M. Foisy
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- Advancements in Semiconductor Devices and Circuit Design 27
- Semiconductor materials and devices 24
- Integrated Circuits and Semiconductor Failure Analysis 11
- Silicon Carbide Semiconductor Technologies 4
- Silicon and Solar Cell Technologies 4
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- Semiconductor Quantum Structures and Devices 8
- Force Microscopy Techniques and Applications 1
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- Diamond and Carbon-based Materials Research 2
- Co-authors
- L.F. EastmanP.J. TaskerMartin L. DunnDerek F. BowersJames R. ParkerS. MoinianJ.A. SeitchikColin C. McAndrew
- Cited by
- Electrical and Electronic EngineeringAtomic and Molecular Physics, and OpticsCondensed Matter Physics
- Journals
- IEEE Transactions on Electron Devices (9 papers)IEEE Electron Device Letters (1 paper)IEEE Journal of Solid-State Circuits (1 paper)
- Partner nations
- United StatesTaiwanSpain
In The Last Decade
M. Foisy
27 papers receiving 424 citations
Peers
Comparison fields: 5 of 22
- Electrical and Electronic Engineering 443
- Atomic and Molecular Physics, and Optics 172
- Condensed Matter Physics 34
- Biomedical Engineering 63
- Hardware and Architecture 9
Countries citing papers authored by M. Foisy
This map shows the geographic impact of M. Foisy's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Foisy with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Foisy more than expected).
Fields of papers citing papers by M. Foisy
This network shows the impact of papers produced by M. Foisy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Foisy. The network helps show where M. Foisy may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Foisy, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 14 | |
| 2 | 2007 | 1 | |
| 3 | 2007 | 4 | |
| 4 | 2006 | 1 | |
| 5 | 2006 | 7 | |
| 6 | 2006 | 23 | |
| 7 | 2003 | 5 | |
| 8 | 2002 | 4 | |
| 9 | 2002 | 4 | |
| 10 | 2002 | 5 | |
| 11 | 2002 | 2 | |
| 12 | 2000 | 4 | |
| 13 | 1998 | 3 | |
| 14 | 1998 | 6 | |
| 15 | 1996 | 171 | |
| 16 | 1991 | 1 | |
| 17 | 1990 | 1 | |
| 18 | 1989 | 53 | |
| 19 | 1987 | 2 | |
| 20 | 1987 | 8 |
About M. Foisy
M. Foisy is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 31 papers that have together received 458 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (27 papers), Semiconductor materials and devices (24 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Semiconductor Quantum Structures and Devices (8 papers), Silicon Carbide Semiconductor Technologies (4 papers), Silicon and Solar Cell Technologies (4 papers), Diamond and Carbon-based Materials Research (2 papers) and Force Microscopy Techniques and Applications (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (443 citations), Atomic and Molecular Physics, and Optics (172 citations) and Condensed Matter Physics (34 citations). M. Foisy has collaborated with scholars based in United States, Taiwan and Spain. Frequent co-authors include L.F. Eastman, P.J. Tasker, Martin L. Dunn, Derek F. Bowers, James R. Parker, S. Moinian, J.A. Seitchik, Colin C. McAndrew, Ian Getreu and L. Wagner. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, IEEE Journal of Solid-State Circuits, Solid-State Electronics and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.