M. Fiederle
- Electrical and Electronic Engineering top 2%
- Biomedical Engineering top 2%
- Radiation top 0.5%
- Materials Chemistry top 5%
- Atomic and Molecular Physics, and Optics top 5%
- Topics
- Advanced Semiconductor Detectors and Materials (125 papers)Chalcogenide Semiconductor Thin Films (69 papers)Advanced X-ray and CT Imaging (64 papers)
In The Last Decade
M. Fiederle
204 papers receiving 3.0k citations
Peers
Comparison fields: 5 of 79
- Electrical and Electronic Engineering 1.9k
- Biomedical Engineering 1.2k
- Radiation 945
- Materials Chemistry 868
- Atomic and Molecular Physics, and Optics 639
Countries citing papers authored by M. Fiederle
This map shows the geographic impact of M. Fiederle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Fiederle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Fiederle more than expected).
Fields of papers citing papers by M. Fiederle
This network shows the impact of papers produced by M. Fiederle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Fiederle. The network helps show where M. Fiederle may publish in the future.
Co-authorship network of co-authors of M. Fiederle
This figure shows the co-authorship network connecting the top 25 collaborators of M. Fiederle. A scholar is included among the top collaborators of M. Fiederle based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Fiederle. M. Fiederle is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | 3 | |
| 5 | 7 | |
| 6 | 63 | |
| 7 | 21 | |
| 8 | 11 | |
| 9 | 3 | |
| 10 | 13 | |
| 11 | 55 | |
| 12 | 7 | |
| 13 | 2 | |
| 14 | 77 | |
| 15 | 2 | |
| 16 | 1 | |
| 17 | New approaches in order to enlarge the grain size of bulk CdZnTe (CZT) crystals | 15 |
| 18 | 1 | |
| 19 | 6 | |
| 20 | 0 |
About M. Fiederle
M. Fiederle is a scholar working on Radiation, Nuclear and High Energy Physics and Electrical and Electronic Engineering, having authored 213 papers that have together received 3.2k indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (125 papers), Chalcogenide Semiconductor Thin Films (69 papers) and Advanced X-ray and CT Imaging (64 papers). The work is most often cited by research in Radiation (945 citations), Electrical and Electronic Engineering (1.9k citations) and Nuclear and High Energy Physics (431 citations). M. Fiederle has collaborated with scholars based in Germany, Czechia and Russia. Frequent co-authors include A. Fauler, K.W. Benz, V. Babentsov, J. Franc, S. Procz, A. Zwerger, Elias Hamann, C. Eiche, M. Salk and Tilo Baumbach. Their work appears in journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.