Meng Ren
- Electrical and Electronic Engineering top 5%
- Electronic, Optical and Magnetic Materials top 5%
- Biomedical Engineering top 10%
- Materials Chemistry
- Automotive Engineering top 5%
- Topics
- Advancements in Battery Materials (17 papers)Advanced Battery Materials and Technologies (13 papers)Supercapacitor Materials and Fabrication (10 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsAutomotive EngineeringElectrical and Electronic Engineering
- Partner nations
- ChinaFranceUnited Kingdom
In The Last Decade
Meng Ren
39 papers receiving 1.4k citations
Hit Papers
Peers
Comparison fields: 5 of 70
- Electrical and Electronic Engineering 983
- Electronic, Optical and Magnetic Materials 443
- Biomedical Engineering 269
- Materials Chemistry 244
- Automotive Engineering 227
Countries citing papers authored by Meng Ren
This map shows the geographic impact of Meng Ren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Meng Ren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Meng Ren more than expected).
Fields of papers citing papers by Meng Ren
This network shows the impact of papers produced by Meng Ren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Meng Ren. The network helps show where Meng Ren may publish in the future.
Co-authorship network of co-authors of Meng Ren
This figure shows the co-authorship network connecting the top 25 collaborators of Meng Ren. A scholar is included among the top collaborators of Meng Ren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Meng Ren. Meng Ren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 5 | |
| 3 | 2 | |
| 4 | 6 | |
| 5 | Negative Lattice Expansion in an O3‐Type Transition‐Metal Oxide Cathode for Highly Stable Sodium‐Ion Batteriesbreakdown → | 103 |
| 6 | 2 | |
| 7 | 7 | |
| 8 | 7 | |
| 9 | 18 | |
| 10 | 26 | |
| 11 | 146 | |
| 12 | 2 | |
| 13 | 34 | |
| 14 | 14 | |
| 15 | 3 | |
| 16 | 4 | |
| 17 | 39 | |
| 18 | 219 | |
| 19 | 5 | |
| 20 | 30 |
About Meng Ren
Meng Ren is a scholar working on Electronic, Optical and Magnetic Materials, Automotive Engineering and Electrical and Electronic Engineering, having authored 39 papers that have together received 1.5k indexed citations. Recurring topics across this work include Advancements in Battery Materials (17 papers), Advanced Battery Materials and Technologies (13 papers) and Supercapacitor Materials and Fabrication (10 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (443 citations), Automotive Engineering (227 citations) and Electrical and Electronic Engineering (983 citations). Meng Ren has collaborated with scholars based in China, France and United Kingdom. Frequent co-authors include Fujun Li, Kai Shi, Igor Zhitomirsky, Yaohui Huang, Jun Chen, Hengyi Fang, Jinjun Cai, Suning Gao, Tong Zhang and Weibo Hua. Their work appears in journals such as Journal of the American Chemical Society, Angewandte Chemie International Edition and ACS Nano.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.