Silicon Wafers Employing Synchrotron Radiation Based TXRF and EDXRF Analysis. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 92. 89–92. 5 indexed citations
20.
Scholze, Frank, Burkhard Beckhoff, G. Mirek Brandt, et al.. (2001). High-accuracy EUV metrology of PTB using synchrotron radiation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 63 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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