M.C. Acero

584 total citations
34 papers, 441 citations indexed

About

M.C. Acero is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, M.C. Acero has authored 34 papers receiving a total of 441 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Electrical and Electronic Engineering, 9 papers in Biomedical Engineering and 6 papers in Materials Chemistry. Recurrent topics in M.C. Acero's work include Semiconductor materials and devices (23 papers), Advanced Memory and Neural Computing (7 papers) and Ferroelectric and Negative Capacitance Devices (7 papers). M.C. Acero is often cited by papers focused on Semiconductor materials and devices (23 papers), Advanced Memory and Neural Computing (7 papers) and Ferroelectric and Negative Capacitance Devices (7 papers). M.C. Acero collaborates with scholars based in Spain, Germany and Morocco. M.C. Acero's co-authors include J. Estéve, Joan Bausells, Á. Merlos, Ming Bao, J.A. Plaza, F. Campabadal, C. Cané, Mireia Bargalló González, A. Pérez‐Rodríguez and Raquel Perez‐Castillejos and has published in prestigious journals such as Journal of The Electrochemical Society, Sensors and Actuators B Chemical and Applied Surface Science.

In The Last Decade

M.C. Acero

32 papers receiving 413 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
M.C. Acero Spain	10	354	244	63	59	26	34	441
D. Haefliger Switzerland	9	238 0.7×	248 1.0×	46 0.7×	181 3.1×	37 1.4×	17	422
Régis Rogel France	12	296 0.8×	205 0.8×	134 2.1×	49 0.8×	25 1.0×	44	354
G.J. Burger Netherlands	6	266 0.8×	272 1.1×	162 2.6×	56 0.9×	13 0.5×	14	457
Jürgen Daniel United States	12	420 1.2×	284 1.2×	115 1.8×	39 0.7×	22 0.8×	32	604
Katrin Sidler Switzerland	11	260 0.7×	304 1.2×	72 1.1×	115 1.9×	7 0.3×	23	455
Garth Wells Canada	10	185 0.5×	182 0.7×	63 1.0×	33 0.6×	18 0.7×	39	380
Rui M. R. Pinto Portugal	10	157 0.4×	212 0.9×	67 1.1×	92 1.6×	22 0.8×	28	345
Samuel Charlot France	9	213 0.6×	111 0.5×	65 1.0×	53 0.9×	19 0.7×	32	345
Pushpapraj Singh India	13	463 1.3×	308 1.3×	101 1.6×	151 2.6×	19 0.7×	71	584
M. Beck Sweden	11	261 0.7×	381 1.6×	47 0.7×	135 2.3×	10 0.4×	18	452

Countries citing papers authored by M.C. Acero

Since Specialization

Citations

This map shows the geographic impact of M.C. Acero's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.C. Acero with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.C. Acero more than expected).

Fields of papers citing papers by M.C. Acero

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M.C. Acero. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.C. Acero. The network helps show where M.C. Acero may publish in the future.

Co-authorship network of co-authors of M.C. Acero

This figure shows the co-authorship network connecting the top 25 collaborators of M.C. Acero. A scholar is included among the top collaborators of M.C. Acero based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M.C. Acero. M.C. Acero is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

García, H., Mireia Bargalló González, Helena Castán, et al.. (2018). Electrical Characterization of Defects Created by γ-Radiation in HfO2-Based MIS Structures for RRAM Applications. Journal of Electronic Materials. 47(9). 5013–5018. 11 indexed citations

García, H., Helena Castán, S. Dueñas, et al.. (2017). Advanced electrical characterization of atomic layer deposited Al<inf>2</inf>O<inf>3</inf> MIS-based structures. DIGITAL.CSIC (Spanish National Research Council (CSIC)). 1–4.

Acero, M.C., et al.. (2017). Top electrode dependence of the resistive switching behavior in HfO<inf>2</inf>/n⁺Si-based devices. DIGITAL.CSIC (Spanish National Research Council (CSIC)). 1–4. 6 indexed citations

González, Mireia Bargalló, et al.. (2016). Investigation of Filamentary Current Fluctuations Features in the High-Resistance State of Ni/HfO₂-Based RRAM. IEEE Transactions on Electron Devices. 63(8). 3116–3122. 22 indexed citations

González, Mireia Bargalló, et al.. (2015). Investigation of the resistive switching behavior in Ni/HfO<inf>2</inf>-based RRAM devices. DIGITAL.CSIC (Spanish National Research Council (CSIC)). 1–3. 4 indexed citations

Campabadal, F., et al.. (2011). Comparison between Al<inf>2</inf>O<inf>3</inf> thin films grown by ALD using H<inf>2</inf>O or O<inf>3</inf> as oxidant source. DIGITAL.CSIC (Spanish National Research Council (CSIC)). 96. 1–4. 8 indexed citations

Sánchez, Ana M., et al.. (2009). Patterning of ALD HfO₂ Layers on Silicon. ECS Transactions. 25(4). 309–314.

Serre, C., D. Panknin, A. Pérez‐Rodríguez, et al.. (2001). Ion beam synthesis of n-type doped SiC layers. Applied Surface Science. 184(1-4). 367–371. 1 indexed citations

Acero, M.C., et al.. (2001). Differential injection analysis based on backside-contacted ISFETs. DIGITAL.CSIC (Spanish National Research Council (CSIC)). 119–122. 1 indexed citations

10.

Romano‐Rodrı́guez, A., A. Pérez‐Rodríguez, C. Serre, et al.. (2000). Epitaxial Growth of β-SiC on Ion-Beam Synthesized β-SiC: Structural Characterization. Materials science forum. 338-342. 309–312. 1 indexed citations

11.

Acero, M.C., et al.. (1999). Microvalve Analysis: Wall Shear and Diffuser Effects. TechConnect Briefs. 554–557. 2 indexed citations

12.

Heredero, R. L., et al.. (1999). Micromachined optical fiber current sensor. Applied Optics. 38(25). 5298–5298. 6 indexed citations

13.

Serre, C., A. Romano‐Rodrı́guez, A. Pérez‐Rodríguez, et al.. (1999). β-SiC on SiO2 formed by ion implantation and bonding for micromechanics applications. Sensors and Actuators A Physical. 74(1-3). 169–173. 8 indexed citations

14.

Acero, M.C., et al.. (1997). Design of a modular micropump based on anodic bonding. Journal of Micromechanics and Microengineering. 7(3). 179–182. 32 indexed citations

15.

Serre, C., A. Pérez‐Rodríguez, A. Romano‐Rodrı́guez, et al.. (1997). Synthesis of SiC Microstructures in Si Technology by High Dose Carbon Implantation: Etch‐Stop Properties. Journal of The Electrochemical Society. 144(6). 2211–2215. 16 indexed citations

16.

Acero, M.C., et al.. (1995). Electrochemical etch-stop characteristics of TMAH:IPA solutions. Sensors and Actuators A Physical. 46(1-3). 22–26. 26 indexed citations

17.

Acero, M.C., J. Estéve, J. Montserrat, et al.. (1994). Anisotropic etch-stop properties of nitrogen-implanted silicon. Sensors and Actuators A Physical. 45(3). 219–225. 3 indexed citations

18.

Merlos, Á., M.C. Acero, Ming Bao, Joan Bausells, & J. Estéve. (1993). TMAH/IPA anisotropic etching characteristics. Sensors and Actuators A Physical. 37-38. 737–743. 142 indexed citations

19.

Merlos, Á., M.C. Acero, Ming Bao, Joan Bausells, & J. Estéve. (1992). A study of the undercutting characteristics in the TMAH-IPA system. Journal of Micromechanics and Microengineering. 2(3). 181–183. 34 indexed citations

20.

Martı́n, Ferran, X. Aymerich, F. Campabadal, & M.C. Acero. (1992). Carrier transport and storage in Si3N4 for metal-nitride-oxide-semiconductor memory applications. Thin Solid Films. 213(2). 235–243. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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