M. Schiekel
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- Liquid Crystal Research Advancements 4
- Media Technology top 10%
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- X-ray Spectroscopy and Fluorescence Analysis 7
- Nuclear Physics and Applications 5
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- Nonlinear Dynamics and Pattern Formation 3
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- Ion-surface interactions and analysis 2
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- X-ray Diffraction in Crystallography 2
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- Advanced X-ray and CT Imaging 2
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- Medical Imaging Techniques and Applications 1
M. Schiekel
12 papers receiving 301 citations
Peers
Comparison fields: 5 of 37
- Electronic, Optical and Magnetic Materials 287
- Atomic and Molecular Physics, and Optics 164
- Media Technology 43
- Physical and Theoretical Chemistry 16
- Spectroscopy 29
Countries citing papers authored by M. Schiekel
This map shows the geographic impact of M. Schiekel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Schiekel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Schiekel more than expected).
Fields of papers citing papers by M. Schiekel
This network shows the impact of papers produced by M. Schiekel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Schiekel. The network helps show where M. Schiekel may publish in the future.
Co-authorship network
The 7 scholars most cited alongside M. Schiekel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1994 | 1 | |
| 2 | 1993 | 1 | |
| 3 | 1991 | 1 | |
| 4 | Use of semiconductors in energy-dispersive X-ray analysis | 1983 | 1 |
| 5 | 1983 | 6 | |
| 6 | 1980 | 1 | |
| 7 | 1979 | 0 | |
| 8 | On the influence of the sample topography in ion-induced X-ray emission analysis | 1977 | 3 |
| 9 | 1977 | 2 | |
| 10 | 1977 | 7 | |
| 11 | 1976 | 10 | |
| 12 | 1975 | 9 | |
| 13 | 1971 | 291 |
About M. Schiekel
M. Schiekel is a scholar working on Radiation, Electronic, Optical and Magnetic Materials, Radiological and Ultrasound Technology, Surfaces, Coatings and Films and Computer Networks and Communications, having authored 13 papers that have together received 333 indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (7 papers), Nuclear Physics and Applications (5 papers), Liquid Crystal Research Advancements (4 papers), Nonlinear Dynamics and Pattern Formation (3 papers), Ion-surface interactions and analysis (2 papers), X-ray Diffraction in Crystallography (2 papers), Advanced X-ray and CT Imaging (2 papers) and Medical Imaging Techniques and Applications (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (287 citations), Atomic and Molecular Physics, and Optics (164 citations), Media Technology (43 citations), Physical and Theoretical Chemistry (16 citations) and Spectroscopy (29 citations). M. Schiekel has collaborated with scholars based in Germany and Czechia. Frequent co-authors include K. Fahrenschon, Hans Gruler, W.‐G. Franke, U. Lorenz, F. Scheibe, Vincent Pohl and G. Zschornack. Their work appears in journals such as Journal of Radioanalytical and Nuclear Chemistry, Applied Physics Letters, Applied Physics B, Journal of The Electrochemical Society and Applied Physics A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.