M. Goessel

948 total citations
42 papers, 590 citations indexed

About

M. Goessel is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering. According to data from OpenAlex, M. Goessel has authored 42 papers receiving a total of 590 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 33 papers in Hardware and Architecture and 6 papers in Control and Systems Engineering. Recurrent topics in M. Goessel's work include VLSI and Analog Circuit Testing (32 papers), Radiation Effects in Electronics (23 papers) and Integrated Circuits and Semiconductor Failure Analysis (19 papers). M. Goessel is often cited by papers focused on VLSI and Analog Circuit Testing (32 papers), Radiation Effects in Electronics (23 papers) and Integrated Circuits and Semiconductor Failure Analysis (19 papers). M. Goessel collaborates with scholars based in Germany, Russia and United States. M. Goessel's co-authors include V.V. Saposhnikov, E.S. Sogomonyan, Ramesh Karri, Kaijie Wu, Michael M. Richter, Steffen Tarnick, Sandip Kundu, Krishnendu Chakrabarty, Вл. В. Сапожников and Alexandre V. Morozov and has published in prestigious journals such as IEEE Transactions on Computers, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Journal of Electronic Testing.

In The Last Decade

M. Goessel

40 papers receiving 524 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
M. Goessel Germany	13	390	361	213	118	55	42	590
Michael Gössel Germany	13	450 1.2×	364 1.0×	141 0.7×	87 0.7×	27 0.5×	66	597
David Biancolin United States	8	175 0.4×	287 0.8×	89 0.4×	166 1.4×	8 0.1×	13	430
Karthik Gururaj United States	12	168 0.4×	368 1.0×	44 0.2×	270 2.3×	13 0.2×	21	465
G. Lakshminarayana United States	16	271 0.7×	556 1.5×	38 0.2×	294 2.5×	20 0.4×	36	646
Nathan Pemberton United States	6	135 0.3×	235 0.7×	78 0.4×	146 1.2×	8 0.1×	7	363
Shail Aditya United States	13	98 0.3×	412 1.1×	90 0.4×	261 2.2×	12 0.2×	17	472
Per Gunnar Kjeldsberg Norway	10	180 0.5×	498 1.4×	37 0.2×	338 2.9×	14 0.3×	53	601
Jenq Kuen Lee Taiwan	11	92 0.2×	310 0.9×	60 0.3×	217 1.8×	11 0.2×	50	382
Christopher Weaver United States	9	984 2.5×	769 2.1×	125 0.6×	384 3.3×	17 0.3×	13	1.1k
Jude Angelo Ambrose Australia	12	103 0.3×	252 0.7×	204 1.0×	122 1.0×	12 0.2×	43	391

Countries citing papers authored by M. Goessel

Since Specialization

Citations

This map shows the geographic impact of M. Goessel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Goessel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Goessel more than expected).

Fields of papers citing papers by M. Goessel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Goessel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Goessel. The network helps show where M. Goessel may publish in the future.

Co-authorship network of co-authors of M. Goessel

This figure shows the co-authorship network connecting the top 25 collaborators of M. Goessel. A scholar is included among the top collaborators of M. Goessel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Goessel. M. Goessel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Goessel, M., et al.. (2014). Fault tolerant linear state machines. 1–6. 2 indexed citations

Sogomonyan, E.S., et al.. (2013). A new method for correcting time and soft errors in combinational circuits. 83. 283–286. 4 indexed citations

Sogomonyan, E.S., et al.. (2013). Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. 41. 855–862. 5 indexed citations

Richter, Michael M. & M. Goessel. (2009). Concurrent checking with split-parity codes. 83. 159–163. 6 indexed citations

Goessel, M., et al.. (2008). New Methods of Concurrent Checking (Frontiers in Electronic Testing). Springer eBooks. 12 indexed citations

Goessel, M.. (2008). New methods of concurrent checking. CERN Document Server (European Organization for Nuclear Research). 6 indexed citations

Goessel, M.. (2008). New Methods of Concurrent Checking. Digital Access to Libraries (Université catholique de Louvain (UCL), l'Université de Namur (UNamur) and the Université Saint-Louis (USL-B)). 52 indexed citations

Richter, Michael M., et al.. (2008). New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. 37–42. 32 indexed citations

Fischer, Martin, et al.. (2007). Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. 1–9. 8 indexed citations

10.

Beck, Mattias, et al.. (2006). On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. 6. 239–246. 8 indexed citations

11.

Chakrabarty, Krishnendu, et al.. (2006). Test Set Enrichment using a Probabilistic Fault Model and the Theory of Output Deviations. 13. 1–6. 9 indexed citations

12.

Goessel, M., Alexandre V. Morozov, Vladimir Sapozhnikov, & Вл. В. Сапожников. (2005). Checking Combinational Circuits by the Method of Logic Complement. Automation and Remote Control. 66(8). 1336–1346. 25 indexed citations

13.

Goessel, M., et al.. (2004). Diagnosis of scan-chains by use of a configurable signature register and error-correcting codes. Design, Automation, and Test in Europe. 2. 21302. 15 indexed citations

14.

Karri, Ramesh, et al.. (2004). Parity-based concurrent error detection in symmetric block ciphers. 1. 919–926. 11 indexed citations

15.

Goessel, M., et al.. (2003). Scan-path with directly duplicated and inverted duplicated registers. 47–52. 1 indexed citations

16.

Liu, Chunsheng, Krishnendu Chakrabarty, & M. Goessel. (2002). An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. Design, Automation, and Test in Europe. 382–386. 15 indexed citations

17.

Sogomonyan, E.S., A.D. Singh, & M. Goessel. (2002). A multi-mode scannable memory element for high test application efficiency and delay testing. 324–331. 3 indexed citations

18.

Saposhnikov, V.V., et al.. (1999). Experimental Results for Self-Dual Multi-Output Combinational Circuits. Journal of Electronic Testing. 14(3). 295–300. 11 indexed citations

19.

Goessel, M., et al.. (1997). Code-Disjoint Circuits for Parity Circuits. 130(4). 100–20. 2 indexed citations

20.

Sogomonyan, E.S. & M. Goessel. (1993). Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. Journal of Electronic Testing. 4(3). 267–281. 38 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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