M. Gailhanou

7.6k total citations
100 papers, 1.5k citations indexed

About

M. Gailhanou is a scholar working on Atomic and Molecular Physics, and Optics, Materials Chemistry and Electrical and Electronic Engineering. According to data from OpenAlex, M. Gailhanou has authored 100 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Atomic and Molecular Physics, and Optics, 34 papers in Materials Chemistry and 31 papers in Electrical and Electronic Engineering. Recurrent topics in M. Gailhanou's work include Semiconductor materials and interfaces (18 papers), Semiconductor Quantum Structures and Devices (16 papers) and Metal and Thin Film Mechanics (11 papers). M. Gailhanou is often cited by papers focused on Semiconductor materials and interfaces (18 papers), Semiconductor Quantum Structures and Devices (16 papers) and Metal and Thin Film Mechanics (11 papers). M. Gailhanou collaborates with scholars based in France, Switzerland and United States. M. Gailhanou's co-authors include M. Ilegems, Dominique Thiaudière, Ο. Thomas, R. Houdré, Emmanuelle Lacaze, Michel Goldmann, Michel Alba, Tilo Baumbach, U. Oesterlé and P. Sarrazin and has published in prestigious journals such as Physical Review Letters, Nano Letters and Physical review. B, Condensed matter.

In The Last Decade

M. Gailhanou

96 papers receiving 1.5k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Gailhanou France 24 534 514 466 238 209 100 1.5k
M. Fanfoni Italy 24 1.2k 2.3× 904 1.8× 761 1.6× 213 0.9× 293 1.4× 139 2.3k
Kheirreddine Lebbou France 23 1.3k 2.5× 613 1.2× 954 2.0× 172 0.7× 236 1.1× 137 2.1k
G. Della Mea Italy 25 1.1k 2.0× 263 0.5× 876 1.9× 112 0.5× 367 1.8× 205 2.5k
J. Chaumont France 25 1.1k 2.1× 328 0.6× 559 1.2× 191 0.8× 104 0.5× 114 2.1k
David D. Allred United States 18 583 1.1× 218 0.4× 533 1.1× 68 0.3× 206 1.0× 102 1.4k
J. Gryko United States 20 898 1.7× 583 1.1× 341 0.7× 161 0.7× 135 0.6× 50 1.5k
K. Fujiwara Japan 20 545 1.0× 391 0.8× 161 0.3× 150 0.6× 153 0.7× 100 1.4k
J. P. Duraud France 27 1.2k 2.3× 263 0.5× 862 1.8× 102 0.4× 146 0.7× 91 2.2k
S. D. Shastri United States 21 931 1.7× 332 0.6× 153 0.3× 254 1.1× 98 0.5× 40 1.6k
E. N. Kaufmann United States 19 745 1.4× 557 1.1× 382 0.8× 359 1.5× 267 1.3× 76 1.9k

Countries citing papers authored by M. Gailhanou

Since Specialization
Citations

This map shows the geographic impact of M. Gailhanou's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Gailhanou with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Gailhanou more than expected).

Fields of papers citing papers by M. Gailhanou

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Gailhanou. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Gailhanou. The network helps show where M. Gailhanou may publish in the future.

Co-authorship network of co-authors of M. Gailhanou

This figure shows the co-authorship network connecting the top 25 collaborators of M. Gailhanou. A scholar is included among the top collaborators of M. Gailhanou based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Gailhanou. M. Gailhanou is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gailhanou, M. & Jean-Marc Roussel. (2023). Understanding the warp in free 111 metal nanowires by modeling surface elasticity. Physical review. B.. 108(16).
2.
Roussel, Jean-Marc & M. Gailhanou. (2023). Warping caused by surface elasticity in a nanowire under torsion. Physical review. B.. 107(9). 2 indexed citations
3.
Blake, D. F., P. Sarrazin, Richard C. Walroth, et al.. (2019). CheMin-V: A Definitive Mineralogy Instrument for the Venera-D Mission. Lunar and Planetary Science Conference. 1468. 2 indexed citations
4.
Blake, D. F., T. F. Bristow, Przemysław Dera, et al.. (2019). XTRA: An eXtraTerrestrial Regolith Analyzer for Lunar Soil. LPI. 1144. 2 indexed citations
5.
Bristow, T. F., D. F. Blake, M. Gailhanou, et al.. (2019). CheMinX: A Next Generation XRD/XRF for Mars Exploration. Lunar and Planetary Science Conference. 2236. 1 indexed citations
6.
David, Thomas, Kailang Liu, A. Ronda, et al.. (2017). Tailoring Strain and Morphology of Core–Shell SiGe Nanowires by Low-Temperature Ge Condensation. Nano Letters. 17(12). 7299–7305. 12 indexed citations
7.
Bish, D. L., D. F. Blake, D. T. Vaniman, et al.. (2014). The first X-ray diffraction measurements on Mars. IUCrJ. 1(6). 514–522. 34 indexed citations
8.
Gailhanou, M. & Jean-Marc Roussel. (2013). Displacement field of a screw dislocation in a011Cu nanowire: An atomistic study. Physical Review B. 88(22). 6 indexed citations
9.
Blake, D. F., D. T. Vaniman, R. Anderson, et al.. (2009). The CheMin Mineralogical Instrument on the Mars Science Laboratory Mission. Lunar and Planetary Science Conference. 1484. 11 indexed citations
10.
Sarrazin, P., Przemysław Dera, Robert T. Downs, et al.. (2009). Hybrid X-ray Diffraction for Planetary Mineralogical Analysis of Unprepared Samples. Lunar and Planetary Science Conference. 1496. 1 indexed citations
11.
Sarrazin, P., Giacomo Chiari, & M. Gailhanou. (2009). A PORTABLE NON-INVASIVE XRD-XRF INSTRUMENT FOR THE STUDY OF ART OBJECTS.. 13 indexed citations
12.
Sarrazin, P., W. Brunner, David Blake, et al.. (2008). Field Studies of Mars Analog Materials Using a Portable XRD/XRF Instrument. Lunar and Planetary Science Conference. 2421. 7 indexed citations
13.
Chiari, Giacomo, P. Sarrazin, & M. Gailhanou. (2008). C-8 Invited —Portable XRD/XRF Instrumentation for the Study of Works of Art. Powder Diffraction. 23(2). 176–176. 7 indexed citations
14.
Chiari, Giacomo, P. Sarrazin, & M. Gailhanou. (2008). Portable Xrd/Xrf Instrumentation for the Study of Works of Art. 5 indexed citations
15.
Goudeau, P., L. Vandenbulcke, M.I. De Barros, et al.. (2005). X-ray diffraction analysis of residual stresses in smooth fined-grain diamond coatings deposited on TA6V alloys. Surface and Coatings Technology. 200(1-4). 170–173. 5 indexed citations
16.
Ersen, Ovidiu, C. Ulhaq-Bouillet, V. Pierron-Bohnes, et al.. (2002). Evidence of a ternary Co1−xFexSi2 phase with a CaF2-type structure: High-resolution transmission electron microscopy and diffraction anomalous fine structure study. Applied Physics Letters. 81(13). 2346–2348. 3 indexed citations
17.
Gailhanou, M., et al.. (1995). X-ray diffraction from epitaxial multilayered surface gratings. Journal of Physics D Applied Physics. 28(11). 2321–2327. 13 indexed citations
18.
Ganière, J.-D., M. Gailhanou, M. Dutoit, et al.. (1994). Improvement of Crystal Quality of Epitaxial Silicon-Germanium Alloy Layers by Carbon Additions. Helvetica physica acta. 67(2). 219–220. 1 indexed citations
19.
Houdré, R., et al.. (1992). InGaAs/GaAs vertical cavity surface emitting laser with hybrid top mirror. Microelectronic Engineering. 18(3). 267–272. 1 indexed citations
20.
Gailhanou, M., et al.. (1991). Chemical beam epitaxial selective growth of InP for laser fabrication. Applied Physics Letters. 58(8). 796–798. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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