Mei-Chen Hsueh
- Software top 2%
- Software Reliability and Analysis Research 9
- Software Testing and Debugging Techniques 3
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing 2
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- Software System Performance and Reliability 7
- Distributed systems and fault tolerance 5
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- Reliability and Maintenance Optimization 1
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- Radiation Effects in Electronics 5
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- Lightning and Electromagnetic Phenomena 1
Mei-Chen Hsueh
14 papers receiving 614 citations
Hit Papers
Peers
Comparison fields: 5 of 44
- Software 295
- Hardware and Architecture 255
- Computer Networks and Communications 274
- Safety, Risk, Reliability and Quality 96
- Electrical and Electronic Engineering 369
Countries citing papers authored by Mei-Chen Hsueh
This map shows the geographic impact of Mei-Chen Hsueh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mei-Chen Hsueh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mei-Chen Hsueh more than expected).
Fields of papers citing papers by Mei-Chen Hsueh
This network shows the impact of papers produced by Mei-Chen Hsueh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mei-Chen Hsueh. The network helps show where Mei-Chen Hsueh may publish in the future.
Co-authorship network
The 8 scholars most cited alongside Mei-Chen Hsueh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 3 | |
| 2 | 2002 | 3 | |
| 3 | 2002 | 1 | |
| 4 | 2002 | 0 | |
| 5 | 2002 | 1 | |
| 6 | 2002 | 11 | |
| 7 | 2002 | 2 | |
| 8 | 2002 | 1 | |
| 9 | 2002 | 2 | |
| 10 | 1999 | 39 | |
| 11 | 1998 | 24 | |
| 12 | Fault injection techniques and toolsbreakdown → | 1997 | 553 |
| 13 | 1993 | 22 | |
| 14 | 1990 | 14 | |
| 15 | Measurement-based reliability/performability models | 1987 | 3 |
About Mei-Chen Hsueh
Mei-Chen Hsueh is a scholar working on Software, Computer Networks and Communications, Hardware and Architecture, Safety, Risk, Reliability and Quality and Electrical and Electronic Engineering, having authored 15 papers that have together received 679 indexed citations. Recurring topics across this work include Software Reliability and Analysis Research (9 papers), Software System Performance and Reliability (7 papers), Radiation Effects in Electronics (5 papers), Distributed systems and fault tolerance (5 papers), Software Testing and Debugging Techniques (3 papers), VLSI and Analog Circuit Testing (2 papers), Lightning and Electromagnetic Phenomena (1 paper) and Reliability and Maintenance Optimization (1 paper). The work is most often cited by research in Software (295 citations), Hardware and Architecture (255 citations), Computer Networks and Communications (274 citations), Safety, Risk, Reliability and Quality (96 citations) and Electrical and Electronic Engineering (369 citations). Mei-Chen Hsueh has collaborated with scholars based in United States, Australia and Germany. Frequent co-authors include Ravishankar K. Iyer, Timothy Tsai, R.K. Iyer, Zbigniew Kalbarczyk, Dong Tang, M. Covington, Haiming Jin and Injoong Chang. Their work appears in journals such as IEEE Transactions on Computers, Computer, IEEE Transactions on Power Delivery and IEEE Transactions on Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.