Michael A. O’Keefe
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications 26
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 28
- Inorganic Chemistry top 5%
- Radiation top 5%
- Advanced X-ray Imaging Techniques 8
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- Integrated Circuits and Semiconductor Failure Analysis 7
- Advancements in Photolithography Techniques 5
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- Advanced Materials Characterization Techniques 4
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- Surface and Thin Film Phenomena 3
- Force Microscopy Techniques and Applications 1
- Co-authors
- Nathaniel E. BreseYang Shao‐HornLaurence CroguennecE. Chris NelsonClaude DelmasWilliam KrakowDouglas A. BlomLawrence F. Allard
- Journals
- Microscopy and Microanalysis (12 papers)Ultramicroscopy (4 papers)Journal of the American Chemical Society (1 paper)
- Partner nations
- United StatesUnited KingdomJapan
In The Last Decade
Michael A. O’Keefe
40 papers receiving 1.1k citations
Hit Papers
Peers
Comparison fields: 5 of 73
- Structural Biology 290
- Surfaces, Coatings and Films 267
- Inorganic Chemistry 272
- Electronic, Optical and Magnetic Materials 252
- Radiation 109
Countries citing papers authored by Michael A. O’Keefe
This map shows the geographic impact of Michael A. O’Keefe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael A. O’Keefe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael A. O’Keefe more than expected).
Fields of papers citing papers by Michael A. O’Keefe
This network shows the impact of papers produced by Michael A. O’Keefe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael A. O’Keefe. The network helps show where Michael A. O’Keefe may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Michael A. O’Keefe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 29 | |
| 2 | 2006 | 21 | |
| 3 | 2005 | 25 | |
| 4 | 2004 | 6 | |
| 5 | 2004 | 7 | |
| 6 | Atomic resolution of lithium ions in LiCoO{sub 2} | 2003 | 8 |
| 7 | 2003 | 217 | |
| 8 | Experiences with remote electron microscopy | 2002 | 0 |
| 9 | 2002 | 47 | |
| 10 | 2002 | 1 | |
| 11 | 2001 | 3 | |
| 12 | 1995 | 1 | |
| 13 | 1993 | 1 | |
| 14 | Effects of Fresnel fringes on TEM images of interfaces in X-ray multilayers | 1992 | 1 |
| 15 | 1992 | 1 | |
| 16 | 1990 | 39 | |
| 17 | Computer Simulation of Electron Microscope Diffraction and Images | 1989 | 65 |
| 18 | 1989 | 10 | |
| 19 | Computer simulation of electron microscope diffraction and images : Proceeding of a topical symposium on Computer Simulation of Electron Microscope Diffraction and Images | 1989 | 1 |
| 20 | 1975 | 2 |
About Michael A. O’Keefe
Michael A. O’Keefe is a scholar working on Structural Biology, Surfaces, Coatings and Films and Radiation, having authored 43 papers that have together received 1.2k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (28 papers), Advanced Electron Microscopy Techniques and Applications (26 papers), Advanced X-ray Imaging Techniques (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Advancements in Photolithography Techniques (5 papers), Advanced Materials Characterization Techniques (4 papers), Surface and Thin Film Phenomena (3 papers) and Force Microscopy Techniques and Applications (1 paper). The work is most often cited by research in Structural Biology (290 citations), Surfaces, Coatings and Films (267 citations) and Inorganic Chemistry (272 citations). Michael A. O’Keefe has collaborated with scholars based in United States, United Kingdom and Japan. Frequent co-authors include Nathaniel E. Brese, Yang Shao‐Horn, Laurence Croguennec, E. Chris Nelson, Claude Delmas, William Krakow, Douglas A. Blom, Lawrence F. Allard, Hans‐Rudolf Wenk and Hu Meisheng. Their work appears in journals such as Microscopy and Microanalysis, Ultramicroscopy, Journal of the American Chemical Society, Nature and Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.