M. J. Edgell

614 total citations
19 papers, 486 citations indexed

About

M. J. Edgell is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Computational Mechanics. According to data from OpenAlex, M. J. Edgell has authored 19 papers receiving a total of 486 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 10 papers in Surfaces, Coatings and Films and 9 papers in Computational Mechanics. Recurrent topics in M. J. Edgell's work include Ion-surface interactions and analysis (9 papers), Electron and X-Ray Spectroscopy Techniques (9 papers) and X-ray Spectroscopy and Fluorescence Analysis (5 papers). M. J. Edgell is often cited by papers focused on Ion-surface interactions and analysis (9 papers), Electron and X-Ray Spectroscopy Techniques (9 papers) and X-ray Spectroscopy and Fluorescence Analysis (5 papers). M. J. Edgell collaborates with scholars based in United Kingdom, United States and Sweden. M. J. Edgell's co-authors include J. E. Castle, R.W. Paynter, Krister Holmberg, J. Milton Harris, Karin Bergström, Agneza Safranj, Antoni Kozłowski, Allan S. Hoffman, Donald R. Baer and J. F. Watts and has published in prestigious journals such as Journal of The Electrochemical Society, Journal of Catalysis and Applied Surface Science.

In The Last Decade

M. J. Edgell

17 papers receiving 455 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
M. J. Edgell United Kingdom	9	227	158	150	108	69	19	486
F. Soeda Japan	12	148 0.7×	187 1.2×	204 1.4×	76 0.7×	17 0.2×	21	484
C. J. Blomfield United Kingdom	11	152 0.7×	258 1.6×	285 1.9×	96 0.9×	28 0.4×	18	574
Masami Terada Japan	7	497 2.2×	101 0.6×	98 0.7×	183 1.7×	18 0.3×	7	738
A. Baalmann Germany	13	233 1.0×	176 1.1×	178 1.2×	114 1.1×	22 0.3×	26	534
Sung Hwan Heo South Korea	13	200 0.9×	259 1.6×	518 3.5×	255 2.4×	85 1.2×	14	853
Norbert Nagy Hungary	12	97 0.4×	99 0.6×	216 1.4×	141 1.3×	9 0.1×	43	477
J. Friedrich Germany	14	229 1.0×	153 1.0×	251 1.7×	96 0.9×	9 0.1×	34	522
Pierre Burdet Switzerland	13	110 0.5×	125 0.8×	321 2.1×	157 1.5×	32 0.5×	23	654
Yoshiyuki Yokoyama Japan	14	311 1.4×	156 1.0×	52 0.3×	398 3.7×	83 1.2×	56	852
Thomas J. Lenk United States	10	212 0.9×	191 1.2×	165 1.1×	148 1.4×	4 0.1×	15	599

Countries citing papers authored by M. J. Edgell

Since Specialization

Citations

This map shows the geographic impact of M. J. Edgell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. J. Edgell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. J. Edgell more than expected).

Fields of papers citing papers by M. J. Edgell

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. J. Edgell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. J. Edgell. The network helps show where M. J. Edgell may publish in the future.

Co-authorship network of co-authors of M. J. Edgell

This figure shows the co-authorship network connecting the top 25 collaborators of M. J. Edgell. A scholar is included among the top collaborators of M. J. Edgell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. J. Edgell. M. J. Edgell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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19 of 19 papers shown

Chia, Victor K. F., et al.. (2003). A review of analytical techniques for process control of contaminants introduced during ion implantation. 1. 626–629. 4 indexed citations

Chia, Victor K. F., et al.. (2003). SIMS modular approach to ultra-low energy implants for accurate TCAD process simulation modeling. 1. 461–464. 1 indexed citations

Shallenberger, Jeffrey R., David A. Cole, Steven W. Novak, et al.. (2003). Oxide thickness determination by XPS, AES, SIMS, RBS and TEM. 1. 79–82. 17 indexed citations

Edgell, M. J., et al.. (2002). Analytical techniques for measuring contamination introduced during ion implantation. 11. 245–248. 1 indexed citations

Cole, David A., Jeffrey R. Shallenberger, Steven W. Novak, et al.. (2000). SiO 2 thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(1). 440–444. 83 indexed citations

Chia, Victor K. F., et al.. (1999). Recent advances in secondary ion mass spectrometry to characterize ultralow energy ion implants. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 17(5). 2345–2351. 20 indexed citations

Edgell, M. J., et al.. (1994). Plaster checks: a waste of resources?. Emergency Medicine Journal. 11(4). 266–267.

Edgell, M. J., et al.. (1994). Contaminated casualties: are we prepared to receive them?. Emergency Medicine Journal. 11(3). 172–177. 8 indexed citations

Bergström, Karin, Krister Holmberg, Agneza Safranj, et al.. (1992). Reduction of fibrinogen adsorption on PEG‐coated polystyrene surfaces. Journal of Biomedical Materials Research. 26(6). 779–790. 160 indexed citations

10.

Loboda, Mark J., S. Baumann, M. J. Edgell, & Kaj Stolt. (1992). Measurement of the elemental composition of a-SiC:H films by electron spectroscopy and high energy ion scattering spectrometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(6). 3532–3539. 4 indexed citations

11.

Edgell, M. J., et al.. (1990). An XPS study of cation-exchanged Y-type zeolites. Zeolites. 10(1). 51–60. 8 indexed citations

12.

Edgell, M. J., et al.. (1990). The Use of Ellipsometry and Photoelectron Spectroscopy for the Determination of Thin Thermal Oxide Layers on Silicon. Journal of The Electrochemical Society. 137(1). 201–206. 6 indexed citations

13.

Edgell, M. J.. (1988). The solid state reduction of sodium ions in nay zeolite by electron bombardment. Journal of Catalysis. 111(2). 433–435. 4 indexed citations

14.

Edgell, M. J., et al.. (1987). The surface chemistry of sulphur compounds. Surface and Interface Analysis. 10(4). 219–221. 5 indexed citations

15.

Newton, John, et al.. (1987). Surface modification of a contact lens co‐polymer by plasma‐discharge treatments. Surface and Interface Analysis. 10(8). 416–423. 51 indexed citations

16.

Paynter, R.W., M. J. Edgell, & J. E. Castle. (1986). The use of monochromatic Ag Lα radiation to study relaxation energy differences in X-ray photoelectron spectroscopy of alkali metal chlorides. Journal of Electron Spectroscopy and Related Phenomena. 40(1). 1–9. 16 indexed citations

17.

Edgell, M. J., R.W. Paynter, & J. E. Castle. (1986). The use of an electron flood gun when adopting monochromatic AgLα radiation for the XPS analysis of insulators. Surface and Interface Analysis. 8(3). 113–119. 22 indexed citations

18.

Edgell, M. J., Donald R. Baer, & J. E. Castle. (1986). Biased referencing experiments for the XPS analysis of non-conducting materials. Applied Surface Science. 26(2). 129–149. 49 indexed citations

19.

Edgell, M. J., R.W. Paynter, & J. E. Castle. (1985). High energy xps using a monochromated Ag Lα source: resolution, sensitivity and photoelectric cross sections. Journal of Electron Spectroscopy and Related Phenomena. 37(2). 241–256. 27 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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